SIST EN 62754:2017

Computation of waveform parameter uncertainties (IEC 62754:2017)

IEC 62754:2017 This document specifies methods for the computation of the temporal and amplitude parameters and their associated uncertainty for step-like and impulse-like waveforms. This document is applicable to any and all industries that generate, transmit, detect, receive, measure, and/or analyse these types of pulses.

Berechnung der Messunsicherheiten von Schwingungsabbildparametern (IEC 62754:2017)

Calcul des incertitudes des paramètres des formes d'onde (IEC 62754:2017)

L'IEC 62754:2017 Le présent document spécifie les méthodes de calcul des paramètres temporels et d'amplitude des formes d'onde échelonnées et de type impulsion, ainsi que leurs incertitudes associées. Le présent document concerne tous les secteurs industriels qui génèrent, transmettent, détectent, reçoivent, mesurent et/ou analysent ces types d'impulsions.

Izračun negotovosti parametrov valovne oblike (IEC 62754:2017)

IEC 62754:2017: Ta dokument določa metode za izračun časovnih in amplitudnih parametrov ter njihove povezane negotovosti intervalnih ali impulznih valovnih oblik. Ta dokument se uporablja za vse industrije, ki ustvarjajo, prenašajo, zaznavajo, sprejemajo, merijo in/ali analizirajo takšne vrste pulzov.

General Information

• Status: Published
• Publication Date: 22-Nov-2017
• ICS: 17.220.20 - Measurement of electrical and magnetic quantities
• Technical Committee: MOV - Measuring equipment for electromagnetic quantities
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 08-Sep-2017
• Due Date: 13-Nov-2017
• Completion Date: 23-Nov-2017
• Ref Project: EN 62754:2017 - Computation of waveform Parameter uncertainties

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 62754:2017
01-december-2017
,]UDþXQQHJRWRYRVWLSDUDPHWURYYDORYQHREOLNH,(&
Computation of waveform parameter uncertainties (IEC 62754:2017)
Berechnung der Messunsicherheiten von Schwingungsabbildparametern (IEC
62754:2017)
Calcul des incertitudes des paramètres des formes d'onde (IEC 62754:2017)
Ta slovenski standard je istoveten z: EN 62754:2017
ICS:
17.220.20 0HUMHQMHHOHNWULþQLKLQ Measurement of electrical
PDJQHWQLKYHOLþLQ and magnetic quantities
SIST EN 62754:2017 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 62754:2017

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SIST EN 62754:2017


EUROPEAN STANDARD EN 62754

NORME EUROPÉENNE

EUROPÄISCHE NORM
September 2017
ICS 17.220.20

English Version
Computation of waveform Parameter uncertainties
(IEC 62754:2017)
Calcul des incertitudes des paramètres des formes d'onde Berechnung der Messunsicherheiten von
(IEC 62754:2017) Schwingungsabbildparametern
(IEC 62754:2017)
This European Standard was approved by CENELEC on 2017-06-28. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,
Switzerland, Turkey and the United Kingdom.



European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2017 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
 Ref. No. EN 62754:2017 E

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SIST EN 62754:2017
EN 62754:2017
European foreword
The text of document 85/585/FDIS, future edition 1 of IEC 62754, prepared by IEC/TC 85 "Measuring
equipment for electrical and electromagnetic quantities" was submitted to the IEC-CENELEC parallel
vote and approved by CENELEC as EN 62754:2017.
The following dates are fixed:
(dop) 2018-03-28
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
(dow) 2020-06-28
• latest date by which the national
standards conflicting with the
document have to be withdrawn

Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 62754:2017 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standard indicated :
IEC 60359:2001 NOTE Harmonized as EN 60359:2002.

2

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SIST EN 62754:2017
- EN 62754:2017

Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60469 2013 Transitions, pulses and related waveforms EN 60469 2013
- Terms, definitions and algorithms

