SIST EN 61747-5:2002

Liquid crystal and solid-state display devices -- Part 5: Environmental, endurance and mechanical test methods

Lists test methods applicable to liquid crystal display devices. Takes into account, wherever possible, the environmental test methods outlined in EN 60068. Also includes visual inspection for both liquid crystal display cells and modules. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of liquid crystal display devices.

Flüssigkristall- und Halbleiter-Anzeige-Bauelemente -- Teil 5: Umwelt-, Lebensdauer- und mechanische Prüfverfahren

Dispositifs d'affichage à cristaux liquides et à semiconducteurs -- Partie 5: Méthodes d'essais d'environnement, d'endurance et mécaniques

Répertorie les méthodes d'essai applicables aux dispositifs d'affichage à cristaux liquides. Prend en compte, dans la mesure du possible, les méthodes d'essai d'environnement de la EN 60068. Comprend en outre l'inspection visuelle des cellules et des modules d'affichage à cristaux liquides. Etablit des méthodes d'essai uniformes indiquant des valeurs préférentielles pour les niveaux de contraintes, permettant d'estimer les propriétés environnementales des dispositifs d'affichage à cristaux liquides.

Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods (IEC 61747-5:1998)

General Information

• Status: Published
• Publication Date: 31-Aug-2002
• ICS: 31.120 - Electronic display devices
• Technical Committee: SS EIT - Technical Board for the electrotechnical, information technology and telecommunications fields
• Current Stage: 6060 - National Implementation/Publication (Adopted Project)
• Start Date: 01-Sep-2002
• Due Date: 01-Sep-2002
• Completion Date: 01-Sep-2002
• Ref Project: EN 61747-5:1998 - Liquid crystal and solid-state display devices - Part 5: Environmental, endurance and mechanical test methods

Relations

• Replaced By: SIST EN 61747-10-1:2014 - Liquid crystal display devices - Part 10-1: Mechanical test methods
• Effective Date: 28-Jan-2023
• Replaced By: SIST EN 61747-10-1:2014 - Liquid crystal display devices - Part 10-1: Mechanical test methods
• Effective Date: 20-Aug-2013
• Revises: SIST EN 61747-10-1:2014 - Liquid crystal display devices - Part 10-1: Mechanical test methods
• Effective Date: 07-Jun-2022

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 61747-5:2002
01-september-2002
Liquid crystal and solid-state display devices - Part 5: Environmental, endurance
and mechanical test methods (IEC 61747-5:1998)
Liquid crystal and solid-state display devices -- Part 5: Environmental, endurance and
mechanical test methods
Flüssigkristall- und Halbleiter-Anzeige-Bauelemente -- Teil 5: Umwelt-, Lebensdauer-
und mechanische Prüfverfahren
Dispositifs d'affichage à cristaux liquides et à semiconducteurs -- Partie 5: Méthodes
d'essais d'environnement, d'endurance et mécaniques
Ta slovenski standard je istoveten z: EN 61747-5:1998
ICS:
31.120 Elektronske prikazovalne Electronic display devices
naprave
SIST EN 61747-5:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 61747-5:2002

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SIST EN 61747-5:2002

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SIST EN 61747-5:2002

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SIST EN 61747-5:2002

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SIST EN 61747-5:2002

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SIST EN 61747-5:2002
NORME
CEI
INTERNATIONALE
IEC
61747-5
INTERNATIONAL
Première édition
STANDARD
First edition
1998-06
Dispositifs d’affichage à cristaux liquides
et à semiconducteurs –
Partie 5:
Méthodes d’essais d’environnement,
d’endurance et mécaniques
Liquid crystal and solid-state display devices –
Part 5:
Environmental, endurance and mechanical
test methods
 IEC 1998 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in
utilisée sous quelque forme que ce soit et par aucun any form or by any means, electronic or mechanical,
procédé, électronique ou mécanique, y compris la photo- including photocopying and microfilm, without permission in
copie et les microfilms, sans l'accord écrit de l'éditeur. writing from the publisher.
International Electrotechnical Commission 3, rue de Varembé Geneva, Switzerland
Telefax: [phone] e-mail: [e-mail] IEC web site http: //www.iec.ch
CODE PRIX
Commission Electrotechnique Internationale
PRICE CODE W
International Electrotechnical Commission
Pour prix, voir catalogue en vigueur
For price, see current catalogue

