SIST EN 60444-1:2002/A1:2002

• Abstract:

  EN following parallel vote - D114/118: CLC/TC 49 disbanded

• Status: Published
• Publication Date: 31-Aug-2002
• ICS: 31.140 - Piezoelectric devices
• Technical Committee: SS EIT - Technical Board for the electrotechnical, information technology and telecommunications fields
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 01-Sep-2002
• Due Date: 01-Sep-2002
• Completion Date: 01-Sep-2002
• Ref Project: EN 60444-1:1997/A1:1999 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

• Referred By: SIST EN IEC 60444-11:2026 - Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction (IEC 60444-11:2026)
• Effective Date: 19-May-2026
• Amends: SIST EN 60444-1:2002 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
• Effective Date: 21-Sep-2010

SIST EN 60444-1:2002/A1:2002 is the SIST publication of an amendment to the IEC method for measuring quartz crystal unit parameters by the zero phase technique in a π-network. It updates the basic method for measuring resonance frequency and resonance resistance of quartz crystal units, with revised calibration and calculation relations for practical use in test and production environments.

What does SIST EN 60444-1:2002/A1:2002 specify?

SIST EN 60444-1:2002/A1:2002 amends the basic π-network zero phase method for quartz crystal unit measurements. The amendment focuses on how to calculate results from the measurement set-up, especially when using a 25 Ω reference resistor for calibration.

Annex	What it covers
Annex B	Updating of some formulae of appendix A, including calibration, voltage-transfer relations, error analysis, crystal current, drive level, and phase-slope relations

The document is organized as an amendment text with a foreword, a contents update, and Annex B. Annex B is normative and ties back to Appendix A of the base document.

What are the key requirements of SIST EN 60444-1:2002/A1:2002?

The amendment changes the calculation basis for the measurement method and adds updated formulas that fit the actual calibration arrangement used with the π-network.

Calibration and voltage-transfer calculation

Annex B explains that the calibration procedure uses a reference resistor of 25 Ω instead of a short. It derives the voltage-transfer factor for the terminated π-network and shows how the transfer behaves as a product of network-related and crystal-related terms. In practice, this gives the equations needed to convert measured voltages into crystal impedance values.

Measurement arrangement

Annex B.2 describes the terminated π-network with Z = 50 Ω and the power splitter arrangement referenced in figure 5a. This matters because the formulas in the annex assume that exact measurement topology, so the set-up and the calculation method must match.

Resonance resistance from measured voltages

Annex B.4 gives the calibration relation for a reference resistor inserted in the π-network and the corresponding relation for a crystal inserted in the same network. From these relations, the amendment derives the equation used to calculate the crystal impedance, and at resonance this becomes the resonance resistance used in clause 6.2.2.7. For users, this is the key working equation for converting measured channel voltages into the resistance value at resonance.

Error analysis

Annex B.5 adds an error analysis for resonance resistance. It takes into account measuring deviations in the r.f. voltage channels, the deviation of the reference resistor from nominal value, and the deviation of the termination resistance from nominal value. In practice, this is the part that supports uncertainty evaluation and helps users judge how sensitive the result is to resistor tolerances and voltage measurement errors.

Crystal current and drive level

Annex B.6 gives the crystal current at resonance and the corresponding drive level in the π-network. It applies the measurement set-up with the 25 Ω reference resistor and shows how to calculate current and drive power from the measured voltages. This matters when the crystal must be tested without exceeding a specified drive condition.

Phase slope and Qeff

Annex B.7 derives the phase slope of the crystal inserted in the π-network and gives the corrected relation for the effective quality factor, Qeff. The text states that the formula for Qeff in Appendix A is incorrect and is replaced by the annex formula. This is important when phase change near resonance is used to evaluate crystal behavior.

What terms does SIST EN 60444-1:2002/A1:2002 define?

• Resonance frequency - the frequency at which the crystal impedance is equal to the resonance resistance.
• Resonance resistance - the crystal resistance value at resonance, which is the main output of the method.
• Reference resistor - the resistor inserted into the π-network during calibration, used here as 25 Ω.
• Termination resistance (RT) - the resistance at the output of the π-network as seen by the crystal.
• Drive level - the power dissipated in the crystal, calculated from crystal current and resistance.
• Effective quality factor (Qeff) - the crystal quality factor loaded by the termination impedance of the π-network.
• Zero phase technique - the measurement method used in the π-network to determine crystal parameters from phase and voltage relations.

Who uses SIST EN 60444-1:2002/A1:2002?

This amendment is used by engineers and test laboratories that measure quartz crystal unit parameters, especially in frequency control and selection applications. It is relevant to crystal manufacturers, component test engineers, quality managers, and buyers who need a defined method for checking resonance frequency, resonance resistance, drive level, and related measurement uncertainty. It also fits organizations working with piezoelectric and dielectric devices.

What changed in SIST EN 60444-1:2002/A1:2002 from the previous edition?

SIST EN 60444-1:2002/A1:2002 updates the base method by:

• replacing the short-based calibration assumption with a 25 Ω reference resistor in the updated calibration procedure
• adding a more general voltage-transfer derivation for the terminated π-network
• including the error contribution of the reference resistor in the resonance-resistance error analysis
• adding equations for crystal current and drive level in the π-network
• correcting the phase-slope relation and the formula for Qeff
• adding Annex B to update formulae from Appendix A

Which standards are used with SIST EN 60444-1:2002/A1:2002?

