IEC 62341-6-2:2015
(Main)Organic light emitting diode (OLED) displays - Part 6-2: Measuring methods of visual quality and ambient performance
Organic light emitting diode (OLED) displays - Part 6-2: Measuring methods of visual quality and ambient performance
IEC 62341-6-2:2015(E) specifies the standard measurement conditions and measurement methods for determining the visual quality and ambient performance of organic light emitting diode (OLED) display modules and panels. This document mainly applies to colour display modules. This edition includes the following significant technical changes with respect to the previous edition:
a) Contents of 7.4 are changed.
b) Contents and items of Annex C are changed.
c) Annex B is added.
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IEC 62341-6-2 ®
Edition 2.0 2015-12
INTERNATIONAL
STANDARD
colour
inside
Organic light emitting diode (OLED) displays –
Part 6-2: Measuring methods of visual quality and ambient performance
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IEC 62341-6-2 ®
Edition 2.0 2015-12
INTERNATIONAL
STANDARD
colour
inside
Organic light emitting diode (OLED) displays –
Part 6-2: Measuring methods of visual quality and ambient performance
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.260 ISBN 978-2-8322-3026-8
– 2 – IEC 62341-6-2:2015 © IEC 2015
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms, definitions and abbreviations . 7
3.1 Terms and definitions . 7
3.2 Abbreviations . 10
4 Structure of measuring equipment . 10
5 Standard measuring conditions . 10
5.1 Standard measuring environmental conditions . 10
5.2 Standard lighting conditions . 10
5.2.1 Dark-room conditions . 10
5.2.2 Ambient illumination conditions . 11
5.3 Standard setup conditions . 16
5.3.1 General . 16
5.3.2 Adjustment of OLED display modules . 16
5.3.3 Starting conditions of measurements . 16
5.3.4 Conditions of measuring equipment . 16
6 Visual inspection of static images . 17
6.1 General . 17
6.2 Classification of visible defects . 17
6.2.1 General . 17
6.2.2 Reference examples for subpixel defects . 17
6.2.3 Reference example for line defects . 19
6.2.4 Reference example for mura defects . 19
6.3 Visual inspection method and criteria . 20
6.3.1 Standard inspection conditions . 20
6.3.2 Standard inspection method . 21
6.3.3 Inspection criteria . 23
7 Electro-optical measuring methods under ambient illumination . 24
7.1 Reflection measurements . 24
7.1.1 Purpose . 24
7.1.2 Measuring conditions . 24
7.1.3 Measuring the hemispherical diffuse reflectance . 25
7.1.4 Measuring the reflectance factor for a directional light source . 26
7.2 Ambient contrast ratio . 28
7.2.1 Purpose . 28
7.2.2 Measuring conditions . 28
7.2.3 Measuring method . 28
7.3 Display daylight colour . 29
7.3.1 Purpose . 29
7.3.2 Measuring conditions . 29
7.3.3 Measuring method . 29
7.4 Daylight colour gamut volume . 30
7.4.1 Purpose . 30
7.4.2 Measuring conditions . 30
7.4.3 Measuring method . 31
7.4.4 Reporting . 32
Annex A (informative) Measuring relative photoluminescence contribution from
displays . 34
A.1 Purpose . 34
A.2 Measuring conditions . 34
A.3 Measuring the bi-spectral photoluminescence of the display . 34
A.4 Determining the relative PL contribution from the display . 34
Annex B (informative) Diagnostic for observing display luminance dependence from
ambient illumination . 37
B.1 Purpose . 37
B.2 Measuring method . 37
Annex C (informative) Calculation method of daylight colour gamut volume . 38
C.1 Purpose . 38
C.2 Procedure for calculating the colour gamut volume . 38
C.3 Surface subdivision method for CIELAB gamut volume calculation . 40
C.3.1 Purpose . 40
C.3.2 Assumptions . 40
C.3.3 Algorithm . 40
C.3.4 Software example execution . 40
Bibliography . 46
Figure 1 –Example of visual inspection room setup for control of ambient room lighting
and reflections . 11
Figure 2 –Example of measurement geometries for a uniform hemispherical diffuse
illumination condition using an integrating sphere and sampling sphere . 13
Figure 3 – Directional source measurement geometry using an isolated source . 15
Figure 4 – Directional source measurement geometry using a ring light source . 15
Figure 5 – Layout diagram of measurement setup . 16
Figure 6 – Classification of visible defects . 17
Figure 7 – Bright subpixel defects . 18
Figure 8 – Criteria for classifying bright and dark subpixel defects . 19
Figure 9 – Bright and dark line defects . 19
Figure 10 –Sample image of line mura . 20
Figure 11 – Example of spot mura . 20
Figure 12 – Setup condition for visual inspection of electro-optical visual defects . 22
Figure 13 – Shape of scratch and dent defect . 24
Figure 14 –Example of range in colours produced by a given display as represented
by the CIELAB colour space . 32
Figure A.1 – Scaled bi-spectral photoluminescence response from a display . 35
Figure A.2 – Decomposed bi-spectral photoluminescence response from a display . 35
Figure B.1 – Example of display luminance reduction caused by the high illuminance
from a high intensity LED flashlight directed at the display surface . 37
Figure C.1 – Analysis flow chart for calculating the colour gamut volume . 38
Figure C.2 – Graphical representation of the colour gamut volume for sRGB in the
CIELAB colour space . 39
Table 1 – Definitions for types of scratch and dent defects . 24
– 4 – IEC 62341-6-2:2015 © IEC 2015
Table 2 – Eigenvalues M and M for CIE daylight Illuminants D50 and D75 . 26
1 2
Table 3 – Example of minimum colours required for gamut volume calculation of a 3-
primary 8-bit display . 31
Table 4 – Measured tristimulus values for the minimum set of colours (see Table 3)
required for gamut volume calculation under the specified ambient illumination
condition .
...
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