Surface mounting technology - Part 5-1: Surface strain on circuit boards - Strain gauge measurement applied to chip components

IEC TR 61760-5-1:2024 describes examples of methods using electrical strain gauges for determination of critical mechanical stresses in assembly processes. These stresses can damage chip type ceramic components, causing so called “bending cracks”. Area-array components are excluded from the scope of this document.

General Information

Status
Published
Publication Date
30-Jan-2024
Drafting Committee
Current Stage
PPUB - Publication issued
Start Date
31-Jan-2024
Completion Date
16-Feb-2024
Ref Project

Overview - IEC TR 61760-5-1:2024 (Surface mounting technology)

IEC TR 61760-5-1:2024 is an IEC Technical Report on surface strain measurement on circuit boards using electrical strain gauges, focused on prevention of mechanical damage to chip-type ceramic components (notably “bending cracks”). The document presents examples of measurement methods and best practices for determining critical mechanical stresses that occur during assembly processes. Area‑array components are excluded from this report. As an informative Technical Report, it illustrates feasible options and supports supplier–customer discussions rather than acting as a prescriptive standard.

Key topics and technical content

  • Scope and purpose: Methods for using electrical strain gauges to identify critical surface strains on PCBs that can lead to component cracking.
  • Damage mechanisms: Explanation of how board bending, local surface strain and specific cracking modes affect chip-type ceramic components.
  • Critical factors in design and assembly:
    • Board design influences such as distance from board cutting/singulation, screw clamping positions, mounting direction and warpage.
    • Component orientation relative to loading points.
  • Assembly process factors: Processes addressed include board singulation, press‑fit operations, housing fitting/screwing, ICT/FT programming, manual handling and screw clamps.
  • Practical measurement methods:
    • Use of electrical strain gauges (including 3‑axis measurements and resistor bridge configurations).
    • Stepwise guidance for board preparation and gauge attachment (examples include removing components, polishing attachment area, marking, glue application and fixing the gauge).
  • Data evaluation and process control: Guidance on evaluation of measurement data, reporting, machine/process capability and maintenance to control assembly‑induced strain.
  • Typical pitfalls: Common mistakes such as improper gauge attachment, wrong gauge type, neglecting irregular stress fields or using unloaded boards for tests.

Practical applications and users

This Technical Report is valuable for:

  • PCB and assembly design engineers aiming to reduce bending‑crack risk.
  • Reliability, quality and test engineers conducting strain measurements during process validation.
  • Component manufacturers and suppliers negotiating strain limits and test methods with customers.
  • Test laboratories and R&D teams evaluating press‑fit, screwing and housing‑assembly processes.

Practical uses include validating PCB layout and fastening strategies, setting assembly process controls, and troubleshooting cracking failures by targeted strain measurements.

Related standards and references

  • IEC TR 61760-5-1 is part of the IEC 61760 series - Surface mounting technology. Related normative and informative references are listed in the document bibliography and should be consulted for comprehensive surface‑mount and component reliability guidance.
Technical report
IEC TR 61760-5-1:2024 - Surface mounting technology - Part 5-1: Surface strain on circuit boards - Strain gauge measurement applied to chip components Released:1/31/2024 Isbn:9782832281604
English language
24 pages
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IEC TR 61760-5-1 ®
Edition 1.0 2024-01
TECHNICAL
REPORT
colour
inside
Surface mounting technology –
Part 5-1: Surface strain on circuit boards – Strain gauge measurement applied to
chip components
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IEC TR 61760-5-1 ®
Edition 1.0 2024-01
TECHNICAL
REPORT
colour
inside
Surface mounting technology –
Part 5-1: Surface strain on circuit boards – Strain gauge measurement applied to

chip components
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.190  ISBN 978-2-8322-8160-4

