Fine ceramics (advanced ceramics, advanced technical ceramics) — Measurement method of piezoelectric strain at high electric field

ISO 17859:2015 specifies the measurement method of piezoelectric strain at high electric field for high power piezoelectric devices. ISO 17859:2015 is intended to be used to determine the piezoelectric strain coefficient of the materials by measuring strain vs. electric field: ? applied electric field: 0 to 2 MV/m; ? frequency of electric field: 0,1 to 1 Hz.

Céramiques techniques — Méthode de mesurage de la contrainte piézoélectrique à champ électrique élevé

General Information

Status
Published
Publication Date
31-Aug-2015
Current Stage
9093 - International Standard confirmed
Completion Date
21-Dec-2020
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ISO 17859:2015 - Fine ceramics (advanced ceramics, advanced technical ceramics) -- Measurement method of piezoelectric strain at high electric field
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INTERNATIONAL ISO
STANDARD 17859
First edition
2015-09-01
Fine ceramics (advanced ceramics,
advanced technical ceramics) —
Measurement method of piezoelectric
strain at high electric field
Céramiques techniques — Méthode de mesurage de la contrainte
piézoélectrique à champ électrique élevé
Reference number
ISO 17859:2015(E)
©
ISO 2015

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ISO 17859:2015(E)

COPYRIGHT PROTECTED DOCUMENT
© ISO 2015, Published in Switzerland
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized otherwise in any form
or by any means, electronic or mechanical, including photocopying, or posting on the internet or an intranet, without prior
written permission. Permission can be requested from either ISO at the address below or ISO’s member body in the country of
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copyright@iso.org
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ii © ISO 2015 – All rights reserved

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ISO 17859:2015(E)

Contents Page
Foreword .iv
1 Scope . 1
2 Normative references . 1
3 Terms and definitions, and symbols . 1
3.1 Terms and definitions . 1
3.2 Symbols . 2
4 Measuring environment . 2
5 Specimens . 2
5.1 General . 2
5.2 Shape and size . 3
5.3 Electrodes . 3
5.4 Polarization . 3
6 Principle . 3
7 Measurement equipment . 3
7.1 Equipment . 3
7.2 Components of equipment . 4
7.3 Environment of specimen holder . 5
7.4 Calibration of measurement equipment . 5
8 Measurement conditions . 5
9 Measurement procedures . 5
10 Calculations and results . 6
11 Test report . 6
Annex A (informative) Example of reference sample . 8
© ISO 2015 – All rights reserved iii

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ISO 17859:2015(E)

Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www.iso.org/directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www.iso.org/patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation on the meaning of ISO specific terms and expressions related to conformity
assessment, as well as information about ISO’s adherence to the WTO principles in the Technical
Barriers to Trade (TBT) see the following URL: Foreword - Supplementary information
The committee responsible for this document is ISO/TC 206, Fine ceramics.
iv © ISO 2015 – All rights reserved

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INTERNATIONAL STANDARD ISO 17859:2015(E)
Fine ceramics (advanced ceramics, advanced technical
ceramics) — Measurement method of piezoelectric strain
at high electric field
1 Scope
This International Standard specifies the measurement method of piezoelectric strain at high electric
field for high power piezoelectric devices. This International Standard is intended to be used to
determine the piezoelectric strain coefficient of the materials by measuring strain vs. electric field:
— applied electric field: 0 to 2 MV/m;
— frequency of electric field: 0,1 to 1 Hz.
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
IEC 60122-1, Quartz crystal units of assessed quality — Part 1: Generic specification
IEC 60483, Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
EN 50324-1, Piezoelectric properties of ceramic materials and components — Part 1: Terms and definitions
EN 50324-2, Piezoelectric properties of ceramic materials and components — Part 2: Method of
measurement — Low power
3 Terms and definitions, and symbols
3.1 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60122-1, IEC 60483, EN 50324-
1, EN 50324-2 and the following apply.
3.1.1
applied wave form
shape of voltage applied to specimen as a function of time
Note 1 to entry: Triangular waves are used in this International Standard.
3.1.2
signal generator
apparatus which controls the applied wave form
3.1.3
power source
high-voltage amplifier which generates an electric-field (E-field) applied to the specimen
© ISO 2015 – All rights reserved 1

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ISO 17859:2015(E)

3.1.4
E-field induced strain
strain of the specimen which is induced by applying the E-field
Note 1 to entry: The value is given by the ratio of displacement to specimen thickness.
3.1.5
displacement m
...

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