IEC 62529:2007
(Main)Standard for Signal and Test Definition
Standard for Signal and Test Definition
Provides the means to define and describe signals used in testing. It also provides a set of common basic siginals, mathematically underpinned so that siginals can be combined to form complex signals usable across all test platforms.
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IEC 62529
Edition 1.0 2007-11
™
IEEE 1641
INTERNATIONAL
STANDARD
Standard for Signal and Test Definition
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IEC 62529
Edition 1.0 2007-11
™
IEEE 1641
INTERNATIONAL
STANDARD
Standard for signal and test definition
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XH
ICS 25.040 ISBN 2-8318-9482-4
– 2 –
IEEE 1641-2004(E)
CONTENTS
FOREWORD.10
IEEE introduction.13
1. Overview. 14
1.1 Scope. 14
1.2 Purpose.15
2. Definitions, abbreviations, and acronyms.15
2.1 Definitions .15
2.2 Abbreviations and acronyms .17
3. Structure of this standard .18
3.1 Layers.18
4. Signal modeling language (SML) layer.20
5. Basic signal component (BSC) layer .20
5.1 BSC layer base classes.20
5.2 BSCs . 21
5.3 SignalFunction template . 22
6. Test signal framework (TSF) layer. 22
6.1 TSF classes . 22
6.2 TSF signals . 23
7. Test procedure language (TPL) layer . 25
7.1 Goals of the TPL. 25
7.2 Elements of the TPL . 25
7.3 Use of the TPL. 25
Annex A (normative) Signal modeling language (SML) . 26
A.1 Use of the SML. 26
A.2 Introduction. 26
A.3 Physical types . 27
A.4 Signal definitions . 30
A.5 Pure signals . 31
A.5.1 Nonperiodic signals. 31
A.5.2 Periodic signals . 32
A.6 Pure signal-combining mechanisms . 33
A.6.1 Piecewise continuous signals (PCSs). 33
A.6.2 Sum. 36
A.6.3 Product . 36
A.7 Pure function transformations. 36
A.7.1 Fourier transform. 37
A.8 Measuring, limiting, and sampling signals . 37
A.8.1 Confining parameters to a limit. 38
A.8.2 Sampling signals . 38
A.9 Digital signals . 38
Published by IEC under licence from IEEE. © 2004 IEEE. All rights reserved.
– 3 –
IEEE 1641-2004(E)
A.9.1 Defining Digital. 39
A.9.2 Defining DigitalSignal . 39
A.9.3 Conversion routines. 40
A.9.4 Patterns . 41
A.10 Basic component SML. 42
A.10.1 Source ::SignalFunction . 42
A.10.2 Conditioner ::SignalFunction . 44
A.10.3 EventFunction ::SignalFunction. 47
A.10.4 Sensor ::SignalFunction . 50
A.10.5 Digital ::SignalFunction . 50
A.10.6 Connection ::SignalFunction. 51
Annex B (normative) Basic signal component (BSC) layer. 53
B.1 BSC layer base classes. 53
B.2 BSC subclasses . 53
B.3 Description of a BSC . 58
B.3.1 Diagrammatic representation of a BSC. 58
B.3.2 BSC interfaces. 59
B.3.3 Types of BSCs. 60
B.3.4 BSC attribute default values. 61
B.3.5 BSC subclass descriptions. 61
B.4 Physical class . 63
B.4.1 Permissible physical types and their units. 65
B.4.2 Unit prefixes. 69
B.5 PulseDefns class . 70
B.5.1 PulseDefn class . 71
B.6 SignalFunction class . 71
B.6.1 Source ::SignalFunction . 72
B.6.2 Conditioner ::SignalFunction . 80
B.6.3 EventFunction ::SignalFunction. 94
B.6.4 Sensor ::SignalFunction .100
B.6.5 Digital ::SignalFunction .106
B.6.6 Connection ::SignalFunction.108
Annex C (normative) Dynamic signal descriptions.112
C.1 Introduction. 112
C.2 Basic classes . 113
C.2.1 ResourceManager. 113
C.2.2 Signal. 114
C.2.3 BSCs. 116
C.3 Dynamic signal goals and use cases . 118
Annex D (normative) IDL basic components. 119
D.1 Introduction. 119
D.2 IDL BSC library.119
Annex E (informative) Test signal framework (TSF) for ATLAS. 161
E.1 Introduction. 161
E.2 AC_SIGNAL . 161
E.2.1 Definition . 161
E.2.2 Interface properties. 162
Published by IEC under licence from IEEE. © 2004 IEEE. All rights reserved.
– 4 – IEC 62529:2007(E)
IEEE 1641-2004(E)
E.2.3 Notes. 162
E.2.4 Model desc
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