iTeh StandardsiTeh Standards
EURUSD
Your shopping cart is empty.
IEC

IEC 60747-5-1:1997/AMD1:2001

(Amendment)

Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General

Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General

Amendement 1 - Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1: Dispositifs optoélectroniques - Généralités

General Information

Status
Replaced
Publication Date
21-Mar-2001
ICS
31.080.01 - Semiconductor devices in general
Technical Committee
SC 47E - Discrete semiconductor devices
Drafting Committee
WG 9 - TC 47/SC 47E/WG 9
Current Stage
DELPUB - Deleted Publication
Completion Date
23-Feb-2016
Ref Project

Relations

Replaced By
IEC 60747-5-5:2007 - Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
Effective Date
05-Sep-2023
Replaced By
IEC 60747-5-7:2016 - Semiconductor devices - Part 5-7: Optoelectronic devices - Photodiodes and phototransistors
Effective Date
05-Sep-2023
Replaced By
IEC 60747-5-4:2006 - Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers
Effective Date
05-Sep-2023
Replaced By
IEC 60747-5-6:2016 - Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes
Effective Date
05-Sep-2023
Amends
IEC 60747-5-1:1997 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
Effective Date
05-Sep-2023

Buy Standard

IEC 60747-5-1:1997/AMD1:2001 - Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General Released:3/22/2001 Isbn:283185685XIEC 60747-5-1:1997/AMD1:2001 - Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General Released:3/22/2001 Isbn:283185685X
PreviousNext
Standard
IEC 60747-5-1:1997/AMD1:2001 - Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General Released:3/22/2001 Isbn:283185685X
English and French language
6 pages
sale 15% off
Preview
sale 15% off
Preview

Standards Content (Sample)


NORME CEI
INTERNATIONALE IEC
60747-5-1
INTERNATIONAL
STANDARD
AMENDEMENT 1
AMENDMENT 1
2001-03
Amendement 1
Dispositifs discrets à semiconducteurs
et circuits intégrés –
Partie 5-1:
Dispositifs optoélectroniques – Généralités
Amendment 1
Discrete semiconductor devices
and integrated circuits –
Part 5-1:
Optoelectronic devices – General
 IEC 2001 Droits de reproduction réservés  Copyright - all rights reserved
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: +41 22 919 0300 e-mail: inmail@iec.ch IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
D
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue

– 2 – 60747-5-1 amend. 1 © CEI:2001
AVANT-PROPOS
Le présent amendement a été établi par le sous-comité 47E: Dispositifs discrets à semi-
conducteurs, du comité d'études 47 de la CEI: Dispositifs à semiconducteurs.
Le texte de cet amendement est issu des documents suivants:
FDIS Rapport de vote
47E/178/FDIS 47E/184/RVD
Le rapport de vote indiqué dans le tableau ci-dessus donne toute information sur le vote ayant
abouti à l'approbation de cet amendement.
Le comité a décidé que le contenu de la publication de base et de ses amendements ne sera
pas modifié avant 2004. A cette date, la publication sera
reconduite;
supprimée;
remplacée par une édition révisée, ou
amendée.
_____________
Page 10
4.13  Photocoupleur, optocoupleur
Ajouter les nouveaux paragraphes suivants:
4.13.1  photocoupleur/optocoupleur à entrée continue
photocoupleur/optocoupleur dont l'élément d'entrée est un émetteur optoélectronique auquel
du courant continu est appliqué
4.13.2  photocoupleur/optocoupleur à entrée alternative
photocoupleur/optocoupleur dont l'élément d'entrée est un émetteur monté tête-bêche auquel
du courant alternatif est appliqué
4.13.3  photocoupleur/optocoupleur à phototransistor
photocoupleur/optocoupleur dont l'élément photosensible est un phototransistor
NOTE  Une borne de base peut ou non exister.
4.13.4  photocoupleur/optocoupleur à photodarlington
photocoupleur/optocoupleur dont l'élément photosensible est un phototransistor Darlington
NOTE  Une borne de base peut ou non exister.
4.13.5  photocoupleur/optocoupleur à photothyristor
photocoupleur/optocoupleur dont l'élément photosensible est un photothyristor
NOTE  Les régions de gâchette peuvent ou non ressortir comme des broches électriques.