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 General. 7
1.1 Scope and object. 7
1.2 Normative references. 7
1.3 Terms, definitions and letter symbols . 9
1.4 Standard atmospheric conditions . 9
1.5 Visual examination and verification of dimensions . 13
1.6 Electrical and optical measurements. 13
1.7 Electrical operating conditions. 15
2 Mechanical test methods . 15
2.1 Robustness of terminations. 15
2.2 Soldering. 17
2.3 Vibration (sinusoidal). 17
2.4 Shock. 21
2.5 Acceleration, steady state . 23
2.6 Bond strength test . 23
3 Environmental and endurance test methods. 27
3.1 Change of temperature . 27
3.2 Storage (at high temperature) . 33
3.3 Storage (at low temperature). 35
3.4 Low air pressure. 35
3.5 Damp heat, steady state. 35
3.6 Damp heat, cyclic (12+12-hour cycle) . 37
3.7 Composite temperature/humidity cyclic test . 37
3.8 Light exposure. 47
3.9 ESD Test. 47
4 Miscellaneous test methods . 47
4.1 Permanence of marking . 47
4.2 Scratch test (of face plate) . 49
4.3 Life test. 49
5 Visual inspection of monochrome matrix liquid crystal display modules
(Excluding all active matrix liquid crystal display modules) . 49
5.1 General. 49
5.2 Visual inspection of displays. 49
6 Visual inspection of monochrome liquid crystal display cells
(Excluding all active matrix liquid crystal display modules) . 59
6.1 General. 59
6.2 Visual inspection of displays. 59
6.3 Seal inspections (see figure 13) . 65
6.4 Visual inspection of contact pad area (see figure 14) . 67
6.5 Visual inspection for chipped material at the borders and edges of the support
plates of cells . 71
Annex A – Cross references index . 73

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
_________
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES –
Part 5: Environmental, endurance and mechanical test methods
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61747-5 has been prepared by subcommittee 47C: Optoelectronic,
display and imaging devices, of IEC technical committee 47: Semiconductor devices.
The text of this standard is based on a part of amendments 1 and 2 to IEC 60747-5 and the
following documents:
FDIS Report on voting
47C/203/FDIS 47C/211/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
Annex A is for information only.

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 7 –
LIQUID CRYSTAL AND SOLID-STATE DISPLAY DEVICES –
Part 5: Environmental, endurance and mechanical test methods
1 General
1.1 Scope and object
This part of IEC 61747 lists test methods applicable to liquid crystal display devices. It takes
into account, wherever possible, the environmental test methods outlined in IEC 60068.
It also includes visual inspection for both liquid crystal display cells and modules.
NOTE 1 – This standard is established separately from IEC 60749, because the technology of liquid crystal display
devices is completely different from that of semiconductor devices in such matters as
– shape and size;
– used materials and structure;
– function;
– measuring methods;
– operation principles.
NOTE 2 – Devices include cells and modules.
The object of this standard is to establish uniform preferred test methods with preferred values
for stress levels for judging the environmental properties of liquid crystal display devices.
In case of contradiction between this standard and a relevant specification, the latter shall
govern.
1.2 Normative references
The following normative documents contain provisions which, through reference in this text,
constitute provisions of this part of IEC 61747. At the time of publication, the editions indicated
were valid. All normative documents are subject to revision, and parties to agreements based
on this part of IEC 61747 are encouraged to investigate the possibility of applying the most
recent editions of the normative documents indicated below. Members of IEC and ISO maintain
registers of currently valid International Standards.
IEC 60068, Environmental testing
IEC 60068-1:1988, Environmental testing – Part 1: General and guidance
IEC 60068-2-1:1990, Environmental testing – Part 2: Tests – Test A: Cold
IEC 60068-2-2:1974, Environmental testing – Part 2: Tests – Test B: Dry heat
IEC 60068-2-3:1969, Environmental testing – Part 2: Tests – Test Ca: Damp heat, steady state
IEC 60068-2-5:1975, Environmental testing – Part 2: Tests – Test Sa: Simulated solar radiation
at ground level

