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IEC 60749-10:2002

(Main)

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 10: Chocs mécaniques

Décrit un essai aux chocs destiné à déterminer la bonne adaptation des éléments des composants à une utilisation dans des équipements électroniques qui peuvent être soumis à des chocs d'une sévérité modérée à la suite de l'application soudaine de forces ou de brusques modifications de déplacements au cours de manipulations brutales, du transport ou du fonctionnement sur le terrain. Des chocs de ce type peuvent perturber les caractéristiques de fonctionnement, en particulier si les impulsions de choc sont répétitives. Il s'agit d'un essai destructif. Il est normalement applicable aux boîtiers de type à cavité interne. Le contenu du corrigendum d'août 2003 a été pris en considération dans cet exemplaire.

General Information

Status
Published
Publication Date
08-Apr-2002
ICS
01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
31.080.01 - Semiconductor devices in general
Technical Committee
TC 47 - Semiconductor devices
Drafting Committee
WG 2 - TC 47/WG 2
Current Stage
DELPUB - Deleted Publication
Start Date
31-May-2021
Completion Date
27-Apr-2022
Ref Project

Relations

Revised
IEC 60749-10:2022 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock - device and subassembly
Effective Date
05-Sep-2023

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IEC 60749-10:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shockIEC 60749-10:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
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IEC 60749-10:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
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NORME CEI
INTERNATIONALE IEC
60749-10
INTERNATIONAL
Première édition
STANDARD
First edition
2002-04
Dispositifs à semiconducteurs –
Méthodes d'essais mécaniques et climatiques –
Partie 10:
Chocs mécaniques
Semiconductor devices –
Mechanical and climatic test methods –
Part 10:
Mechanical shock
Numéro de référence
Reference number
CEI/IEC 60749-10:2002

---------------------- Page: 1 ----------------------
Numérotation des publications Publication numbering
Depuis le 1er janvier 1997, les publications de la CEI As from 1 January 1997 all IEC publications are
sont numérotées à partir de 60000. Ainsi, la CEI 34-1 issued with a designation in the 60000 series. For
devient la CEI 60034-1. example, IEC 34-1 is now referred to as IEC 60034-1.
Editions consolidées Consolidated editions
Les versions consolidées de certaines publications de la The IEC is now publishing consolidated versions of its
CEI incorporant les amendements sont disponibles. Par publications. For example, edition numbers 1.0, 1.1
exemple, les numéros d’édition 1.0, 1.1 et 1.2 indiquent and 1.2 refer, respectively, to the base publication,
respectivement la publication de base, la publication de the base publication incorporating amendment 1 and
base incorporant l’amendement 1, et la publication de the base publication incorporating amendments 1
base incorporant les amendements 1 et 2. and 2.
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constamment revu par la CEI afin qu'il reflète l'état under constant review by the IEC, thus ensuring that
actuel de la technique. Des renseignements relatifs à the content reflects current technology. Information
cette publication, y compris sa validité, sont dispo- relating to this publication, including its validity, is
nibles dans le Catalogue des publications de la CEI available in the IEC Catalogue of publications
(voir ci-dessous) en plus des nouvelles éditions, (see below) in addition to new editions, amendments
amendements et corrigenda. Des informations sur les and corrigenda. Information on the subjects under
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---------------------- Page: 2 ----------------------
NORME CEI
INTERNATIONALE IEC
60749-10
INTERNATIONAL
Première édition
STANDARD
First edition
2002-04
Dispositifs à semiconducteurs –
Méthodes d'essais mécaniques et climatiques –
Partie 10:
Chocs mécaniques
Semiconductor devices –
Mechanical and climatic test methods –
Part 10:
Mechanical shock
 IEC 2002 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électro
...

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