60747-5-1 Amend. 1 © IEC:2001 – 3 –
FOREWORD
This amendment has been prepared by subcommittee 47E: Discrete semiconductor devices,
of IEC technical committee 47: Semiconductor devices.
The text of this amendment is based on the following documents:
FDIS Report on voting
47E/178/FDIS 47E/184/RVD
Full information on the voting for the approval of this amendment can be found in the report
on voting indicated in the above table.
The committee has decided that the contents of the base publication and its amendments will
remain unchanged until 2004. At this date, the publication will be
reconfirmed;
withdrawn;
replaced by a revised edition, or
amended.
_____________
Page 11
4.13  Photocoupler, optocoupler
Add the following new subclauses:
4.13.1  DC input photocoupler/optocoupler
photocoupler/optocoupler consisting at the input of an optoelectronic emitter to which d.c.
current is applied
4.13.2  AC input photocoupler/optocoupler
photocoupler/optocoupler consisting at the input of an antiparallel optoelectronic emitter to
which a.c. current is applied
4.13.3  phototransistor photocoupler/optocoupler
photocoupler/optocoupler whose photosensitive element is a phototransistor
NOTE  A base terminal may or may not be provided.
4.13.4  photodarlington photocoupler/optocoupler
photocoupler/optocoupler whose photosensitive element is a Darlington phototransistor
NOTE  A base terminal may or may not be provided.
4.13.5  photothyristor photocoupler/optocoupler
photocoupler/optocoupler whose photosensitive element is a photothyristor
NOTE  A gate terminal may or may not be provided.

– 4 – 60747-5-1 amend. 1 © CEI:2001
4.13.6  photocoupleur/optocoupleur à phototriac
photocoupleur/optocoupleur dont l'élément pho
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.

This May Also Interest You

IEC
IEC 60747-5-4:2022(Main)
Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

IEC 60747-5-4:2022(E) specifies the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.
This edition includes the following significant technical changes with respect to the previous edition:  
References for the terms and definitions related to the lighting area, IEC 60050-845, are revised based on IEC 60050-845:2020;
Emission angle is changed to radiation angle in 3.3.2;
Definitions of rise time and fall time in 3.4.1 are revised based on the publication IEC 60050-521:2002;
Spectral linewidth is added to Table 1 in Clause 4;
Conditions for carrier-to-noise ratio of Table 1 in Clause 4 is amended.
Error in the equation for carrier-to-noise ratio in 5.2.2 is corrected;
Precaution against the equipment used for carrier-to-noise ratio measurement is added in 5.2.2;
Explanation for the measurement method of the small signal cut-off frequency in 5.3.2 of the first edition is deleted because it has been defined in the latest version of ISO 11554;
Reference document for the lifetime in 5.4 is amended;
Precaution against the measuring arrangement used for the half-intensity width and 1/e2-intensity is added in 5.5.3;
Reference tables in Annex A, Annex B and Annex C are revised by following the latest version of ISO publications.

  • Standard
    33 pages
    English language
    sale 15% off
IEC
IEC 60747-14-11:2021(Main)
Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

IEC 60747-14-11:2021(E) defines the terms, definitions, configuration, and test methods can be used to evaluate and determine the performance characteristics of surface acoustic wave-based semiconductor sensors integrated with ultraviolet, illuminance, and temperature sensors. The measurement methods are for DC characteristics and RF characteristics, and the measurement method for RF characteristics includes a direct mode and differential amplifier mode based on feedback oscillation. This document excludes devices dealt with by TC 49: piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection.

  • Standard
    21 pages
    English language
    sale 15% off
IEC
IEC 60747-5-5:2020(Main)
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

IEC 60747-5-5:2020 specifies the terminology, essential ratings, characteristics, safety tests, as well as the measuring methods for photocouplers.
Note: The term "optocoupler" can also be used instead of "photocoupler".
This edition includes the following significant technical changes with respect to the previous edition:
a) optional data sheet basic insulation rating in accordance with IEC 60664-1:2007, 6.1.3.5;
b) editorial corrections on the use of VIORM;
c) editorial corrections on Figure 2: Time intervals for method b);
d) addition of an alternative surge pulse VIOSM test method.

