IEC 60679-1:2007

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

IEC 60679-1:2007 specifies the methods of test and general requirements for quartz crystal controlled oscillators of assessed quality using either capability approval or qualification approval procedures. It represents a step in a revision of all parts of the IEC 60679 series to include the test requirements of the IECQ system. This edition is based on the relevant standards of that system.

Oscillateurs pilotés par quartz sous assurance de la qualité - Partie 1: Spécification générique

La CEI 60679-1:2007 spécifie les méthodes d'essai et les exigences générales pour les oscillateurs pilotés par quartz dont la qualité est garantie par les procédures d'agrément de savoir-faire ou par les procédures d'homologation. Elle constitue une étape de la révision de toutes les parties de la série CEI 60679 pour incorporer les exigences d'essai du système IECQ. La présente édition est basée sur les normes applicables de ce système.

General Information

• Status: Published
• Publication Date: 10-Apr-2007
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
• Drafting Committee: WG 7 - TC 49/WG 7
• Current Stage: DELPUB - Deleted Publication
• Completion Date: 26-Jul-2017

Relations

• Revises: IEC 60679-1:1997/AMD2:2003 - Amendment 2 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
• Effective Date: 05-Sep-2023
• Revises: IEC 60679-1:1997 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
• Effective Date: 05-Sep-2023
• Revises: IEC 60679-1:1997/AMD1:2002 - Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
• Effective Date: 05-Sep-2023
• Revised: IEC 60679-1:2017 - Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
• Effective Date: 05-Sep-2023

Standards Content (Sample)

INTERNATIONAL IEC
STANDARD 60679-1
Third edition
2007-04
Quartz crystal controlled oscillators
of assessed quality –
Part 1:
Generic specification
Reference number
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

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About the IEC
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International Standards for all electrical, electronic and related technologies.

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INTERNATIONAL IEC
STANDARD 60679-1
Third edition
2007-04
Quartz crystal controlled oscillators
of assessed quality –
Part 1:
Generic specification
PRICE CODE
Commission Electrotechnique Internationale
XC
International Electrotechnical Commission
МеждународнаяЭлектротехническаяКомиссия
For price, see current catalogue

– 2 – 60679-1 © IEC:2007(E)
CONTENTS
FOREWORD.5

1 Scope.7
2 Normative references .7
3 Terms, definitions and general information .9
3.1 General .9
3.2 Definitions .9
3.3 Preferred values for ratings and characteristics .19
3.4 Marking .21
4 Quality assessment procedures.21
4.1 Primary stage of manufacture.21
4.2 Structurally similar components.21
4.3 Subcontracting .22
4.4 Incorporated components .22
4.5 Manufacturer’s approval .22
4.6 Approval procedures .22
4.7 Procedures for capability approval .23
4.8 Procedures for qualification approval.23
4.9 Test procedures .24
4.10 Screening requirements .24
4.11 Rework and repair work.24
4.12 Certified test records .24
4.13 Validity of release.24
4.14 Release for delivery .24
4.15 Unchecked parameters.25
5 Test and measurement procedures.25
5.1 General .25
5.2 Test and measurement conditions .25
5.3 Visual inspection .26
5.4 Dimensions and gauging procedures .27
5.5 Electrical test procedures .27
5.6 Mechanical and environmental test procedures .70
5.7 Endurance test procedure .76

Annex A (normative) Load circuit for logic drive .78
Annex B (normative) Latch-up test.81
Annex C (normative) Electrostatic discharge sensitivity classification .82

Bibliography.83

Figure 1 – Example of the use of frequency offset .11
Figure 2 – Typical frequency fluctuation characteristics .14
Figure 3 – Characteristics of an output waveform.16
Figure 4 – Clock signal with phase jitter.17
Figure 5 – Phase jitter measures .17

