ISO 6342:2003

Micrographics — Aperture cards — Method of measuring thickness of buildup area

ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.

Micrographie — Cartes à fenêtre — Méthode de mesurage de la zone de surépaisseur

General Information

• Status: Published
• Publication Date: 14-Jul-2003
• ICS: 37.080 - Document imaging applications
• Technical Committee: ISO/TC 171 - Document management applications
• Drafting Committee: ISO/TC 171 - Document management applications
• Current Stage: 9093 - International Standard confirmed
• Completion Date: 12-Feb-2021

Relations

• Revises: ISO 6342:1993 - Micrographics — Aperture cards — Method of measuring thickness of buildup area
• Effective Date: 15-Apr-2008

Standards Content (Sample)

INTERNATIONAL ISO
STANDARD 6342
Second edition
2003-07-01
Micrographics — Aperture cards —
Method of measuring thickness of buildup
area
Micrographie — Cartes à fenêtre — Méthode de mesurage de la zone
de surépaisseur

Reference number
ISO 6342:2003(E)
©
ISO 2003

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ISO 6342:2003(E)
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©
ii ISO 2003 – All rights reserved

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ISO 6342:2003(E)
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies
(ISO member bodies). The work of preparing International Standards is normally carried out through ISO
technical committees. Each member body interested in a subject for which a technical committee has been
established has the right to be represented on that committee. International organizations, governmental and
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Electrotechnical Commission (IEC) on all matters of electrotechnical standardization.
International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2.
The main task of technical committees is to prepare International Standards. Draft International Standards
adopted by the technical committees are circulated to the member bodies for voting. Publication as an
International Standard requires approval by at least 75 % of the member bodies casting a vote.
Attention is drawn to the possibility that some of the elements of this document may be the subject of patent
rights. ISO shall not be held responsible for identifying any or all such patent rights.
ISO 6342 was prepared by Technical Committee ISO/TC 171, Document imaging applications, Subcommittee
SC 2, Application issues.
This second edition cancels and replaces the first edition (ISO 6342:1993), which has been technically revised.
©
ISO 2003 – All rights reserved iii

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ISO 6342:2003(E)
Introduction
Aperture cards are widely used in many microfilm systems. As the various kinds differ in the thickness of the
buildup area, a method of measuring the buildup thickness is necessary.
©
iv ISO 2003 – All rights reserved

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INTERNATIONAL STANDARD ISO 6342:2003(E)
Micrographics — Aperture cards — Method of measuring
thickness of buildup area
1Scope
This International Standard specifies a method of measuring the thickness of the buildup area on aperture
cards (camera and copy cards) for manufacturing and inspection purposes.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated
references, only the edition cited applies. For undated references, the latest edition of the referenced docum
...