– 2 – IEC TR 61760-5-1:2024 © IEC 2024
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Damaging mechanisms of chip type ceramic components . 7
4.1 Surface strain by board bending. 7
4.2 Typical cracking modes . 8
4.3 Measurement of local strain . 9
5 Crack prevention . 9
5.1 Strain control . 9
5.2 Critical board design factors . 9
5.2.1 Distance from circuit board cutting position . 9
5.2.2 Distance from screw clamping position . 9
5.2.3 Mounting direction . 10
5.2.4 Warpage . 10
5.2.5 Orientation of the component related with the loading point . 10
5.3 Critical assembly process factors . 10
5.3.1 General . 10
5.3.2 Circuit board singulation . 10
5.3.3 Circuit board fitting into the housing. 10
5.3.4 Screw clamp . 10
5.3.5 Manual handling . 11
5.3.6 ICT (In-Circuit Test) / FT (Functional Test) / Programming on assembly
level . 11
6 Example of an instruction on board preparation for strain measurement . 11
6.1 General . 11
6.1.1 Introductory statement . 11
6.1.2 Theory of strain gauge measurement . 11
6.1.3 3-axes strain measurement . 12
6.2 Position of strain gauges (example) . 13
6.2.1 General . 13
6.2.2 Determination of critical positions on a circuit board . 13
6.2.3 Rules for determination of sample size for performing the investigations . 13
6.3 Attachment of strain gauges (example) . 13
6.3.1 Step 1 – Remove components . 13
6.3.2 Step 2 – Polish the attachment area . 14
6.3.3 Step 3 – Indication of attachment point . 14
6.3.4 Step 4 – Application of instant glue . 15
6.3.5 Step 5 – Attachment of strain gauge . 16
7 Typical mistakes and faults occurring in practice . 16
7.1 Strain gauge attachment . 16
7.2 Wrong type of strain gauge used . 16
7.3 Circuit board without components is used . 16
7.4 Irregular stress is not considered . 16
7.5 Insufficient measurement settings . 17

8 Evaluation of data and report . 17
9 Assembly process control . 18
9.1 Machine/Process capability . 18
9.2 Machine maintenance . 18
Annex A (informative) Examples and relevant processes . 19
A.1 Typical measurement results – Press-fit operation, Example 1 . 19
A.2 Typical measurement results – Press-fit operation, Example 2 . 20
A.3 Typical measurement results – Housing assembly by screwing . 22
A.4 Typical critical processes . 23
Bibliography . 24

Figure 1 – Mechanical stress by board bending . 8
Figure 2 – Strain simulation . 8
Figure 3 – Typical bending crack at a ceramic capacitor . 8
Figure 4 – Longitudinal stress . 8
Figure 5 – Diagonal stress . 9
Figure 6 – Strain control and bending strength . 9
Figure 7 – Strain during screwing . 11
Figure 8 – Resistor bridge for strain measurement . 12
Figure 9 – 3-axes strain gauge and maximum principle strain . 12
Figure 10 – De-soldering of components . 14
Figure 11 – Polishing the attachment area . 14
Figure 12 – Marking of the attachment point . 14
Figure 13 – Application of glue by transfer from polyethylene sheet . 15
Figure 14 – Direct application of glue . 15
Figure A.1 – Dosing control unit for exhaust treatment system equipped with a
connector using compliant press-fit technology . 19
Figure A.2 – Top and bottom side of circuit assembly of dosing control unit with strain
gauges replacing passive multilayer chip capacitors . 19
Figure A.3 – Strain measurement evolution for the different strain gauges during the
press-in process . 20
Figure A.4 – Press fit – Strain measurements using different strain gauges and
positions . 21
Figure A.5 – Screwing – Strain measurements using different strain gauges and
positions . 22

Table A.1 – Strain measurement results with different gauges and placements . 21
Table A.2 – Strain measurement results with different gauges and placements . 22

– 4 – IEC TR 61760-5-1:2024 © IEC 2024
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SURFACE MOUNTING TECHNOLOGY –
Part 5-1: Surface strain on circuit boards –
Strain gauge measurement applied to chip components

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
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Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
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shall not be held responsible for identifying any or all such patent rights.
IEC TR 61760-5-1 has been prepared by IEC technical committee 91: Electronics assembly
technology. It is a Technical Report.
The text of this Technical Report is based on the following documents:
Draft Report on voting
91/1915/DTR 91/1927/RVDTR
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Report is English.

This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/standardsdev/publications.
A list of all parts in the IEC 61760 series, published under the general title Surface mounting
technology, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
IMPORTANT – The "colour inside" logo on the cover page of this document indicates
that it contains colours which are considered to be useful for the correct understanding
of its contents. Users should therefore print this document using a colour printer.

– 6 – IEC TR 61760-5-1:2024 © IEC 2024
INTRODUCTION
This Technical Report applies to electronic and electromechanical circuit board assemblies and
describes current best-practices for dealing with mechanical stress induced cracks in the body
of surface-mount ceramic components soldered onto circuit boards.
Circuit boards are becoming smaller and thinner, design margins are decreasing, and
components are becoming more sensitive to mechanical stresses. In consequence in-depth
strain control on a circuit board is getting more and more important to prevent mechanical
damage to components.
This Technical Report is an informative document which serves to illustrate the technically
feasible options and provides a basis for customer and supplier discussions and agreements.
It is based on many years of experience of component manufacturers and users in measuring
surface strain on circuit board surfaces during various assembly processes. It is not intended
to be regarded as a specification or standard. Formulations and data expressed in the form of
provision such as requirements or recommendations do not claim to be provisions and are just
suggested as the results of the discussion.
Related standards are gathered in the bibliography.

