Ferrite cores - Guideline on the limits of surface irregularities - Part 3: ETD-cores, EER-cores, EC-cores and E-cores

This part of IEC 60424 gives guidelines on allowable limits of surface irregularities applicable
to ETD-cores, EER-cores, EC-cores and E-cores in accordance with the relevant general
specification.
This standard is a specification useful in the negotiations between ferrite core manufacturers
and customers about surface irregularities.

Ferritkerne - Leitfaden für Grenzwerte von sichtbaren Beschädigungen der Kernoberfläche - Teil 3: ETD-Kerne, EER-Kerne, EC-Kerne und E-Kerne

Noyaux ferrites - Lignes directrices relatives aux limites des irrégularités de surface - Partie 3: Noyaux ETD, EER, EC et E

L'IEC 60424-3:2015 donne des lignes directrices relatives aux limites admissibles des irrégularités de surface applicables aux noyaux ETD, EER, EC et E, conformément à la spécification générale applicable. La présente norme est une spécification utile aux négociations entre les fabricants de noyaux en ferrite et leurs clients à propos d'irrégularités de surface. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: a) ajout d'aires admissibles d'éclats pour les noyaux EC dans le Tableau 3, b) ajout de cristallites en 4.5 et de pores en 4.6.

Feritna jedra - Smernica o mejnih vrednostih površinskih nepravilnosti - 3. del: ETD-jedra, EER-jedra, EC-jedra in E-jedra

Ta del standarda IEC 60424 podaja smernice o omejitvah površinskih nepravilnosti, ki veljajo za jedra ETD, EER, EC in E v skladu z ustrezno splošno specifikacijo.
Ta standard je specifikacija, uporabna za sklepanje dogovorov glede površinskih nepravilnosti med proizvajalci feritnih jeder in strankami.

General Information

Status
Published
Publication Date
13-Mar-2016
Current Stage
6060 - National Implementation/Publication (Adopted Project)
Start Date
02-Mar-2016
Due Date
07-May-2016
Completion Date
14-Mar-2016

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SLOVENSKI STANDARD
SIST EN 60424-3:2016
01-april-2016
1DGRPHãþD
SIST EN 60424-3:2002
Feritna jedra - Smernica o mejnih vrednostih površinskih nepravilnosti - 3. del:
ETD-jedra, EER-jedra, EC-jedra in E-jedra

Ferrite cores - Guideline on the limits of surface irregularities - Part 3: ETD-cores, EER-

cores, EC-cores and E-cores

Noyaux ferrites - Lignes directrices relatives aux limites des irrégularités de surface -

Partie 3: Noyaux ETD, EER, EC et E
Ta slovenski standard je istoveten z: EN 60424-3:2016
ICS:
29.100.10 Magnetne komponente Magnetic components
SIST EN 60424-3:2016 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------
SIST EN 60424-3:2016
---------------------- Page: 2 ----------------------
SIST EN 60424-3:2016
EUROPEAN STANDARD EN 60424-3
NORME EUROPÉENNE
EUROPÄISCHE NORM
February 2016
ICS 29.100.10 Supersedes EN 60424-3:1999
English Version
Ferrite cores - Guidelines on the limits of surface irregularities -
Part 3: ETD-cores, EER-cores, EC-cores and E-cores
(IEC 60424-3:2015)

Noyaux ferrites - Lignes directrices relatives aux limites des Ferritkerne - Leitfaden für Grenzwerte von sichtbaren

irrégularités de surface - Partie 3: Noyaux ETD, EER, Beschädigungen der Kernoberfläche - Teil 3: ETD-Kerne,

EC et E EER-Kerne, EC-Kerne und E-Kerne
(IEC 60424-3:2015) (IEC 60424-3:2015)

This European Standard was approved by CENELEC on 2015-11-26. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,

Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,

Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels

© 2016 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN 60424-3:2016 E
---------------------- Page: 3 ----------------------
SIST EN 60424-3:2016
EN 60424-3:2016
European foreword
The text of document 51/1099/FDIS, future edition 2 of IEC 60424-3, prepared by

IEC/TC 51 “Magnetic components and ferrite materials" was submitted to the IEC-CENELEC parallel

vote and approved by CENELEC as EN 60424-3:2016.
The following dates are fixed:
(dop) 2016-08-26
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2018-11-26
standards conflicting with the
document have to be withdrawn
This document supersedes EN 60424-3:1999.

