ISO 6342:2003

Micrographics - Aperture cards - Method of measuring thickness of buildup area

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

Micrographie — Cartes à fenêtre — Méthode de mesurage de la zone de surépaisseur

General Information

• Status: Published
• Publication Date: 14-Jul-2003
• ICS: 37.080 - Document imaging applications
• Technical Committee: ISO/TC 171 - Document management applications
• Drafting Committee: ISO/TC 171 - Document management applications
• Current Stage: 9093 - International Standard confirmed
• Start Date: 12-Feb-2021
• Completion Date: 13-Dec-2025

Relations

• Revises: ISO 6342:1993 - Micrographics - Aperture cards - Method of measuring thickness of buildup area
• Effective Date: 15-Apr-2008

Overview

ISO 6342:2003 specifies a standardized method for measuring the thickness of the buildup area on aperture cards (camera and copy cards) used in micrographics. The method is intended for manufacturing and inspection purposes to ensure consistent physical characteristics of aperture cards used in microfilm and document-imaging systems.

Key topics and technical requirements

• Scope: Measurement method for the buildup area thickness on aperture cards.
• Apparatus: Use dead-weight dial micrometers (motor- or manually operated). The motor-operated micrometer is preferred.
  • Pressure foot: circular, diameter 16 mm ± 0.5 mm; moves perpendicular to anvil.
  • Loading: pressure foot shall exert 50 kPa ± 5 kPa (based on foot area).
  • Lowering speed (motor): approximately 0.8 mm/s.
• Micrometer performance (values per ISO 534 equivalents):
  • Indication error: 2.5 µm or 0.5%
  • Error of parallelism: 5 µm or 1%
  • Repeatability (standard deviation): 2.5 µm or 0.5%
• Conditioning and testing atmosphere:
  • Samples loosely assembled and conditioned for at least 6 hours.
  • Test conditions: 23 °C ± 1 °C and relative humidity 50% ± 2%.
• Measurement procedure:
  • If manual micrometer: either lower to within 0.0075 mm then release, or lower at a controlled velocity between 0.8 mm/s and 12 mm/s.
  • Maintain dead-weight loading for at least 2 s per measurement.
  • Card thickness: at least four measurements away from card and buildup edges (≥ 6.35 mm); take the greatest value as card thickness.
  • Buildup-area thickness: at least four measurements, one on each side of the buildup rectangle; centre pressure foot across the width; take the greatest value as buildup-area thickness.
  • Buildup thickness = buildup-area thickness − card thickness.
• Centring guidance: Annex A provides clarifications for centring the pressure foot on different unitised microfilm-carrier constructions.

Applications and users

• Useful for aperture card manufacturers, micrographics equipment suppliers, and quality control/inspection laboratories.
• Relevant to archives, records management, and organizations using microfilm carriers where physical conformity and reliable card handling are important.
• Helps ensure consistent performance in document imaging, preservation, and automated handling systems.

Related standards

• ISO 534:1988 - Paper and board: determination of thickness (referenced for micrometer characteristics)
• ISO 6196-1:1993 - Micrographics vocabulary (general terms)
• ISO 6196-4:1998 - Micrographics vocabulary (materials and packaging)

Keywords: ISO 6342:2003, aperture cards, micrographics, buildup area thickness, micrometer measurement, card inspection, document imaging.

Standards Content (Sample)

INTERNATIONAL ISO
STANDARD 6342
Second edition
2003-07-01
Micrographics — Aperture cards —
Method of measuring thickness of buildup
area
Micrographie — Cartes à fenêtre — Méthode de mesurage de la zone
de surépaisseur
Reference number
©
ISO 2003
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©
ii ISO 2003 – All rights reserved

Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
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Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 6342 was prepared by Technical Committee ISO/TC 171, Document imaging applications, Subcommittee
SC 2, Application issues.
This second edition cancels and replaces the first edition (ISO 6342:1993), which has been technically revised.
©
ISO 2003 – All rights reserved iii

Introduction
Aperture cards are widely used in many microfilm systems. As the various kinds differ in the thickness of the
buildup area, a method of measuring the buildup thickness is necessary.
©
iv ISO 2003 – All rights reserved

INTERNATIONAL STANDARD ISO 6342:2003(E)
Micrographics — Aperture cards — Method of measuring
thickness of buildup area
1Scope
This International Standard specifies a method of measuring the thickness of the buildup area on aperture
cards (camera and copy cards) for manufacturing and inspection purposes.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced docum
...