IEC PAS 62276:2001
(Main)Single crystal wafers applied for surface acoustic wave device - Specification and measuring method
Single crystal wafers applied for surface acoustic wave device - Specification and measuring method
Applies to single crystal wafers intended for manufacturing substrates made of synthetic quartz crystal, lithium niobate, lithium tantalate, lithium tetraborate crystals for surface acoustic wave (SAW) filters and resonators. Lays down specifications and measuring methods.
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Standards Content (Sample)
IEC/PAS 62276
Edition 1.0
2001-08
Single crystal wafers applied
for surface acoustic wave device –
Specification and measuring method
PUBLI C LY AVAI LABLE SPECI F I CATI O N
IN TER N A TION AL Reference number
E L E C T R OT E CHNI CA L
IEC/PAS 62276
C O MMI S S I O N
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SINGLE CRYSTAL WAFERS APPLIED
FOR SURFACE ACOUSTIC WAVE DEVICE –
SPECIFICATION AND MEASURING METHOD
FOREWORD
A PAS is a technical specification not fulfilling the requirements for a standard, but made available to the
public and established in an organization operating under given procedures.
IEC-PAS 62276 was submitted by the Japanese Institute of Electronics, Information and Communication Engineers
and has been processed by IEC technical committee 49: Piezoelectric and dielectric devices for frequency control
and selection.
The text of this PAS is based on the This PAS was approved for
following document: publication by the P-members of the
committee concerned as indicated in
the following document:
Draft PAS Report on voting
49/504/PAS 49/513/RVD
Following publication of this PAS, the technical committee or subcommittee concerned will investigate the
possibility of transforming the PAS into an International Standard.
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all
national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-
operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition
to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees;
any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International,
governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC
collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions
determined by agreement between the two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all interested
National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form of
standards, technical specifications, technical reports or guides and they are accepted by the National Committees in
that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards
transparently to the maximum extent possible in their national and regional standards. Any divergence between the
IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this PAS may be the subject of patent rights. The
IEC shall not be held responsible for identifying any or all such patent rights.
Page i
FOREWORD
Although the mobile communication is spreading rapidly with a global scale in recent
years, the surface acoustic wave device is used, to the cellular phone that is used for
these widely. Wafers of the various single crystal piezoelectricity materials are used
for those devices. However, those standard is carried out individually between a
manufacturer and user, that is actual situation.
As the demands of single crystal wafers are increasing, it is indispensable to
standardize them such as the terms and definitions, test conditions, measurement
methods of materials, and guide the use.
International Electrotechnical Commission located in Geneva is actively working for
the international standardization in the electrotechnical field. Among many Technical
Committees (TCs) in IEC, TC 49 is working on the Piezoelectric and Dielectric Devices
for Frequency Control and Selection. TC 49 has ten Working Groups (WGs), and the
Working Group 5 (WG 5) is working for the preparation and deliberation of the IEC
standard on the piezoelectric single crystal.
The piezoelectric and dielectric devices for frequency control and selection in the
Standard Committee of the Institute of Electronics, Information and Communication
Engineers have gotten active as the interior deliberation party of IEC/TC 49. On the
other hand, QIAJ (Quartz Industry Association of Japan) is the industry meeting that
was organized with the maker of a crystal unit and the activity corresponding to TC
49/WG 5 is done by the material committee which belongs QIAJ. This document was
issued by the material committee of QIAJ, under cooperation with the 10th work
sectional meeting (WG 10) of TC 49.
When the Japanese National Committee for IEC/TC 49 proposed this documents as a
new work item proposal (49/428/NP), however, was not approved (49/RVN/440),
because only two countries; Germany and Japan, nominated experts to participate this
project. According to the IEC rule for the New Work Items Proposal, it is required to
start a new project that more than four P-member countries should noinate the name
of experts and this proposal failed. But, the Japanese National Committee for IEC/TC
49 decided to contine the work to draft this standard, even though it was not approved,
because we believed that this should be a very fundamental, useful and mandatory
documents. Therefore, Technical Committee of QIAJ cooperated to make out this work
and the draft was reviewed at the TC 49 Nara meeting, April, 2000 and recommended
as a PAS document (49/RVN/474). Finally, this document has been completed
- II -
published as a standard of the Institute of Electronics, Informaion and Communication
Engineers and a technical standard of QIAJ.
This standard is a fruit of collecting wisdom in the field of advanced technology in
Japan and it is open for public as the Standard of the Institute of Electronics,
Informaion and Communication Engineers. And it is expected that this standard will
contribute to the development of technology in this fast growing field. This standard
will be submitted to the IEC in the track of IEC PAS (Publi
...
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