IEC 62526:2007

Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments

Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.

General Information

• Status: Published
• Publication Date: 06-Nov-2007
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 25.040.01 - Industrial automation systems in general
• Technical Committee: TC 91 - Electronics assembly technology
• Drafting Committee: WG 15 - TC 91/WG 15
• Current Stage: PPUB - Publication issued
• Start Date: 15-Nov-2007
• Completion Date: 07-Nov-2007

Standards Content (Sample)

IEC 62526
Edition 1.0 2007-11
™
IEEE 1450.1
INTERNATIONAL
STANDARD
Standard for Extensions to Standard Test Interface Language (STIL) for
Semiconductor Design Environments



IEC 62526:2007(E) IEEE Std. 1450.1-2005

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IEC 62526
Edition 1.0 2007-11
™
IEEE 1450.1
INTERNATIONAL
STANDARD


Standard for Extensions to Standard Test Interface Language (STIL) for
Semiconductor Design Environments


INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
XF
ICS 25.040 ISBN 2-8318-9348-8

---------------------- Page: 3 ----------------------
– 2 – IEC 62526:2007(E)
IEEE 1450.1-2005(E)
CONTENTS
FOREWORD.5
IEEE Introduction .8
1. Overview.9
1.1 Scope.10
1.2 Purpose.11
2. Definitions, acronyms, and abbreviations.11
2.1 Definitions .11
2.2 Acronyms and abbreviations .12
3. Structure of this standard . 12
4. STIL syntax description.13
4.1 Reserved words.13
4.2 Reserved characters .14
4.3 Reserved UserFunctions .
...