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 9 –
IEC 60068-2-6:1995, Environmental testing – Part 2: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-7:1983, Environmental testing – Part 2: Tests – Test Ga: Acceleration, steady state
IEC 60068-2-13:1983, Environmental testing – Part 2: Tests – Test M: Low air pressure
IEC 60068-2-14:1984, Environmental testing – Part 2: Tests – Test N: Change of temperature
IEC 60068-2-20:1979, Environmental testing – Part 2: Tests – Test T: Soldering
IEC 60068-2-21:1983, Environmental testing – Part 2: Tests – Test U: Robustness of
terminations and integral mounting devices
IEC 60068-2-27:1987, Environmental testing – Part 2: Tests – Test Ea and guidance: Shock
IEC 60068-2-30:1980, Environmental testing – Part 2: Tests – Test Db and guidance: Damp
heat, cyclic (12 + 12-hour cycle)
IEC 60068-2-38:1974, Environmental testing – Part 2: Tests – Test Z/AD: Composite
temperature/humidity cyclic test
IEC 60068-2-45:1980, Environmental testing – Part 2: Tests – Test XA and guidance:
Immersion in cleaning solvents
IEC 60747, Semiconductor devices
IEC 60747-1:1983, Semiconductor devices – Discrete devices – Part 1 – General
Amendment 1 (1991)
Amendment 2 (1993)
Amendment 3 (1996)
IEC 60747-5:1984, Semiconductor devices – Part 5: Optoelctronic devices
Amendment 1 (1994)
Amendment 2 (1995)
IEC 60748-1:1984, Semiconductor devices – Integrated circuits – Part 1: General
IEC 60749:1996, Semiconductor devices – Mechanical and climatic test methods
IEC 61747:1998, Liquid crystal and solid-state display devices
1.3 Terms, definitions and letter symbols
For the purpose of this standard, the definitions and letter symbols of IEC 60068, IEC 60747,
IEC 60748 and IEC 61747-1 apply.
1.4 Standard atmospheric conditions
The atmospheric conditions specified in IEC 60068-1 apply.
1.4.1 Standard reference atmosphere
Temperature: 25 °C
Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar)

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 11 –
1.4.2 Standard atmosphere for referee measurements and tests
If the parameters of liquid crystal display devices to be measured depend on temperature,
pressure, and humidity and the law of dependence is unknown, the atmospheres to be
specified shall be selected from the following:
Temperature Relative humidity Air pressure
°C % RH kPa
20 ± 1 45 to 75 86 to 106
25 ± 1 45 to 75 86 to 106
30 ± 1 45 to 75 86 to 106
35 ± 1 45 to 75 86 to 106
NOTE – Atmospheric conditions for initial and final measurements shall be the same.
1.4.3 Standard atmospheric conditions for measurements and tests
Unless otherwise specified, all tests and measurements shall be carried out under standard
atmospheric conditions for testing.
Temperature: 15 °C to 35 °C
Relative humidity: 25 % to 85 % RH, where appropriate
Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar)
3
The absolute humidity of the atmosphere shall not exceed 22 g/m .
1.4.4 Recovery conditions
After the conditioning period and before making the final measurements, the specimens should
be allowed to stabilize at the ambient temperature, the temperature at which the measurements
shall be made.
The “controlled recovery conditions” (see 1.4.4.1) shall be applied if the electrical parameters
to be measured are affected by absorbed humidity or by the surface conditions of the
specimens, and change rapidly, for example if the insulation resistance rises considerably
within approximately 2 h after removal of the specimens from the humidity chamber.
If the electrical parameters of the specimens affected by absorbed humidity or surface
conditions do not vary rapidly, recovery may be carried out in the conditions specified in 1.4.3.
1.4.4.1 Controlled recovery conditions
Unless otherwise specified, all recovery shall be carried out under controlled atmospheric
conditions:
Temperature: actual laboratory temperature ±1 °C, provided that it is within the limits fixed
in 1.4.3, that is between 15 °C to 35 °C.
Relative humidity: 73 % to 77 %, where appropriate
Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar)
Before the measurements are made, the devices shall be stored until temperature equilibrium is
reached. The ambient temperature during the measurements shall be stated in the test report.

