Communication networks and systems for power utility automation - Part 10-3: Functional testing of IEC 61850 systems

IEC TR 61850-10-3:2022(E), which is a technical report, is applicable to testing of applications within substations. It is intended to give practical guidelines to perform the stages of quality assurance defined in IEC 61850-4:2011. However, while the quality assurance in that document begins with the IED manufacturer development stage and focuses on the role of the system integrator this document focuses on end-user requirement fulfilment.
The report may be useful to users applying IEC 61850 to other domains, however testing of IEC 61850 systems outside the substation domain is not within the scope of this document.
This document describes:
• A methodical approach to the verification and validation of a substation solution
• The use of IEC 61850 resources for testing in Edition 2.1
• Recommended testing practices for different use cases
• Definition of the process for testing of IEC 61850 based devices and systems using communications instead of hard wired system interfaces (ex. GOOSE and SV instead of hardwired interfaces)
• Use cases related to protection and control functions verification and testing
This document does not cover the conformance testing of devices according to IEC 61850-10 or methodologies for testing of abstract device independent functions.

General Information

Status
Published
Publication Date
07-Feb-2022
Current Stage
PPUB - Publication issued
Start Date
04-Mar-2022
Completion Date
08-Feb-2022
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IEC TR 61850-10-3 ®
Edition 1.0 2022-02
TECHNICAL
REPORT
colour
inside
Communication networks and systems for power utility automation –
Part 10-3: Functional testing of IEC 61850 systems
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IEC TR 61850-10-3 ®
Edition 1.0 2022-02
TECHNICAL
REPORT
colour
inside
Communication networks and systems for power utility automation –

Part 10-3: Functional testing of IEC 61850 systems

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 33.200 ISBN 978-2-8322-1075-7

– 2 – IEC TR 61850-10-3:2022 © IEC 2022
CONTENTS
FOREWORD . 6
INTRODUCTION . 8
1 Scope . 9
2 Normative references . 9
3 Terms, definitions, abbreviated terms and acronyms . 10
3.1 Terms and definitions . 10
3.1.1 Testing types . 10
3.2 Abbreviated terms and acronyms . 13
4 Testing-related features in IEC 61850 . 13
4.1 General . 13
4.2 Test features defined in IEC 61850 . 13
4.2.1 General . 13
4.2.2 Simulation based testing in substations under normal operation . 14
4.2.3 Mode and behavior of functions . 16
4.2.4 Logical devices management hierarchy . 18
4.2.5 Processing of information . 21
4.2.6 Blocking of information . 23
4.2.7 Changing the information source (input reference) for testing . 25
4.2.8 Substitution of information . 26
4.2.9 Use of testing related features . 26
5 Testing of Protection, Automation and Control Devices and Systems . 28
5.1 General . 28
5.2 Test system requirements . 29
6 Test methods, practices and needs . 30
6.1 General . 30
6.2 Testing requirements for IEC 61850 based systems . 30
6.3 The V-Model . 31
6.3.1 General . 31
6.3.2 Unit testing . 31
6.3.3 Integration or subsystem testing . 32
6.3.4 System testing . 32
7 Testing use cases . 32
7.1 General . 32
7.2 Distributed Breaker Failure Protection Scheme . 33
7.2.1 General . 33
7.2.2 Use case description . 33
7.2.3 Breaker Failure Protection Scheme Interfaces . 37
7.3 Distributed Select Before Operate . 38
7.3.1 General . 38
7.3.2 Select Before Operate Scheme Components . 38
7.3.3 Select Before Operate Scheme Interfaces . 41
7.3.4 Select Before Operate Scheme Behavior . 42
7.3.5 Single line diagram . 44
8 Test sequences for the use cases. 46
8.1 Breaker failure protection testing . 46
8.1.1 General . 46

8.1.2 Normal sequence . 46
8.1.3 Fault sequence . 47
8.1.4 Setting the test mode and the simulation state of the line protection
function . 48
8.1.5 Setting the test mode and the simulation state of the breaker failure

function . 49
8.1.6 Setting the test mode and the simulation state of the breaker function . 50
8.1.7 Setting the test mode of the bus bar protection function . 51
8.1.8 Testing the line protection IED . 52
8.1.9 Testing the breaker failure IED A interface . 54
8.1.10 Testing the breaker IED A interface . 56
8.1.11 Testing the breaker failure function End-to-End . 58
8.2 Select Before Operate Scheme Testing. 61
8.2.1 General . 61
8.2.2 Unit testing . 61
8.2.3 Subsystem (Interface) testing . 69
8.2.4 System (End-to-End) testing . 70
9 Modeling requirements related to testing in IEC 61850 . 75
10 Object modeling of test systems . 75
11 Engineering of the test system . 77
12 Impact of the testing system on the substation LAN traffic . 77
13 Functional and cyber security considerations . 78
14 Remote testing . 79
Annex A (informative) Introduction to the used UML notation . 80
A.1 General . 80
A.2 Component diagram . 80
A.3 Sequence diagram . 80
Annex B (informative) Requirements for extensions . 83
B.1 Requirements for extensions in IEC 61850-7-1 . 83
B.2 Requirements for extensions in IEC 61850-7-3 . 83
B.3 Requirements for extensions in IEC 61850-7-4 . 84

Figure 1 – Data used for receiving simulation signals (IEC 61850-7-1 Fig. 40) . 15
Figure 2 – IED with multiple process interfaces . 15
Figure 3 – Processing of test signals (Part 7-1, Figure 42) . 18
Figure 4 – Nesting of logical devices representing the functional hierarchy . 19
Figure 5 – Use of GrRef in the modelling of nested logical devices . 20
Figure 6 – Management hierarchy of nested logical devices . 20
Figure 7 – Processing of the data by a LN depending on the LN behaviour and the
quality attribute of input data . 22
Figure 8 – Data used for logical node inputs/outputs blocking: IEC 61850-7-1:2011,
Figure 39) . 24
Figure 9 – Example of input signals used for testing (IEC 61850-7-1:2011, Figure 41) . 25
Figure 10 – Use of InRef for LN test . 26
Figure 11 – Quality assurance stages of IEC 61850-4:2011 . 28
Figure 12 – Testing stages for site acceptance test as defined in IEC 61850-4:2011 . 29
Figure 13 – V-Model used for system engineering . 31

– 4 – IEC TR 61850-10-3:2022 © IEC 2022
Figure 14 – Single line diagram according to IEC 81346 . 34
Figure 15 – System components (Static) . 36
Figure 16 – System components (Dynamic) . 37
Figure 17 – Select Before Operate Scheme . 39
Figure 18 – Component decomposition of Select Before Operate Scheme . 40
Figure 19 – Allocated interfaces for Select Before Operate Scheme – SLD . 41
Figure 20 – Allocated interfaces for Select Before Operate Scheme.
...

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