3

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SIST EN 62754:2017




IEC 62754

®


Edition 1.0 2017-05




INTERNATIONAL



STANDARD




NORME



INTERNATIONALE
colour

inside










Computation of waveform parameter uncertainties



Calcul des incertitudes des paramètres des formes d'onde



















INTERNATIONAL

ELECTROTECHNICAL

COMMISSION


COMMISSION

ELECTROTECHNIQUE


INTERNATIONALE




ICS 17.220.20 ISBN 978-2-8322-4345-9



Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale

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CONTENTS
FOREWORD . 4
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
4 Waveform measurement . 16
4.1 General . 16
4.2 Waveform parameters . 17
4.3 Waveform measurement process . 17
4.3.1 General . 17
4.3.2 General description of the measurement system . 18
5 Waveform and waveform parameter corrections . 19
5.1 General . 19
5.2 Waveform parameter corrections . 19
5.3 Waveform corrections and waveform reconstruction. 20
5.3.1 General . 20
5.3.2 Sample-by-sample correction . 20
5.3.3 Entire waveform correction . 20
6 Uncertainties . 22
6.1 General . 22
6.2 Propagation of uncertainties . 22
6.2.1 General . 22
6.2.2 Uncorrelated input quantities . 23
6.2.3 Correlated input quantities . 23
6.3 Pooled data and its standard deviation. 23
6.4 Expanded uncertainty and coverage factor. 25
6.4.1 General . 25
6.4.2 Effective degrees of freedom . 27
6.5 Entire waveform uncertainties . 28
7 Waveform parameter uncertainties . 29
7.1 General . 29
7.2 Amplitude parameters . 30
7.2.1 State levels. 30
7.2.2 State boundaries . 35
7.2.3 Waveform amplitude (state levels) . 36
7.2.4 Impulse amplitude (state levels) . 37
7.2.5 Percent reference levels (state levels, waveform amplitude) . 37
7.2.6 Transition settling error (state levels, waveform amplitude) . 38
7.2.7 Overshoot aberration (state levels, waveform amplitude) . 38
7.2.8 Undershoot aberration (state levels, waveform amplitude) . 39
7.3 Temporal parameters . 39
7.3.1 Initial instant . 39
7.3.2 Waveform epoch . 40
7.3.3 Reference level instants (percent reference levels, waveform epoch,
initial instant) . 41
7.3.4 Impulse centre instant (impulse amplitude, reference level instants) . 42
7.3.5 Transition duration (reference level instants) . 42

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7.3.6 Transition settling duration (reference level instants) . 43
7.3.7 Pulse duration (reference level instants) . 43
7.3.8 Pulse separation (reference level instants) . 43
7.3.9 Waveform delay (advance) (reference level instants) . 44
8 Monte Carlo method for waveform parameter uncertainty estimates . 44
8.1 General guidance and considerations . 44
8.2 Example: state level . 44
Annex A (informative) Demonstration example for the calculation of the uncertainty of
state levels using the histogram mode according to 7.2.1.2. 46
A.1 Waveform measurement . 46
A.2 Splitting the bimodal histogram and determining the state levels . 46
A.3 Uncertainty of state levels . 47
Annex B (informative) Computation of Σ andΣ for estimating the uncertainty of
L Y
state levels using the shorth method according to 7.2.1.3 . 49
Bibliography . 52

Figure 1 – Reference levels, reference level instants, waveform amplitude, and
transition duration for a single positive-going transition . 7
Figure 2 – Overshoot, undershoot, state levels, and state boundaries for a single
positive-going transition . 11
Figure 3 – Creation of measured, corrected, and reconstructed waveforms and the
final estimate of the input signal . 17
Figure 4 – Example of waveform bounds focusing on the trajectories that impact pulse
parameter measurements . 28
Figure 5 – Relationship between selected waveform parameters . 30
Figure A.1 – Waveform obtained from the measurement of a step-like signal from
which the state levels and uncertainties are calculated . 46
Figure A.2 – Histograms of state s1 (a) and state s2 (b) of the step-like waveform
plotted in Figure A.1 . 47
(α)
Figure B.1 – Diagram showing location of waveform elements, y , in Y and Y , and
(β) 1 2
the construction of Y from Y and Y . 49
1 2

Table 1 – Value of the coverage factor k that encompasses the fraction p of the t -
p
distribution for different degrees of freedom (from ISO/IEC Guide 98-3) . 26
Table 2 – Different methods for determining state levels, as given in IEC 60469, and
their uncertainty type and method of computation . 31
Table 3 – Different methods for determining state boundaries and their uncertainty type
and method of computation . 36
Table 4 – Variables contributing to the uncertainty in overshoot . 39
Table 5 – Variables contributing to the uncertainty in the reference level instant . 42
Table A.1 – Uncertainty contributions and total uncertainty for level(s ) determined from
i
histogram modes . 48

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INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________

COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62754 has been prepared by IEC technical committee 85:
Measuring equipment for electrical and electromagnetic quantities.
The text of this International Standard is based on the following documents:
FDIS Report on voting
85/585/FDIS 85/X588/RVD

Full information on the voting for the approval of this International Standard can be found in
the report on voting indicated in the above table.
This document has been drafted in accordance with the ISO/IEC Directives, Part 2.
The terms used throughout this document which have been defined in Clause 3 are in italic
type.