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 13 –
During measurements, the devices shall not be exposed to draught, illumination or other
influences likely to cause error. The environment shall be controlled to avoid error.
If recovery and measurements are performed in separate chambers, the combination of
temperature and humidity conditions shall be such that condensation on the surface of the
devices does not occur when the device is transferred to the measurement chamber.
1.4.4.2 Recovery procedure
The device shall be placed in the recovery chamber within 10 min of completing of
conditioning. Where the relevant specification requires measurements to be made immediately
after the recovery period, these measurements shall be completed within 30 min of the
specimen being removed from the recovery chamber. Those characteristics which are
expected to change most rapidly after the device is removed from the recovery chamber shall
be measured first.
1.4.5 Standard atmospheric conditions for assisted drying
Where assisted drying is required before commencing a series of measurements, the
conditions listed below shall be used on the specimen for 6 h, unless otherwise prescribed by
the relevant specification.
Temperature: (55 ± 2) °C
Relative humidity: not exceeding 20 %
Air pressure: 86 kPa to 106 kPa (860 mbar to 1 060 mbar)
When the specified temperature for the dry heat test is lower than 55 °C, assisted drying shall
be carried out at that lower temperature.
1.5 Visual examination and verification of dimensions
Clauses 5 and 6 are applicable.
1.5.1 Visual examination shall include
a) the conformance and permanence of the marking;
b) damage to the encapsulation, including terminals;
c) workmanship of the encapsulation, including terminals.
1.5.2 Dimensions given in the relevant specification shall be verified.
1.5.3 Unless otherwise specified, visual inspection shall be performed under normal factory
lighting and under normal visual conditions.
1.6 Electrical and optical measurements
1.6.1 For environmental testing, the characteristics to be checked shall be selected from the
relevant part of IEC 61747.
1.6.2 Measurement conditions shall comply with the table “Conditions for the endurance tests”
in the relevant part of IEC 61747.

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 15 –
1.6.3 Initial measurements
If only upper specification limit and/or lower specification limit criteria are required, it is left to
the discretion of the manufacturer whether initial measurements are made or not. Initial
measurements shall be made where individual values for an individual device are a criterion.
1.6.4 Measurements monitored during environmental testing
To be stated, where appropriate.
1.6.5 Final measurements
When the test is called for in the relevant specification as part of a sequence (subgroup) of
tests, measurements are required only at the end of the sequence. For certain tests, such as
solderability or lead fatigue, electrically or optically defective devices may be used.
1.7 Electrical operating conditions
Electrical operating conditions shall be defined in the relevant specifications.
2 Mechanical test methods
Choice of the appropriate tests depends on the type of devices. The relevant specification shall
state which tests are applicable.
2.1 Robustness of terminations
2.1.1 Wire terminations, pins or connectors with pins
Test U, specified in IEC 60068-2-21, is applicable.
2.1.1.1 Tensile
This test shall be in accordance with test Ua1, with the following specific requirements.
After test, examine under 3× to 10× magnification.
The device shall be rejected if there is breakage, loosening or relative motion between the lead
or termination and the device body.
2.1.1.2 Bending
This test shall be in accordance with test Ub.
2.1.1.3 Torsion
See IEC 60749, chapter II, subclause 1.3.
Applied only for cells with pin.
2.1.1.4 Torque
See IEC 60749, chapter II, subclause 1.4.2.
Applied only for cells with pin.

