IEC 60749-11:2002/COR1:2003
(Corrigendum)Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Corrigendum 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 11: Variations rapides de température - Méthode des deux bains
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Standards Content (Sample)
CEI 60749-11 IEC 60749-11
(Première édition – 2002) (First edition – 2002)
Dispositifs à semiconducteurs – Semiconductor devices –
Méthodes d’essais mécaniques et climatiques – Mechanical and climatic test methods –
Partie 11: Variations rapides de température – Part 11: Rapid change of temperature –
Méthode des deux bains Two-fluid-bath method
CORRIGENDUM 1
Page 10 Page 11
Tableau 1 – Tolérances de tempé
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