Semiconductor devices - Mechanical and climatic test methods

EN following parallel vote * Superseded by EN 60749 series

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren

Dispositifs à semiconducteurs - Essais mécaniques et climatiques

Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996)

General Information

Status
Withdrawn
Publication Date
16-Nov-2000
Drafting Committee
Parallel Committee
Current Stage
6060 - Document made available
Completion Date
17-Nov-2000

RELATIONS

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EN 60749:2002 + A1:2002
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Standards Content (sample)

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.Semiconductor devices - Mechanical and climatic test methods (IEC 60749:1996)Halbleiterbauelemente - Mechanische und klimatische PrüfverfahrenDispositifs à semiconducteurs - Essais mécaniques et climatiquesSemiconductor devices - Mechanical and climatic test methods31.080.01Polprevodniški elementi (naprave) na splošnoSemiconductor devices in generalICS:Ta slovenski standard je istoveten z:EN 60749:1999/A1:2000SIST EN 60749:2002 + A1:2002en01-september-2002SIST EN 60749:2002 + A1:2002SLOVENSKI

STANDARD
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2002
SIST EN 60749:2002 + A1:2
...

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