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 17 –
2.1.2 Flexible terminations
Under consideration.
2.2 Soldering
Test T, specified in IEC 60068-2-20, is applicable.
This test shall be in accordance with test Ta (methods 1, 2 and 3).
2.3 Vibration (sinusoidal)
Test Fc, specified in IEC 60068-2-6, is applicable, with the following specific requirements.
2.3.1 Transverse motion
The maximum vibration amplitude at the check points in any perpendicular to the specified axis
shall not exceed 25 %.
2.3.2 Distortion
Not exceeding 25 %.
2.3.3 Vibration amplitude tolerance
Reference point: ±15 %
Check point: ±25 %
2.3.4 Severities
The frequency range shall be given in the relevant specification by selecting a lower frequency
from table 1 and an upper frequency from table 2.
Table 1 – Frequency range – Lower end
Lower frequency f
1
Hz
1
5
10
55
Table 2 – Frequency range – Upper end
Upper frequency f
2
Hz
55
100
150
300
500

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 19 –
The recommended ranges are shown in table 3.
Table 3 – Recommended frequency ranges
Recommended frequency ranges,
from f to f
1 2
Hz
1 to 55
10 to 55
10 to 300
10 to 500
55 to 500
2.3.5 Vibration amplitude
Recommended vibration amplitudes with cross-over frequency are shown in table 4.
Table 4 – Recommended vibration amplitudes
Displacement amplitude below Acceleration amplitude above
the cross-over frequency the cross-over frequency
2
mm m/s g
n
0,035 4,9 0,5
0,075 9,8 1,0
0,15 19,6 2,0
0,35 49,0 5,0
0,75 98,0 10,0
NOTE – The values listed apply in table 4 for cross-over frequencies between 57 Hz
and 62 Hz.
2.3.6 Duration of endurance
2.3.6.1 Endurance by sweeping
The duration of the endurance in each axis shall be given as a number of sweep cycles given
preference by the relevant specification from the list given below.
1, 2, 5, 10, 20.
2.3.6.2 Endurance at critical frequencies
The duration of the endurance in each appropriate axis at each critical frequency found during
the vibration response investigation shall be given preference in the relevant specification from
the list given below.
10 min ± 0,5 min
30 min ± 1 min
90 min ± 1 min
10 h ± 5 min

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 21 –
2.3.7 The body of the device shall be securely clamped during the test. If the device has a
specified method of installation, it shall be used to clamp the device.
2.4 Shock
Test Ea, specified in IEC 60068-2-27, is applicable, with the following specific requirements.
The conditions shall be selected from table 5, taking into consideration the mass of the device
and its internal construction.
Table 5 – Conditions for shock test
Peak amplitude A Corresponding duration D Corresponding
of the nominal pulse
velocity change Δ V
Half-sine Final-peak
saw-tooth
2
m/s (g ) ms m/s m/s
n
50 (5) 30 1,0 –
150 (15) 11 1,0 0,8
150 (15) 6 0,6 0,4
300 (30) 18 3,4 2,6
300 (30) 11 2,1 1,6
300 (30) 6 1,1 0,9
500 (50) 20 6,2 4,9
500 (50) 11 3,4 2,7
500 (50) 3 0,9 0,7
700 (70) 11 4,8 3,8
1 000 (100) 11 6,9 5,4
1 000 (100) 6 3,7 2,9
2 000 (200) 6 7,5 5,9
2 000 (200) 3 3,7 2,9
NOTE – Preferred values are underlined.
The relevant specification shall state the wave form utilized.
The device shall be subjected to three successive shocks, in both directions of three mutually-
perpendicular axes chosen so that faults are most likely to be revealed, i.e. a total of 18 shocks
(see clause A.7 of IEC 60068-2-27.) The preferred combinations are underlined.
The body of the device shall be securely clamped during the test. If the device has a specified
method of installation, it shall be used to clamp the device.