SURFACE MOUNTING TECHNOLOGY –
Part 5-1: Surface strain on circuit boards –
Strain gauge measurement applied to chip components

1 Scope
This document describes examples of methods using electrical strain gauges for determination
of critical mechanical stresses in assembly processes. These stresses can damage chip type
ceramic components, causing so called “bending cracks”. Area-array components are excluded
from the scope of this document.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60194-2 and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at https://www.electropedia.org/
• ISO Online browsing platform: available at https://www.iso.org/obp
3.1
principal strain
maximum and minimum normal strains in a plane, always perpendicular to each other and
oriented in directions for which the shear strains are zero
3.2
maximum principal strain
maximum value of principal strain developed in the component body
Note 1 to entry: Failure of a material or component will occur when the maximum principal strain developed in the
body exceeds the limiting value of strain for a certain component.
4 Damaging mechanisms of chip type ceramic components
4.1 Surface strain by board bending
When a board is bent, lands are pulled outwards and generate mechanical stress on the solder-
joints, electrodes or components (Figure 1, Figure 2). This mechanical stress causes defects,
for example a bending crack in a ceramic capacitor (Figure 3). The root cause of this defect is
the local strain at the surface on which the component is mounted.

– 8 – IEC TR 61760-5-1:2024 © IEC 2024

Figure 1 – Mechanical stress by board bending

Reproduced with the permission of Murata Manufacturing
Figure 2 – Strain simulation
Reproduced with the permission of Murata Manufacturing
Figure 3 – Typical bending crack at a ceramic capacitor
4.2 Typical cracking modes
Bending stress can occur in any direction, see Figure 4 and Figure 5. The cracks were made
visible by grinding from the board side. The position and shape of cracks can be used to
estimate the direction of stress. The local strain at the position at which the component is
mounted causes the cracks. Therefore, even if a board does not look bent, this defect could
occur by local surface stress or short time impact.

Reproduced with the permission of Murata Manufacturing
Figure 4 – Longitudinal stress

Reproduced with the permission of Murata Manufacturing
Figure 5 – Diagonal stress
4.3 Measurement of local strain
Local strains can occur in any direction, see Figure 4 and Figure 5. 3-axes strain gauges
provide a full assessment of the strain state. The use of 1-axis or 2-axes measurements
provides limited information on the strain state.
5 Crack prevention
5.1 Strain control
To prevent bending cracks described in 4.1 and 4.2, strain control on a PCB is needed. The
bending strength of SMD for example can be determined by the so-called substrate bending
test, as provided in IEC 60068-2-21. However, the real mechanical strength of a surface mount
component depends on various design and process factors (e.g. land size, solder quantity/type,
PCB material/type, Cu foil thickness, strain rate, etc.). Furthermore, considering the strain
measurement accuracy, measurement repeatability, and irregular stresses in assembly
processes, a certain safety margin is needed, see Figure 6.

Figure 6 – Strain control and bending strength
5.2 Critical board design factors
5.2.1 Distance from circuit board cutting position
Components mounted close to a cutting or singulation position are at risk. A slit can reduce the
cutting stress if it is placed between the component and the cutting line. Also, a deep v-groove
can reduce the cutting stress.
5.2.2 Distance from screw clamping position
Components mounted close to a screw clamping position are at risk.

– 10 – IEC TR 61760-5-1:2024 © IEC 2024
5.2.3 Mounting direction
Risk can be reduced, if a components’ longitudinal axis is oriented perpendicular to the
maximum principle strain.
5.2.4 Warpage
Warpage can be the cause of surface stress when a circuit board is flattened when fitted into
the housing.
5.2.5 Orientation of the component related with the loading point
The mechanical load to components is influenced by their orientation relative to the forces
applied to the board.
5.3 Critical assembly process factors
5.3.1 General
In general, an assessment of all processes which involve mechanical loads applied to populated
circuit boards is needed. This implies that such an assessment needs to start after the first
reflow cycle. All process steps, including solder paste printing for the second reflow side (top
side), conveyor movement, pick-and-place etc. occurring after the first reflow cycle need to be
considered. Further information on suc
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IEC TR 61760-5-1:2024 is a technical report published by the International Electrotechnical Commission (IEC). Its full title is "Surface mounting technology - Part 5-1: Surface strain on circuit boards - Strain gauge measurement applied to chip components". This standard covers: IEC TR 61760-5-1:2024 describes examples of methods using electrical strain gauges for determination of critical mechanical stresses in assembly processes. These stresses can damage chip type ceramic components, causing so called “bending cracks”. Area-array components are excluded from the scope of this document.