60679-1 © IEC:2007(E) – 3 –
Figure 6 – Gaussian distribution of jitter.18
Figure 7 – Jitter amplitude and period of jitter frequency.18
Figure 8 – Jitter tolerance according to ITU-T G.825, ANSI T1.105.03, Telcordia
GR-253 and ETSI EN 300462 .19
Figure 9 – Test circuits for insulation resistance measurements.27
Figure 10 – Test circuit for voltage proof test .28
Figure 11 – Test circuit for oscillator input power measurement .28
Figure 12 – Test circuit for oven and oscillator input power measurement.29
Figure 13 – Test circuit for measurement of output frequency, method1.30
Figure 14 – Test circuit for measurement of output frequency, method 2.30
Figure 15 – Test circuit for measurement of frequency/temperature characteristics.31
Figure 16 – Thermal transient behaviour of typical oscillator .33
Figure 17 – Generalized oscillator circuit .34
Figure 18 – Test circuit for start-up behaviour and start-up time measurement .35
Figure 19 – Typical start-up behaviour with slow supply voltage ramp.35
Figure 20 – Definition of start-up time .37
Figure 21 – Supply voltage waveform for periodical t measurement .37
SU
Figure 22 – Typical oscillator stabilization characteristic .38
Figure 23 – Example of retrace characteristic .39
Figure 24 – Test circuit for the measurement of output voltage .39
Figure 25 – Test circuit for the measurement of pulse outputs .40
Figure 26 – Test circuit for harmonic distortion measurement .40
Figure 27a – Symmetrical .40
Figure 27b – Large odd harmonic content .40
Figure 27c – Large even harmonic content .41
Figure 27 – Quasi-sinusoidal output waveforms .41
Figure 28a – Ideal spectrum .41
Figure 28b – Spectrum showing severe harmonic distortion .41
Figure 28 – Frequency spectrum for harmonic distortion .41
Figure 29 – Test circuit for the determination of isolation between output ports.44
Figure 30 – Test circuit for measuring suppression of gated oscillators.44
Figure 31 – Test circuit for tri-state disable mode output current.45
Figure 32 – Test circuit for output gating time – tri-state .46
Figure 33 – Test circuit for modulation index measurement.46
Figure 34 – Modulation waveform for index calculation .47
Figure 35 – Logarithmic signal amplitude scale.47
Figure 36 – Test circuit to determine amplitude modulation sensitivity .49
Figure 37 – Frequency spectrum of amplitude modulation distortion .49
Figure 38 – Test circuit to determine pulse amplitude modulation .50
Figure 39 – Pulse modulation characteristic.50
Figure 40 – Test circuit for the determination of modulation input impedance.51
Figure 41 – Test circuit for the measurement of f.m. deviation .52
Figure 42 – Test circuit for the measurement of f.m. sensitivity.54

– 4 – 60679-1 © IEC:2007(E)
Figure 43a – Static test.54
Figure 43b – Dynamic test .55
Figure 43 – Test circuit for the measurement of frequency modulation distortion.55
Figure 44 – Test circuit for the measurement of single-sideband phase noise .56
Figure 45 – Typical noise pedestal spectrum .57
Figure 46 – Test circuit for the measurement of incidental frequency modulation .59
Figure 47 – Test circuit for method 1.60
Figure 48 – Test circuit for method 2.61
Figure 49 – Circuit modifications for methods 1 and 2.62
Figure 50 – Time-domain short-term frequency stability of a typical 5 MHz precision
oscillator .63
Figure 51a – Typical arrangement for radiated interference tests, 30 MHz and above.64
Figure 51b – Typical arrangement for radiated interference tests, below 30 MHz .64
Figure 51 – Radiated interference tests .64
Figure 52 – Characteristics of line impedance of stabilizing network .65
Figure 53 – Circuit diagram of line impedance of stabilizing network.66
Figure 54 – Phase jitter measurement with sampling oscilloscope .67
Figure 55 – Block diagram of a jitter and wander analyzer according to ITU-T O.172 .69
Figure A.1 – Circuit for TTL.78
Figure A.2 – Circuit for schottky logic.78
...

IEC 60679-1 ®
Edition 3.0 2007-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Quartz crystal controlled oscillators of assessed quality –
Part 1: Generic specification
Oscillateurs pilotés par quartz sous assurance de la qualité –
Partie 1: Spécification générique

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by
any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or
IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

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International Standards for all electrical, electronic and related technologies.