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SIST EN 62754:2017
IEC 62754:2017  IEC 2017 – 5 –
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under "http://webstore.iec.ch" in the data related to
the specific document. At this date, the document will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates
that it contains colours which are considered to be useful for the correct
understanding of its contents. Users should therefore print this document using a
colour printer.

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COMPUTATION OF WAVEFORM PARAMETER UNCERTAINTIES



1 Scope
This document specifies methods for the computation of the temporal and amplitude
parameters and their associated uncertainty for step-like and impulse-like waveforms. This
document is applicable to any and all industries that generate, transmit, detect, receive,
measure, and/or analyse these types of pulses.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their
content constitutes requirements of this document. For dated references, only the edition
cited applies. For undated references, the latest edition of the referenced document (including
any amendments) applies.
IEC 60469:2013, Transitions, pulses and related waveforms – Terms, definitions and
algorithms
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following
addresses:
• IEC Electropedia: available at http://www.electropedia.org/
• ISO Online browsing platform: available at http://www.iso.org/obp
3.1
aberration region
3.1.1
post-transition aberration region
interval between a user-specified instant and a fixed instant, where the fixed instant is the first
sampling instant succeeding the 50 % reference level instant for which the corresponding
waveform value is within the state boundaries of the state succeeding the 50 % reference
level instant
[SOURCE: IEC 60469:2013, 3.2.1.1, modified – the note 1 to entry has been deleted.]
3.1.2
pre-transition aberration region
interval between a user-specified instant and a fixed instant, where the fixed instant is the first
sampling instant preceding the 50 % reference level instant for which the corresponding
waveform value is within the state boundaries of the state preceding the 50 % reference level
instant
[SOURCE: IEC 60469:2013, 3.2.1.2, modified – the note 1 to entry has been deleted.]

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3.2
amplitude
3.2.1
impulse amplitude
difference between the specified level corresponding to the maximum peak (minimum peak) of
the positive (negative) impulse-like waveform and the level of the state preceding the first
transition of that impulse-like waveform
[SOURCE: IEC 60469:2013, 3.2.3.1]
3.2.2
waveform amplitude
difference between the levels of two different states of a waveform
SEE Figure 1.
50 % reference level instant
10 % reference level instant 90 % reference level instant
90 % reference level
S
2
50 % reference level
10 % reference level
S
1
Transition occurrence instant
Transition duration
Base state
Waveform epoch
t
0
IEC

Figure 1 – Reference levels, reference level instants, waveform amplitude, and
transition duration for a single positive-going transition
[SOURCE: IEC 60469:2013, 3.2.3.2, modified – the Note 1 to entry has been deleted and the
reference to Figure 1 has been added.]
3.3
correction
operation that combines the results of the conversion operation with the transfer function
information to yield a waveform that is a more accurate representation of the signal
Note 1 to entry Correction may be effected by a manual process by an operator, a computational process, or a
compensating device or apparatus. Correction shall be performed to an accuracy that is consistent with the overall
accuracy desired in the waveform measurement process.
[SOURCE: IEC 60469:2013, 3.2.4]
Waveform amplitude
Offsett

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3.4
coverage factor
numerical factor used as a multiplier of the combined standard uncertainty in order to obtain
an expanded uncertainty
Note 1 to entry: A coverage factor, k, is typically in the range 2 to 3.
Note 2 to entry: Coverage factor is also defined as a “number larger than or equal to one by which a combined
standard measurement uncertainty is multiplied to obtain an expanded measurement uncertainty,” (See ISO/IEC
Guide 99:2007, 2.38).
[SOURCE: ISO/IEC Guide 98-3:2008, 2.3.6, modified – the Note 2 to entry has been added.]
3.5
degrees of freedom
in general, the number of terms in a sum minus the number of constraints on the terms of the
sum
[SOURCE: ISO/IEC Guide 98-3:2008, C.2.31]
3.6
impulse response
output signal from an instrument, device, or system that is the result of an input signal, where
this input signal can be described by a unit impulse function, δ(t):
δ(t= 0) = 1
 (1)
δ(t≠ 0) = 0
3.7
instant
particular time value within a waveform epoch that, unless otherwise specified, is referenced
relative to the initial instant of that waveform epoch
[SOURCE: IEC 60469:2013, 3.2.13]
3.7.1
initial instant
first sample instant in the waveform
[SOURCE: IEC 60469:2013, 3.2.13.3]
3.7.2
impulse center instant
instant at which a user-specified approximation to the maximum peak (minimum peak) of the
positive (negative) impulse-like waveform occurs
[SOURCE: IEC 60496:2013, 3.2.13.2]
3.7.3
reference level instant
instant at which the waveform intersects a specified reference level
SEE Figure 1.
[SOURCE: IEC 60469:2013, 3.2.13.5, modified – the reference to Figure 1 has been added.]

