oSIST prEN IEC 60749-5:2022
(Main)Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5: Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer Beanspruchung
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5: Essai continu de durée de vie sous température et humidité avec polarisation
Polprevodniški elementi - Mehanske in klimatske preskusne metode - 5. del: Preskus življenjske dobe v dinamičnem ravnotežju vlažnosti in pri ustaljeni temperaturi
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Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC 60749-5:2022
01-november-2022
Polprevodniški elementi - Mehanske in klimatske preskusne metode - 5. del:
Preskus življenjske dobe v dinamičnem ravnotežju vlažnosti in pri ustaljeni
temperaturi
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state
temperature humidity bias life test
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 5:
Lebensdauerprüfung bei konstanter Temperatur und Feuchte unter elektrischer
Beanspruchung
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 5:
Essai continu de durée de vie sous température et humidité avec polarisation
Ta slovenski standard je istoveten z: prEN IEC 60749-5:2022
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
oSIST prEN IEC 60749-5:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN IEC 60749-5:2022
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oSIST prEN IEC 60749-5:2022
47/2770/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 60749-5 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2022-09-09 2022-12-02
SUPERSEDES DOCUMENTS:
47/2769/RR
IEC TC 47 : SEMICONDUCTOR DEVICES
SECRETARIAT: SECRETARY:
Korea, Republic of Mr Cheolung Cha
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if any,
in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft for
Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they
are aware and to provide supporting documentation.
TITLE:
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature
humidity bias life test
PROPOSED STABILITY DATE: 2028
NOTE FROM TC/SC OFFICERS:
Copyright © 2022 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
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oSIST prEN IEC 60749-5:2022
IEC 60749-5/Ed3/CDV IEC (E) – 2 – 47/2770/CDV
1 CONTENTS
2 FOREWORD . 3
3 1 Scope . 5
4 2 Normative references . 5
5 3 Terms and definitions . 5
6 4 General . 5
7 5 Equipment . 5
8 5.1 Equipment summary . 5
9 5.2 Temperature and relative humidity . 6
10 5.3 Devices under stress . 6
11 5.4 Minimizing release of contamination . 6
12 5.5 Ionic contamination . 6
13 5.6 Deionized water . 6
14 6 Test conditions . 6
15 6.1 Test conditions summary . 6
16 6.2 Temperature, relative humidity and duration . 6
17 6.3 Biasing guidelines . 6
18 6.4 Biasing choice and reporting . 7
19 7 Procedures . 7
20 7.1 Mounting . 7
21 7.2 Ramp-up . 8
22 7.3 Ramp-down . 8
23 7.4 Test clock . 8
24 7.5 Bias . 8
25 7.6 Read-out . 8
26 7.7 Handling . 8
27 8 Failure criteria . 8
28 9 Safety . 8
29 10 Summary . 9
30
31 Table 1 – Temperature, relative humidity and duration . 6
32 Table 2 – Criteria for choosing continuous or cyclical bias . 7
33
34
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oSIST prEN IEC 60749-5:2022
IEC 60749-5/Ed3/CDV IEC (E) – 3 – 47/2770/CDV
35 INTERNATIONAL ELECTROTECHNICAL COMMISSION
36 ____________
37
38 SEMICONDUCTOR DEVICES –
39 MECHANICAL AND CLIMATIC TEST METHODS –
40
41 Part 5: Steady-state temperature humidity bias life test
42
43 FOREWORD
44 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
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76 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
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78 IEC 60749-5 has been prepared by IEC technical committee 47: Semiconductor devices. It is
79 an International Standard.
80 This third edition, based on JEDEC document JESD22-A101D.01, cancels and replaces the
81 second edition published in 2017. lt is used with permission of the copyright holder, JEDEC
82 Solid State Technology Association. This edition constitutes a technical revision.
83 This edition includes the following significant technical changes with respect to the previous
84 edition:
85 a) the need to minimize relative humidity gradients and maximize air flow between devices.;
86 b) the avoidance of condensation on devices and electrical fixtures;
87 c) replacement of references to ‘virtual junction’ with ‘die’.
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oSIST prEN IEC 60749-5:2022
IEC 60749-5/Ed3/CDV IEC (E) – 4 – 47/2770/CDV
88 The text of this International Standard is based on the following documents:
FDIS Report on voting
47/XX/FDIS 47/XX/RVD
89
90 The language used for the development of this International Standard is English.
91 This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
92 accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement,
93 available at www.iec.ch/members_experts/refdocs. The main document types developed by
94 IEC are described in greater detail at www.iec.ch/standardsd
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