• IEC 61080:1991 - cited in Annex B.7 as the guide for measuring equivalent electrical parameters of quartz crystal units, used in the narrow-band approximation near resonance.
• IEC 60444-1 - the base part of the quartz crystal measurement method that this amendment updates.

What does the SIST EN 60444-1:2002/A1:2002 document contain?

Annex B contains the technical updates to the measurement method. It includes derivations for the voltage transfer factor of the terminated π-network, the calibration relations for the 25 Ω reference resistor, and the equation used to obtain crystal impedance and resonance resistance from measured voltages.

The annex also contains the error analysis for resonance resistance, along with formulas for crystal current and drive level. A further section derives the phase slope of the crystal in the π-network and the corrected Qeff relation near resonance. Figure B.1 shows the terminated π-network used in the derivation, and the annex refers to the power splitter arrangement in figure 5a of the base document.

SLOVENSKI STANDARD
01-september-2002
Measurement of quartz crystal unit parameters by zero phase technique in a pi-
network - Part 1: Basic method for the measurement of resonance frequency and
resonance resistance of quartz crystal units by zero phase technique in a pi-
network - Amendment A1 (IEC 60444-1:1986/A1:1999)
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -
- Part 1: Basic method for the measurement of resonance frequency and resonance
resistance of quartz crystal units by zero phase technique in a pi-network
Messung von Schwingquarz-Parametern nach dem Null-Phasenverfahren in einem Pi-
Netzwerk -- Teil 1: Verfahren zur Messung der Resonanzfrequenz und des
Resonanzwiderstandes von Schwingquarzen nach dem Null-Phasenverfahren in einem
Pi-Netzwerk
Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle
dans le circuit en pi -- Partie 1: Méthode fondamentale pour la mesure de la fréquence
de résonance et de la résistance de résonance des quartz piézoélectriques par la
technique de phase nulle dans le circuit en pi
Ta slovenski standard je istoveten z: EN 60444-1:1997/A1:1999
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

NORME CEI
INTERNATIONALE IEC
60444-1
INTERNATIONAL
STANDARD
AMENDEMENT 1
AMENDMENT 1
1999-08
Amendement 1
Mesure des paramètres des quartz
piézoélectriques par la technique de phase nulle
dans le circuit en pi –
Partie 1:
Méthode fondamentale pour la mesure de la
fréquence de résonance et de la résistance de
résonance des quartz piézoélectriques par la
technique de phase nulle dans le circuit en pi
Amendment 1
Measurement of quartz crystal unit parameters
by zero phase technique in a pi-network –
Part 1:
Basic method for the measurement of resonance
frequency and resonance resistance of quartz
crystal units by zero phase technique in
a pi-network
 IEC 1999 Droits de reproduction réservés  Copyright - all rights reserved
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: [phone] e-mail: [e-mail] IEC web site http://www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
H
PRICE CODE
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue

60444-1 Amend. 1 © IEC:1999 – 3 –
FOREWORD
This amendment has been prepared by IEC technical committee 49: Piezoelectric and
dielectric devices for frequency control and selection.
The text of this amendment is based on the following documents:
FDIS Report on voting
49/442/FDIS 49/445/RVD
Full information on the voting for the approval of this amendment can be found in the report on
voting indicated above.
___________
Page 3
CONTENTS
Add the title of annex B as follows:
Annex B – Updating of some formulae of appendix A
Page 43
Add, after appendix A, the new annex B as follows:
Annex B
(normative)
Updating of some formulae of appendix A
B.1 Purposes
In this annex some formulae of the appendix A are updated, taking into account the modified
calibration procedure of the π-network with a reference resistor R = 25 Ω instead of a short.
n
The formula relating R to the measured voltages is derived for arbitrary values of the
r
reference resistor R . The error of R is taken into account in the error analysis for R .
n n r
The formula for current and drive level of the crystal in the π-network is given. The phase slope
of the crystal inserted in the π-network is derived and the formula for Q is corrected.
eff
60444-1 Amend. 1 © IEC:1999 – 5 –
B.2 The -network terminated by Z = 50 (with power splitter according to
π Ω
figure 5a)
Power splitter
(see figure 5a)
Z
c
R R
Z 4
Z
Z
R R R
3 5 6 Z
R V
B
Z
V
V
AA V V
V AAV
B0
IEC  1019/99
Figure B.1 – Terminated π-network
B.3 Voltage transfer factor of the terminated π-network
In the following an elementary derivation of the voltage transfer factor is presented to provide a
more comprehensive formula.
−1
 
1 1
′
 
= = +
Let R R Z
6 6
 
R Z
 6 
′
V R
B 6
= = =
Then k 0,3649 (B.1)
π
′ ′
V R + R
B 6 7
−1
 
1 1
′ ′  
 
Define = + = + = = 12,5 Ω
R R  R R  R
5 5 6 7 T2
 ′ 
 
R
R + R
 6 7 
where R is the termination resistance at the output of the π-network as seen by the crystal.
T2
′ ′
R
V
B 5
=
Then (B.2)
′′′ ′
V R + Z
A
5 c
−1
 
′ ′ 1 1
 
 
Define R = R R + Z = +
 
3 3 5 c
 
  ′
R
+
R Z
 5 c 
′
′′′
V R
A 3
Then = (B.3)
″ ′
V R + R
A 3 4
60444-1 Amend. 1 © IEC:1999 – 7 –
−1
 
1 1
′ ′
   
Define R = R R + R  = +
2 2 3 4
 
  ′
R
2 R + R
 3 4 
Then, for a power splitter according to figure 5a and disregarding the cables:
″ ′
V R
A 2
= (B.4)
′ ′
...