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latest edition, a corrigenda or an amendment might have been published.
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IEC 60679-1 ®
Edition 3.0 2007-04
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Quartz crystal controlled oscillators of assessed quality –
Part 1: Generic specification
Oscillateurs pilotés par quartz sous assurance de la qualité –
Partie 1: Spécification générique
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX XC
ICS 31.140 ISBN 978-2-88912-616-3

– 2 – 60679-1  IEC:2007
CONTENTS
CONTENTS . 2
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and general information . 9
3.1 General . 9
3.2 Definitions . 9
3.3 Preferred values for ratings and characteristics . 19
3.4 Marking . 21
4 Quality assessment procedures . 21
4.1 Primary stage of manufacture . 21
4.2 Structurally similar components . 21
4.3 Subcontracting . 22
4.4 Incorporated components . 22
4.5 Manufacturer’s approval . 22
4.6 Approval procedures . 22
4.7 Procedures for capability approval . 23
4.8 Procedures for qualification approval . 23
4.9 Test procedures . 24
4.10 Screening requirements . 24
4.11 Rework and repair work . 24
4.12 Certified test records . 24
4.13 Validity of release . 24
4.14 Release for delivery . 24
4.15 Unchecked parameters . 25
5 Test and measurement procedures . 25
5.1 General . 25
5.2 Test and measurement conditions . 25
5.3 Visual inspection . 26
5.4 Dimensions and gauging procedures . 27
5.5 Electrical test procedures . 27
5.6 Mechanical and environmental test procedures . 71
5.7 Endurance test procedure . 78
Annex A (normative) Load circuit for logic drive . 79
Annex B (normative) Latch-up test . 82
Annex C (normative) Electrostatic discharge sensitivity classification . 83
Bibliography . 84

Figure 1 – Example of the use of frequency offset . 11
Figure 2 – Typical frequency fluctuation characteristics . 14
Figure 3 – Characteristics of an output waveform. 16
Figure 4 – Clock signal with phase jitter . 17
Figure 5 – Phase jitter measures . 17
Figure 6 – Gaussian distribution of jitter . 18
Figure 7 – Jitter amplitude and period of jitter frequency . 18

60679-1  IEC:2007 – 3 –
Figure 8 – Jitter tolerance according to ITU-T G.825, ANSI T1.105.03, Telcordia
GR-253 and ETSI EN 300462 . 19
Figure 9 – Test circuits for insulation resistance measurements . 27
Figure 10 – Test circuit for voltage proof test . 28
Figure 11 – Test circuit for oscillator input power measurement . 28
Figure 12 – Test circuit for oven and oscillator input power measurement . 29
Figure 13 – Test circuit for measurement of output frequency, method1 . 30
Figure 14 – Test circuit for measurement of output frequency, method 2 . 30
Figure 15 – Test circuit for measurement of frequency/temperature characteristics . 31
Figure 16 – Thermal transient behaviour of typical oscillator . 33
Figure 17 – Generalized oscillator circuit . 34
Figure 18 – Test circuit for start-up behaviour and start-up time measurement . 35
Figure 19 – Typical start-up behaviour with slow supply voltage ramp . 35
Figure 20 – Definition of start-up time . 37
Figure 21 – Supply voltage waveform for periodical t measurement . 37
SU
Figure 22 – Typical oscillator stabilization characteristic . 38
Figure 23 – Example of retrace characteristic . 39
Figure 24 – Test circuit for the measurement of output voltage . 39
Figure 25 – Test circuit for the measurement of pulse outputs . 40
Figure 26 – Test circuit for harmonic distortion measurement . 40
Figure 27a – Symmetrical . 40
Figure 27b – Large odd harmonic content . 40
Figure 27c – Large even harmonic content . 41
Figure 27 – Quasi-sinusoidal output waveforms . 41
Figure 28a – Ideal spectrum . 41
Figure 28b – Spectrum showing severe harmonic distortion . 41
Figure 28 – Frequency spectrum for harmonic distortion . 41
Figure 29 – Test circuit for the determination of isolation between output ports . 44
Figure 30 – Test circuit for measuring suppression of gated oscillators . 44
Figure 31 – Test circuit for tri-state disable mode output current . 45
Figure 32 – Test circuit for output gating time – tri-state . 46
Figure 33 – Test circuit for modulation index measurement . 46
Figure 34 – Modulation waveform for index calculation . 47
Figure 35 – Logarithmic signal amplitude scale . 47
Figure 36 – Test circuit to determine a
...