IEC 60444-6:2013

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.

Mesure des paramètres des résonateurs à quartz - Partie 6: Mesure de la dépendance du niveau d'excitation (DNE)

La CEI 60444-6:2013 s'applique aux mesures de la dépendance du niveau d'excitation (DNE) des résonateurs à quartz. Deux méthodes d'essai et une méthode de référence sont décrites. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) La mesure de DNE avec le circuit oscillation utilisait la méthode traditionnelle de détection des modes anormaux DNE au temps présent. Donc, cette méthode fait la transition avec l'Annexe B.
b) La grande fiabilité de l'unité de cristal utilisé est nécessaire pour diverses applications actuelles, pour permettre de mettre à jour les capacités d'inspection des modes anormaux des DNE, la méthode de mesure de référence de multi-niveaux a été présentée dans cette spécification.

General Information

• Status: Published
• Publication Date: 18-Jun-2013
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection
• Drafting Committee: WG 11 - TC 49/WG 11
• Current Stage: DELPUB - Deleted Publication
• Start Date: 24-Apr-2020
• Completion Date: 01-Sep-2021

Relations

• Revised: IEC 60444-6:2021 - Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
• Effective Date: 05-Sep-2023

Standards Content (Sample)

IEC 60444-6 ®
Edition 2.0 2013-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Measurement of quartz crystal unit parameters –
Part 6: Measurement of drive level dependence (DLD)

Mesure des paramètres des résonateurs à quartz –
Partie 6: Mesure de la dépendance du niveau d'excitation (DNE)

All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from
either IEC or IEC's member National Committee in the country of the requester.
If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication,
please contact the address below or your local IEC member National Committee for further information.

Droits de reproduction réservés. Sauf indication contraire, aucune partie de cette publication ne peut être reproduite ni
utilisée sous quelque forme que ce soit et par aucun procédé, électronique ou mécanique, y compris la photocopie et les
microfilms, sans l'accord écrit de la CEI ou du Comité national de la CEI du pays du demandeur.
Si vous avez des questions sur le copyright de la CEI ou si vous désirez obtenir des droits supplémentaires sur cette
publication, utilisez les coordonnées ci-après ou contactez le Comité national de la CEI de votre pays de résidence.

IEC Central Office Tel.: [phone]
3, rue de Varembé Fax: [phone]
CH-1211 Geneva 20 [e-mail]
Switzerland www.iec.ch
About the IEC
The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes
International Standards for all electrical, electronic and related technologies.

About IEC publications
The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the
latest edition, a corrigenda or an amendment might have been published.

Useful links:
IEC publications search - www.iec.ch/searchpub Electropedia - www.electropedia.org
The advanced search enables you to find IEC publications The world's leading online dictionary of electronic and
by a variety of criteria (reference number, text, technical electrical terms containing more than 30 000 terms and
committee,…). definitions in English and French, with equivalent terms in
It also gives information on projects, replaced and additional languages. Also known as the International
withdrawn publications. Electrotechnical Vocabulary (IEV) on-line.

IEC Just Published - webstore.iec.ch/justpublished Customer Service Centre - webstore.iec.ch/csc
Stay up to date on all new IEC publications. Just Published If you wish to give us your feedback on this publication
details all new publications released. Available on-line and or need further assistance, please contact the
also once a month by email. Customer Service Centre: [e-mail].

A propos de la CEI
La Commission Electrotechnique Internationale (CEI) est la première organisation mondiale qui élabore et publie des
Normes internationales pour tout ce qui a trait à l'électricité, à l'électronique et aux technologies apparentées.

A propos des publications CEI
Le contenu technique des publications de la CEI est constamment revu. Veuillez vous assurer que vous possédez
l’édition la plus récente, un corrigendum ou amendement peut avoir été publié.