IEC TR 61760-5-1:2024 describes examples of methods using electrical strain gauges for determination of critical mechanical stresses in assembly processes. These stresses can damage chip type ceramic components, causing so called “bending cracks”. Area-array components are excluded from the scope of this document.

IEC TR 61760-5-1:2024 is classified under the following ICS (International Classification for Standards) categories: 31.190 - Electronic component assemblies. The ICS classification helps identify the subject area and facilitates finding related standards.

You can purchase IEC TR 61760-5-1:2024 directly from iTeh Standards. The document is available in PDF format and is delivered instantly after payment. Add the standard to your cart and complete the secure checkout process. iTeh Standards is an authorized distributor of IEC standards.

IEC TR 61760-5-1:2024は、表面実装技術における重要な標準であり、回路基板における表面ひずみの測定に関する情報を提供しています。この標準は、チップコンポーネントに対するひずみゲージ測定方法を詳述し、組立プロセスにおける重要な機械的応力を特定するための電気的ひずみゲージを使用する例を示しています。 この標準の強みは、チップ型セラミックコンポーネントが受ける可能性のある「曲げひび割れ」を防ぐための具体的な測定方法を提供している点です。これにより、設計者や製造業者は、組立工程における危険な応力を理解し、効率的な対策を講じることができます。また、ひずみゲージを用いた測定技術の精度向上に寄与し、より高品質な電子機器の製造をサポートします。 さらに、IEC TR 61760-5-1:2024は、各種産業において広く適用可能な内容であり、特に製品の信頼性や耐久性を求める場合において、その関連性は非常に高いと言えます。これにより、異なる業界における電子機器開発においても、そのガイドラインは活用されることが期待されます。 ただし、この標準はエリアアレイコンポーネントについては適用対象外である点には注意が必要です。この点を理解し、適切に活用することで、設計や製造プロセスにおける信頼性向上が図れるでしょう。

Die Norm IEC TR 61760-5-1:2024 behandelt die Oberflächenmontagetechnologie und bietet spezifische Richtlinien zur Messung von mechanischen Spannungen auf Leiterplatten, insbesondere in Bezug auf die Anwendung von Dehnungsmessstreifen bei Chip-Komponenten. Dieses Dokument ist von großer Bedeutung für die Elektronikindustrie, da der sichere Umgang mit keramischen Bauelementen essentiell ist, um Schäden wie sogenannte „Biegespalten“ zu vermeiden. Die Norm hebt die Relevanz elektrischer Dehnungsmessstreifen hervor, die als effektive Methode zur Bestimmung kritischer mechanischer Spannungen während der Montageprozesse dienen. Die Einführung dieser Techniken in die Praxis kann nicht nur die Qualität der Endprodukte verbessern, sondern auch die Lebensdauer der Bauelemente verlängern. Besonders wertvoll ist die detaillierte Beschreibung der Methoden, die eine direkte Anwendung in der Industrie ermöglichen. Ein weiterer Vorteil von IEC TR 61760-5-1:2024 liegt in der klaren Abgrenzung des Geltungsbereichs. Während die Norm spezifische Beispiele für die Messung von Biegespannungen bei Chip-Komponenten bietet, clarifiziert sie auch, dass Flächenarrays nicht in den Anwendungsbereich fallen. Dies sorgt für eine gezielte Fokussierung auf die am häufigsten verwendeten Bauelemente, was die Anwendbarkeit der Norm in der Praxis erhöht. Insgesamt bietet IEC TR 61760-5-1:2024 eine wertvolle Grundlage für Fachleute in der Oberflächenmontagetechnologie. Ihre Stärke liegt in der Kombination aus klaren Methodiken und dem Fokus auf kritische Spannungen, die in Montageprozessen auftreten können. Diese Norm trägt somit nicht nur zur Verbesserung der Fertigungsprozesse bei, sondern ist auch ein wichtiger Schritt zur Minimierung von Produktausfällen in der Elektronik.

