WG 7 - TC 49/WG 7

IEC 62884-4:2019 describes the methods for the measurement and evaluation of the short-term frequency stability tests of piezoelectric, dielectric and electrostatic oscillators. Its purpose is to unify the test and evaluation methods for short-term frequency stability.

IEC 62884-3:2018 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"). The purpose of those tests is to provide statistical data supporting aging predictions.
This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.

IEC 62884-2:2017 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

IEC 60679-1:2017 specifies general requirements for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as "Oscillator"), of assessed quality using either capability approval or qualification approval procedures.
NOTE Dielectric Resonator Oscillators (DRO) and oscillators using FBAR are under consideration.
This edition includes the following significant technical changes with respect to the previous edition:
a) the title has been changed;
b) additional matters related to oscillator using SAW or MEMS resonator in "Terms, definitions and general information" have been included;
c) measurement methods of IEC 60679-1:2007 have been removed (they will be moved to IEC 62884 series);
d) the content of Annex A has been extended;
e) a new term and definition DIXO (Digital interfaced Crystal Oscillator) has been added;
f) a new term and definition SSXO (Spread Spectrum Crystal Oscillator) has been added;
g) Annex D has been added.

IEC 62884-1:2017 specifies the measurement techniques for piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DROs) and oscillators using FBAR (hereinafter referred to as "Oscillator")

IEC 60679-5-1:1998 is a supplementary document to the sectional specification and contains requirements for the minimum content of detail specifications. Applies to quartz crystal controlled oscillators whose quality is assessed on the basis of capability approval.

IEC 60679-5:1998 applies to quartz crystal controlled oscillators whose quality is assessed on the basis of capability approval. It prescribes the preferred ratings and characteristics, with appropriate tests and measuring methods contained in the generic specification IEC 60679-1, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators.

IEC 60679-4-1:1998 is a supplementary document to the sectional specification and contains requirements for the minimum content of detail specifications. Applies to quartz crystal controlled oscillators as custom built products or as standard catalogue items and whose quality is assessed on the basis of capability approval.

IEC 60679-4:1997 applies to quartz crystal controlled oscillators as custom built products or as standard catalogue items and whose quality is assessed on the basis of capability approval. It prescribes the preferred ratings and characteristics, with appropriate tests and measuring methods contained in the generic specification, IEC 60679-1, and gives the general performance requirements to be used in detail specifications for quartz crystal controlled oscillators.