  • Standard
    52 pages
    English language
    sale 15% off
  • Standard
    105 pages
    English and French language
    sale 15% off
IEC
IEC 60747-18-2:2020(Main)
Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package modules

IEC 60747-18-2:2020(E) specifies the evaluation process of lens-free CMOS photonic array sensor package modules. This document includes the measurement environment of each process, statistical analysis of test data, middle layer effect under various user light, evaluation of calibrated lens-free CMOS photonic array sensor package modules, and test report.

  • Standard
    18 pages
    English language
    sale 15% off
IEC
IEC 60747-14-10:2019(Main)
Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors

IEC 60747-14-10:2019 specifies the terms, definitions, symbols, tests, and performance evaluation methods used to determine the performance characteristics of wearable electrochemical-glucose sensors for practical use. This document is applicable to all wearable electrochemical-glucose sensors for consumers and manufacturers, without any limitations on device technology and size.

  • Standard
    64 pages
    English and French language
    sale 15% off
IEC
IEC 60747-9:2019(Main)
Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

IEC 60747-9:2019 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs).
This third edition includes the following significant technical changes with respect to the previous edition:  
reverse-blocking IGBT and its related technical contents have been added;
reverse-conducting IGBT and its related technical contents have been added;
some parts of the previous edition have been amended, combined or deleted.

  • Standard
    160 pages
    English and French language
    sale 15% off
IEC
IEC 60747-5-5:2007(Main)
Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

This part of IEC 60747 gives the terminology, essential ratings, characteristics, safety test as well as the measuring method for photocouplers (or optocouplers). NOTE The word "optocoupler" can also be used instead of "photocoupler". This standard replaces the clauses for photocouplers (or optocouplers) described in IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, including their amendments. The contents for phototransistors and photothyristors in IEC 60747-5-1, IEC 60747-5-2 and IEC 60747-5-3, including their amendments, will be considered obsolete as of the effective date of publication of this standard. NOTE Photocouplers that are certified to the previous version of the photocoupler standard, namely IEC 60747-5-1/2/3, are to be considered in compliance with the requirements and provisions of IEC 60747-5-5.

  • Standard
    104 pages
    English and French language
    sale 15% off
  • Standard
    104 pages
    English and French language
    sale 15% off
IEC
IEC 60747-5-5:2007/AMD1:2013(Amendment)
Amendment 1 - Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers
  • Standard
    8 pages
    English and French language
    sale 15% off
IEC
IEC 60747-14-4:2011(Main)
Semiconductor devices - Discrete devices - Part 14-4: Semiconductor accelerometers

IEC 60747-14-4:2011 applies to semiconductor accelerometers for all types of products. This standard applies not only to typical semiconductor accelerometers with built-in electric circuits, but also to semiconductor accelerometers accompanied by external circuits. This standard does not (or should not) violate (or interfere with) the agreement between customers and suppliers in terms of a new model or parameters for business.
NOTE 1: This standard, although directed toward semiconductor accelerometers, may be applied in whole or in part to any mass produced type of accelerometer.
NOTE 2: The purpose of this standard is to allow for a systematic description, which covers the subjects initiated by the advent of semiconductor accelerometers. The tasks imposed on the semiconductor accelerometers are not only common to all accelerometers but also inherent to them and not yet totally solved. The descriptions are based on latest research results. One typical example is the multi-axis accelerometer. This standard states the method of measuring acceleration as a vector quantity using multi-axis accelerometers.
NOTE 3: This standard does not conflict in any way with any existing parts of either ISO 16063 or ISO 5347. This standard intends to provide the concepts and the procedures of calibration of the semiconductor multi-axis accelerometers which are used not only for the measurement of acceleration but also for the control of motion in the wide frequencies ranging from DC.
This publication is to be read in conjunction with IEC 60747-1:2006.

  • Standard
    197 pages
    English and French language
    sale 15% off
IEC
IEC 60747-14-5:2010(Main)
Semiconductor devices - Part 14-5: Semiconductor sensors - PN-junction semiconductor temperature sensor

IEC 60747-14-5:2010 is applicable to semiconductor PN-junction temperature sensors and defines terms, definitions, symbols, essential ratings, characteristics and test methods that can be used to determine the characteristics of semiconductor types of PN-junction temperature sensors.

  • Standard
    37 pages
    English and French language
    sale 15% off