IEC 62341-1-1:2009

Organic light emitting diode (OLED) displays - Part 1-1: Generic specifications

IEC 62341-1-1:2009 is a generic specification for organic light emitting diode (OLED) displays. It defines general procedures for quality assessment to be used in the IECQ System and establishes general rules for methods of electrical and optical measurements, environmental and mechanical tests and endurance tests.

Afficheurs à diodes électroluminescentes organiques (OLED) - Partie 1-1: Spécifications génériques

La CEI 62341-1-1:2009 est une spécification générique pour les afficheurs à diodes électroluminescentes organiques (OLED; en anglais Organic Light Emitting Diode). Elle définit les procédures générales pour l'assurance de la qualité à utiliser dans le système IECQ-CECC et établit des règles générales pour les méthodes de mesures électriques et optiques, les essais d'environnement et mécaniques et les essais d'endurance.

General Information

• Status: Published
• Publication Date: 06-Apr-2009
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.260 - Optoelectronics. Laser equipment
• Technical Committee: TC 110 - Electronic displays
• Drafting Committee: WG 5 - TC 110/WG 5
• Current Stage: PPUB - Publication issued
• Start Date: 30-Apr-2009
• Completion Date: 07-Apr-2009

Standards Content (Sample)

IEC 62341-1-1 ®
Edition 1.0 2009-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Organic light emitting diode (OLED) displays –
Part 1-1: Generic specifications

Afficheurs à diodes électroluminescentes organiques (OLED) –
Partie 1-1: Spécifications génériques

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IEC 62341-1-1 ®
Edition 1.0 2009-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Organic light emitting diode (OLED) displays –
Part 1-1: Generic specifications

Afficheurs à diodes électroluminescentes organiques (OLED) –
Partie 1-1: Spécifications génériques

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
S
CODE PRIX
ICS 31.260 ISBN 978-2-88910-675-2
– 2 – 62341-1-1 © IEC:2009
CONTENTS
FOREWORD.4
1 Scope.6
2 Normative references .6
3 Terms, definitions, units and symbols .6
4 Technical aspects.6
4.1 Order of precedence .6
4.2 Standard atmospheric conditions.7
4.3 Marking .7
4.3.1 Device identification .7
4.3.2 Device traceability .7
4.3.3 Packing .7
4.4 Categories of assessed quality.7
4.5 Screening.8
4.6 Handling.8
5 Quality assessment procedures.8
5.1 Eligibility for qualification approval .8
5.2 Primary stage of manufacture.8
5.3 Commercially confidential information .8
5.4 Formation of inspection lots.9
5.5 Structurally similar devices.9
5.6 Subcontracting .9
5.7 Validity of release.9
6 Quality approval procedure.9
6.1 Granting of qualification approval .9
6.2 Quality conformance inspection requirements.9
6.2.1 Division into groups and subgroups .9
6.2.2 Quality conformance Inspection requirements.11
6.2.3 Supplementary procedure for reduced inspection .12
6.2.4 Sampling requirements for small lots .12
6.2.5 Certified records of released lots (CRRL) .12
6.2.6 Delivery of devices subjected to destructive or non-destructive test.12
6.2.7 Delayed deliveries .12
6.2.8 Supplementary procedure for deliveries.12
6.3 Statistical sampling procedures .13
6.3.1 AQL sampling plans.13
6.3.2 LTPD sampling plans.13
6.4 Endurance tests .13
6.4.1 General .13
6.4.2 Endurance tests where the failure rate is specified .13
6.5 Accelerated test procedures .14
7 Capability approval procedure .14
8 Test and measurement procedures.15
8.1 Standard environmental conditions.15
8.1.1 Dark room condition .15
8.1.2 Standard setup condition .15
8.1.3 Standard atmospheric conditions for measurements .15

62341-1-1 © IEC:2009 – 3 –
8.2 Physical examination.15
8.2.1 Visual examination .15
8.2.2 Dimensions .15
8.2.3 Weight.15
8.2.4 Permanence of marking.15
8.3 Electrical and optical measurement .15
8.3.1 General conditions and precautions.16
8.4 Environmental test .16
8.5 Endurance test .16
Annex A (informative) Lot tolerance percentage defective (LTPD) sampling plans .17
Bibliography.22

Table A.1 – LTPD sampling plans .19
Table A.2 – Hypergeometric sampling plans for small lot sizes of 200 or less .20
Table A.3 – AQL and LTPD sampling plans.21

– 4 – 62341-1-1 © IEC:2009
INTERNATIONAL ELECTROTECHNICAL COMMISSION
___________
ORGANIC LIGHT EMITTING DIODE (OLED) DISPLAYS –

Part 1-1: Generic specifications

FOREWORD
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all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
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