IEC TS 62916:2017

Photovoltaic modules - Bypass diode electrostatic discharge susceptibility testing

IEC TS 62916:2017(E) describes a discrete component bypass diode electrostatic discharge (ESD) immunity test and data analysis method. The test method described subjects a bypass diode to a progressive ESD stress test and the analysis method provides a means for analyzing and extrapolating the resulting failures using the two-parameter Weibull distribution function. It is the object of this document to establish a common and reproducible test method for determining diode surge voltage tolerance consistent with an ESD event during the manufacturing, packaging, transportation or installation processes of PV modules.

General Information

• Status: Published
• Publication Date: 09-Apr-2017
• ICS: 27.160 - Solar energy engineering
• Technical Committee: TC 82 - Solar photovoltaic energy systems
• Drafting Committee: WG 2 - TC 82/WG 2
• Current Stage: PPUB - Publication issued
• Start Date: 10-Apr-2017
• Completion Date: 20-Apr-2017

Overview

IEC TS 62916:2017 specifies a reproducible test and analysis method for assessing the electrostatic discharge (ESD) susceptibility of discrete bypass diodes used in photovoltaic (PV) modules. The Technical Specification defines a progressive contact-discharge test (following the IEC 61000-4-2 model) and a statistical data‑analysis procedure based on the two‑parameter Weibull distribution to characterize diode surge‑voltage tolerance. It is intended to support qualification, incoming quality control and identification of ESD control needs during manufacturing, packaging, transportation and installation of PV modules.

Key Topics and Requirements

• Scope & limitations
  • Tests discrete bypass diodes outside the module/junction box.
  • Does not set pass/fail ESD levels or address large energy events (e.g., lightning).
• Sampling
  • Ten unconditioned, identical diodes per test (same type, date code and factory recommended).
  • Lead trimming/forming should be done prior to testing.
• Test equipment & setup
  • Uses IEC 61000-4-2 contact discharge method (ESD gun with internal impedance 330 Ω, 150 pF).
  • Grounding block to hold DUTs; anode grounded, cathode exposed.
  • Positive polarity single‑surge mode; incremental voltage steps of 5 kV from 5 kV to a recommended capability of 30 kV (or higher).
• Test method
  • Verify diode operation (multimeter diode-check) before testing.
  • Apply progressive contact discharges to each diode; record environmental conditions (e.g., 20 °C ±5 °C, 50 % ±10 % RH recommended).
  • Allow surge relaxation time for thermal stabilization if needed.
• Data analysis
  • Analyze voltage-to-failure using the two‑parameter Weibull distribution.
  • Use recommended median‑rank estimation and least‑squares linear regression form for extrapolation and reporting.

Applications

• Qualification of new bypass diode designs for PV modules.
• Incoming material quality control for diode suppliers.
• Root-cause analysis of production line quality excursions attributed to ESD-induced diode failures.
• Determining whether additional ESD handling controls are required in manufacturing, storage or installation workflows.

Who Should Use This Standard

• PV module manufacturers and assembly engineers
• Semiconductor and diode suppliers for PV applications
• Test labs performing ESD immunity characterization
• Quality, reliability and production engineers in the solar industry

Related Standards

• IEC 61000-4-2 - Electromagnetic compatibility (EMC) - ESD immunity test (referenced for test generator and contact‑discharge method)
• IEC TS 62916 references IEC TS 61836 for terms/definitions used in PV standards

Keywords: IEC TS 62916, bypass diode, electrostatic discharge, ESD susceptibility testing, photovoltaic modules, Weibull distribution, surge voltage tolerance, IEC 61000-4-2, PV quality control.

Standards Content (Sample)

IEC TS 62916 ®
Edition 1.0 2017-04
TECHNICAL
SPECIFICATION
colour
inside
Photovoltaic modules – Bypass diode electrostatic discharge susceptibility
testing
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IEC TS 62916 ®
Edition 1.0 2017-04
TECHNICAL
SPECIFICATION
colour
inside
Photovoltaic modules – Bypass diode electrostatic discharge susceptibility

testing
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 27.160 ISBN 978-2-8322-4147-9

– 2 – IEC TS 62916:2017 © IEC 2017
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms, definitions and abbreviated terms . 5
4 General . 6
5 Sampling . 6
6 Test equipment . 7
7 Test method . 7
7.1 Preparation . 7
7.2 Surge testing . 8
8 Data analysis . 8
8.1 Two-parameter Weibull distribution for analyzing voltage to failure . 8
8.2 Recommended median rank estimation for the cumulative distribution . 9
8.3 Recommended form for data analysis by least squares linear regression . 9
9 Report . 10
Annex A (informative) Guidelines for application . 11
Annex B (informative) Example of application . 12

Figure 1 – Example of a test setup for bypass diodes . 7
Figure B.1 – Chart of sample data . 12

Table 1 – Data organization for least squares regression . 9
Table B.1 – Example of data analysis . 12

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
PHOTOVOLTAIC MODULES – BYPASS DIODE
ELECTROSTATIC DISCHARGE SUSCEPTIBILITY TESTING

FOREWORD
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Technical specifications are subject to review within three years of publication to decide
whether they can be transformed into International Standards.
IEC TS 62916, which is a technical specification, has been prepared by IEC technical
committee 82: Solar photovoltaic systems.

– 4 – IEC TS 62916:2017 © IEC 2017
The text of this technical specification is based on the following documents:
Enquiry draft Report on voting
82/1059/DTS 82/1259/RVDTS
Full information on the voting for the approval of this technical specification can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
The committee has decided that the contents of this publication will remain unchanged until
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• amended.
A bilingual version of this publication may be issued at a later date.

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PHOTOVOLTAIC MODULES – BYPASS DIODE
ELECTROSTATIC DISCHARGE SUSCEPTIBILITY TESTING

1 Scope
This document describes a discrete component bypass diode electrostatic discharge (ESD)
immunity test and data analysis method. The test method described subjects a bypass diode
to a progressive ESD stress test and the analysis method provides a means for analyzing and
extrapolating the resulting failures using the two-parameter Weibull distribution function.
It is the object of this document to establish a common and reproducible test method for
determining diode surge voltage tolerance consistent with an ESD event during the
manufacturing, packaging, transportation or installation processes of PV modules.
This document does not purport to address causes of electrostatic discharge or to establish
pass or fail levels for bypass diode devices. It is the responsibility of the user to assess the
ESD exposure level for their particular circumstances. The data generated by this procedure
may support qualification of new design types, quality control for incoming material, and/or
identify the need for additional ESD controls in the manufacturing process.
Finally, this document does not apply to large energy surge events such as direct or indirect
lightning exposure, utility capacitor bank switching events, or the like.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 61000-4-2:2008, Electromagnetic compatibility (EMC) – Part 4-2: Testing and
measurement techniques – Electrostatic discharge immunity test
3 Terms, definitions and abbreviated terms
For the purposes of this document, the terms and definitions of IEC TS 61836 and the
following apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
DUT
device under test
3.2
contact discharge method
method of testing in which the electrode of the test generator is kept in contact with the DUT
and the discharge is actuated by the discharge within the generator
...