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such

patent rights.
Endorsement notice

The text of the International Standard IEC 60424-3:2015 was approved by CENELEC as a European

Standard without any modification.
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SIST EN 60424-3:2016
EN 60424-3:2016
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are

indispensable for its application. For dated references, only the edition cited applies. For undated

references, the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant

EN/HD applies.

NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:

www.cenelec.eu
Publication Year Title EN/HD Year
IEC 60424-1 2015 Ferrite cores - Guidelines on the limits EN 60424-1 -
of surface irregularities -
Part 1: General Specification
IEC 60647 - Dimensions for magnetic oxide cores - -
intended for use in power supplies
(EC-cores)
IEC 61185 - Ferrite cores (ETD-cores) intended EN 61185 -
for use in power supply applications -
Dimensions
IEC 62317-7 - Ferrite cores - Dimensions - EN 62317-7 -
Part 7: EER-cores
IEC 62317-8 - Ferrite cores - Dimensions - EN 62317-8 -
Part 8: E-cores
To be published.
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SIST EN 60424-3:2016
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SIST EN 60424-3:2016
IEC 60424-3
Edition 2.0 2015-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Ferrite cores – Guidelines on the limits of surface irregularities –
Part 3: ETD-cores, EER-cores, EC-cores and E-cores
Noyaux ferrites – Lignes directrices relatives aux limites des irrégularités de
surface –
Partie 3: Noyaux ETD, EER, EC et E
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 29.100.10 ISBN 978-2-8322-2936-1

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
---------------------- Page: 7 ----------------------
SIST EN 60424-3:2016
– 2 – IEC 60424-3:2015 © IEC 2015
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms and definitions ...................................................................................................... 5

4 Limits of surface irregularities .......................................................................................... 6

4.1 Chips and ragged edges ......................................................................................... 6

4.1.1 General ........................................................................................................... 6

4.1.2 Chips and ragged edges on the mating surfaces .............................................. 6

4.1.3 Chips and ragged edges on other surfaces ...................................................... 6

4.2 Cracks .................................................................................................................. 11

4.3 Flash .................................................................................................................... 11

4.4 Pull-outs ............................................................................................................... 11

4.5 Crystallites ............................................................................................................ 14

4.6 Pores .................................................................................................................... 14

Figure 1 – Chip location for ETD-cores, EER-cores and EC-cores .......................................... 9

Figure 2 – Chip location for E-cores ........................................................................................ 9

Figure 3 – Cracks and pull-out location for ETD-cores, EER-cores and EC-cores ................. 12

Figure 4 – Cracks and pull-out location for E-cores ............................................................... 13

Figure 5 – Crystallites location for ETD-cores, EER-cores and EC-cores .............................. 14

Figure 6 – Crystallites location for E-cores ............................................................................ 14

Figure 7 – Pores location for ETD-cores, EER-cores and EC-cores ...................................... 15

Figure 8 – Pores location for E-cores .................................................................................... 15

Table 1 – Allowable areas of chips for ETD-cores in mm ....................................................... 6

Table 2 – Allowable areas of chips for EER-cores in mm ....................................................... 7

Table 3 – Allowable areas of chips for EC-cores in mm ......................................................... 7

Table 4 – Allowable areas of chips for E-cores in mm ........................................................... 8

Table 5 – Area and length reference for visual inspection ..................................................... 10

Table 6 – Limits for cracks .................................................................................................... 13

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SIST EN 60424-3:2016
IEC 60424-3:2015 © IEC 2015 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
FERRITE CORES – GUIDELINES ON
THE LIMITS OF SURFACE IRREGULARITIES –
Part 3: ETD-cores, EER-cores, EC-cores and E-cores
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or

...

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