Le document IEC TR 61760-5-1:2024 se concentre sur les technologies de montage en surface, en particulier sur l'application de la mesure de déformation à l'aide de jauges de contrainte sur les composants à puces. Ce standard est essentiel car il fournit des exemples de méthodes permettant de déterminer les contraintes mécaniques critiques durant les processus d'assemblage. Ces contraintes peuvent endommager des composants céramiques de type puce, entraînant ce que l'on appelle des "fissures de flexion". Une des forces majeures de ce standard est son approche technique, qui offre une méthodologie claire pour les professionnels du domaine. Grâce à l'utilisation de jauges de contrainte électriques, les utilisateurs peuvent évaluer avec précision les risques de déformation sur les circuits imprimés, permettant ainsi de minimiser les défauts de fabrication. Le document établit une base solide pour la compréhension des conditions de stress au sein des assemblages, contribuant à la durabilité et à la fiabilité des circuits assemblés. La pertinence de l'IEC TR 61760-5-1:2024 est également marquée par son exclusion réfléchie des composants à matrice de zone, permettant de se concentrer sur les types de composants les plus susceptibles de présenter des problèmes de contrainte. En ciblant spécifiquement les composants à puce, le standard répond à un besoin critique dans l'industrie, en offrant des solutions pratiques pour des défis techniques bien connus. En résumé, le standard IEC TR 61760-5-1:2024 représente une avancée considérable dans la compréhension et la mesure des déformations sur les circuits imprimés, renforçant ainsi la qualité et la fiabilité des assemblages électroniques. Ses méthodes précises et son approche ciblée en font un document de référence incontournable pour les professionnels impliqués dans la technologie de montage en surface.

IEC TR 61760-5-1:2024는 전기 스트레인 게이지를 사용하여 조립 과정에서의 중요한 기계적 스트레스를 결정하는 방법에 대한 사례를 설명하고 있습니다. 이 표준은 칩형 세라믹 부품에 발생할 수 있는 “비틀림 균열”과 같은 손상을 방지하는 데 필수적인 정보를 제공합니다. 특히, 스트레인 측정이 이러한 부품의 안전성을 보장하는데 충실하게 기여할 수 있음을 강조합니다. 이 문서의 강점은 다양한 조립 과정에 대한 기계적 스트레스 분석을 체계적으로 제시하고 있어, 실제 제조 응용에서의 적용 가능성이 높다는 점입니다. 전기 스트레인 게이지를 이용한 혁신적인 방법론은 사용자에게 실질적인 통찰력을 제공하며, 기계적 손상을 예방하는 데 중요한 역할을 합니다. 또한, IEC TR 61760-5-1:2024는 칩형 세라믹 부품에 초점을 맞추고 있으며, 면적 배열 구성품은 이 문서의 범위에 포함되지 않음을 명확히 하고 있습니다. 이는 관련 산업 분야에서 특정 부품의 안전성과 신뢰성을 평가하는 데 있어 더욱 정확한 지침을 제공합니다. 결과적으로, 해당 표준은 공정 중 발행할 수 있는 기계적 스트레스를 평가하는 데 있어 중요하고 실용적인 도구로 자리매김하고 있으며, 전자 산업 종사자들에게 매우 유용한 참고 자료가 될 것입니다.

The IEC TR 61760-5-1:2024 standard provides a comprehensive framework for understanding and measuring surface strain on circuit boards, specifically focusing on chip components. The standard elaborates on various methods employing electrical strain gauges to assess critical mechanical stresses during assembly processes. One of its significant strengths lies in its detailed approach to identifying and mitigating risks associated with “bending cracks” in chip type ceramic components. By concentrating on these specific aspects, the standard helps manufacturers enhance the reliability and longevity of their electronic assemblies. The relevance of this standard in the context of modern electronics cannot be overstated. As the industry increasingly relies on miniaturized components that are sensitive to mechanical stress, the insights provided in IEC TR 61760-5-1:2024 are crucial for engineers and manufacturers. The exclusion of area-array components also sharpens the focus of the document, ensuring that the methodologies discussed are tailored to the target components, enhancing clarity and applicability. Furthermore, the standard's emphasis on proactive strain measurement aligns with best practices in manufacturing, wherein identifying potential points of failure ahead of time can lead to improved product quality and reduced costs. Overall, IEC TR 61760-5-1:2024 stands out as a valuable resource for professionals in surface mounting technology, offering practical guidance and promoting higher standards in the production of electronic components.