Liens utiles:
Recherche de publications CEI - www.iec.ch/searchpub Electropedia - www.electropedia.org
La recherche avancée vous permet de trouver des Le premier dictionnaire en ligne au monde de termes
publications CEI en utilisant différents critères (numéro de électroniques et électriques. Il contient plus de 30 000
référence, texte, comité d’études,…). termes et définitions en anglais et en français, ainsi que
Elle donne aussi des informations sur les projets et les les termes équivalents dans les langues additionnelles.
publications remplacées ou retirées. Egalement appelé Vocabulaire Electrotechnique
International (VEI) en ligne.
Just Published CEI - webstore.iec.ch/justpublished
Service Clients - webstore.iec.ch/csc
Restez informé sur les nouvelles publications de la CEI.
Just Published détaille les nouvelles publications parues. Si vous désirez nous donner des commentaires sur
Disponible en ligne et aussi une fois par mois par email. cette publication ou si vous avez des questions
contactez-nous: [e-mail].
IEC 60444-6 ®
Edition 2.0 2013-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Measurement of quartz crystal unit parameters –

Part 6: Measurement of drive level dependence (DLD)

Mesure des paramètres des résonateurs à quartz –

Partie 6: Mesure de la dépendance du niveau d'excitation (DNE)

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX R
ICS 31.140 ISBN 978-2-83220-876-2

– 2 – 60444-6  IEC:2013
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 DLD effects . 6
3.1 Reversible changes in frequency and resistance . 6
3.2 Irreversible changes in frequency and resistance . 6
3.3 Causes of DLD effects . 7
4 Drive levels for DLD measurement . 7
5 Test methods. 8
5.1 Method A (Fast standard measurement method) . 8
5.1.1 Testing at two drive levels . 8
5.1.2 Testing according to specification . 8
5.2 Method B (Multi-level reference measurement method) . 9
Annex A (normative) Relationship between electrical drive level and mechanical
displacement of quartz crystal units . 11
Annex B (normative) Method C: DLD measurement with oscillation circuit . 14
Bibliography . 19

Figure 1 – Maximum tolerable resistance ratio γ for the drive level dependence as a
function of the resistances R or R . 9
r2 r3
Figure B.1 – Insertion of a quartz crystal unit in an oscillator . 14
Figure B.2 – Crystal unit loss resistance as a function of dissipated power . 15
Figure B.3 – Behaviour of the R of a quartz crystal units . 16
r
Figure B.4 – Block diagram of circuit system . 16
Figure B.5 – Installed −R in scanned drive level range . 17
osc
Figure B.6 – Drive level behavior of a quartz crystal unit if −R = 70 Ω is used as
osc
test limit in the “Annex B” test . 17
Figure B.7 – Principal schematic diagram of the go/no-go test circuit . 18

60444-6  IEC:2013 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –

Part 6: Measurement of drive level dependence (DLD)

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-6 has been prepared by lEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This second edition cancels and replaces the first edition published in 1995. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD
abnormal modes at present time. Therefore, this method made the transition to the
Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in
order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level
reference measurement method was introduced into this specification.

– 4 – 60444-6  IEC:2013
The text of this standard is based on the following documents:
CDV Report on voting
49/1004/CDV 49/1038/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
A list of all parts in the IEC 60444 series, published under the general title Measurement of
quartz crystal unit parameters, can be found on the IEC website.

60444-6  IEC:2013 – 5 –
INTRODUCTION
The drive level (expressed as power/voltage across or current through the crystal unit) forces
the resonator to produce mechanical oscillations by way of piezoelectric effect. In this process,
the acceleration work is converted to kinetic and elastic energy and the power loss to heat.
The latter conversion is due to the inner and outer friction of the quartz resonator.
The frictional losses depend on the velocity of the vibrating masses and increase when the
oscillation is no longer linear or when critical velocities, elongations or strains, excursions or
accelerations are attained in the quartz resonator or at its surfaces and mounting points (see
Annex A). This causes changes in resistance and frequency, as well as further changes due
to the temperature dependence of these parameters.
At “high” drive levels (e.g. above 1 mW or 1 mA for AT-cut crystal units) changes are
observed by all crystal units and these al
...