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3.8
interval
set of all values of time between a first instant and a second instant, where the second instant
is later in time than the first
Note 1 to entry: These first and second instants are called the endpoints of the interval. The endpoints, unless
otherwise specified, are assumed to be part of the interval.
[SOURCE: IEC 60469:2013, 3.2.15]
3.9
level
constant value having the same units as y
SEE Figure 1.
Note 1 to entry: y is the signal.
[SOURCE: IEC 60469:2013, 3.2.17, modified – the reference to Figure 1 has been added as
well as the note 1 to entry.]
3.9.1
percent reference level
reference level specified by:
x
y = y + (y − y )
x% 0% 100% 0%
 (2)
100%
where
0 % < x < 100 %
y = level of low state
0%
y = level of high state
100%
y , y , and y are all in the same unit of measurement
0% 100% x%
SEE Figure 1.
Note 1 to entry: Commonly used reference levels are: 0 %, 10 % , 50 %, 90 %, and 100 %.
[SOURCE: IEC 60469:2013, 3.2.17.3, modified – the reference to Figure 1 has been added.]
3.10
measurand
quantity intended to be measured
[SOURCE: ISO/IEC Guide 99:2007, 2.3, modified – the notes have been deleted.]
3.11
measurement model
model of measurement
model
mathematical relation among all quantities known to be involved in a measurement
[SOURCE: ISO/IEC Guide 99:2007, 2.48, modified – the notes have been deleted.]

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3.12
measurement uncertainty
uncertainty of measurement
uncertainty
non-negative parameter characterizing the dispersion of the quantity values being attributed
to a measurand, based on the information used
Note 1 to entry Measurement uncertainty is also defined as a “parameter, associated with the result of a
measurement, that characterizes the dispersion of the values that could reasonably be attributed to the measurand,”
(See ISO/IEC Guide 98-3:2008, 2.2.3).
[SOURCE: ISO/IEC Guide 99:2007, 2.26, modified – the notes have been deleted and the
note 1 to entry has been added.]
3.12.1
standard measurement uncertainty
standard uncertainty of measurement
standard uncertainty
measurement uncertainty expressed as a standard deviation
Note 1 to entry: Standard measurement uncertainty is also defined as an “uncertainty of the results of
measurement expressed as a standard deviation,” ( See ISO/IEC Guide 98-3:2008, 2.3.1).
[SOURCE: ISO/IEC Guide 99:2007, 2.30, modified – the note 1 to entry has been added.]
3.12.2
combined standard measurement uncertainty
combined standard uncertainty
standard measurement uncertainty that is obtained using the individual standard
measurement uncertainties associated with the input quantities in a measurement model
Note 1 to entry: Combined standard uncertainty is also defined as a “standard uncertainty of the result of a
measurement when that result is obtained from the values of a number of other quantities, equal to the positive
square root of a sum of terms, the terms being the variances or covariances of these other quantities weighted
according to how the measurement result varies with changes in these quantities,” (See ISO/IEC Guide 98-3:2008,
2.3.4).
[ISO/IEC Guide 99:2007, 2.31, modified – the note has been deleted and the note 1 to entry
has been added.]
3.12.3
expanded measurement uncertainty
expanded uncertainty
product of a combined standard measurement uncertainty and a factor larger than the number
one
[SOURCE: ISO/IEC Guide 99:2007, 2.35]
Note 1 to entry: Expanded uncertainty is also defined as a “quantity defining an interval about the result of a
measurement that may be expected to encompass a large fraction of the distribution values that could reasonably
be attributed to the measurand,” (See ISO/IEC Guide 98-3:2008,2.3.5).
[SOURCE: ISO/IEC Guide 99:2007, 2.35,
...