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 23 –
2.5 Acceleration, steady state
Test Ga, specified in IEC 60068-2-7, is applicable, with the following specific requirements.
The acceleration conditions shall be selected from table 6.
Table 6 – Acceleration conditions
Acceleration
2
m/s
30
50
100
200
500
1 000
2 000
Procedure:
The acceleration shall be applied for at least 1 min, in both directions of the three major axes,
unless otherwise specified.
The body of the device shall be securely clamped during the test. If the device has a specified
method of installation, it shall be used to clamp the device.
2.6 Bond strength test
The purpose of this test is to measure bond strength or to determine compliance with specified
bond strength requirements. This test is intended to show the bond strength on devices of
flexible flat cables.
2.6.1 General description of the test
The flexible flat cable is pulled as shown in figure 1, with the substrate rigidly fixed.
2.6.2 Preconditioning
The method of preconditioning shall be as prescribed in the relevant specification.
2.6.3 Initial measurements
The specimen shall be visually inspected and electrically and mechanically checked, as
required by the relevant specification.
2.6.4 Test method (see figure 1)
2.6.4.1 Application
This test shall apply to the bond strength measurement of flexible flat cables.

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 25 –
2.6.4.2 Procedure
The substrate of the bonded device shall be rigidly fixed. The flexible flat cable shall be pulled
as shown figure 1 until it is completely removed from the device. The bond strength is equal to
the minimum value indicated by the gauge.
Be aware that pull speed should be sufficiently low.
Failure mode may be dependent on the pull speed.
2.6.5 Information required in the relevant specification
The following details shall be given as far as they are applicable:
a) description of the clamp attachment and preparation of the flexible flat cable;
b) preconditioning;
c) conditions of test:
– speed of pull;
– maximum value of pull force;
– method of data recording;
d) test results:
– minimum value of pull force;
– category of separation.
Pull gauge
Flexible flat
cable
Substrate
IEC  692/98
Figure 1 – Example of bond strength

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 27 –
3 Environmental and endurance test methods
The choice of the appropriate tests depends on the type of devices. The relevant specification
shall state which tests are applicable.
3.1 Change of temperature
Test N, specified in IEC 60068-2-14, is applicable.
3.1.1 Rapid change of temperature: two-chamber method
This test shall be in accordance with test Na, with the following specific requirements:
3
– the absolute humidity of the atmosphere shall not exceed 20 g/m ;
– the lower temperature T shall be specified in the relevant specification and shall be
A
chosen from the test temperature of table 7;
– the higher temperature T shall be specified in the relevant specification and shall be
B
chosen from the test temperature of table 8;
Table 7 – Low test temperature
Low temperature T
A
°C
–50 ± 3 –30 ± 3 –10 ± 3
–45 ± 3 –25 ± 3 –5 ± 3
–40 ± 3 –20 ± 3 0 ± 3
–35 ± 3 –15 ± 3
Tableau 8 – High test temperature
T
High temperature
B
°C
+100 ± 2 +75 ± 2 +50 ± 2
+95 ± 2 +70 ± 2 +45 ± 2
+90 ± 2 +65 ± 2 +40 ± 2
+85 ± 2 +60 ± 2 +35 ± 2
+80 ± 2 +55 ± 2 +30 ± 2
– the exposure time t of each of the two temperatures depends upon the thermal capacity of
1
the device. It shall be 3 h, 2 h, 1 h, 30 min or 10 min as specified in the relevant
specification. Where no exposure period is prescribed in the relevant specification it is
understood to be 3 h;
– the choice of transition time t depends on the thermal time constant of the test specimen.
2
The transition time should be:
2 min to 3 min;
20 s to 30 s;
less than 10 s;

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SIST EN 61747-5:2002
61747-5 © IEC:1998 – 29 –
– the first cycle comprises the two exposure times t and the two transition times t (see
1 2
figure 2);
– the number of cycles shall be 5 or 10, unless otherwise specified in the relevant specification;
– initial measurements:
an external visual examination;
mechanical, electrical and optical tests: as given in the relevant specification;
– final measurements:
an external visual examination;
mechanical, electrical, and optical tests: as specified at the initial measurements and in
the relevant specification.
t
1
≤
10
T
B
AB
Time t
t t
1 1
t
t
2
2
T
A
t
1
≤
10 First cycle
IEC  693/98
A = start of first cycle
B = end of first cycle and start of second cycle
NOTE – The dotted curve is explained in 1.3.1.5 of IEC 60068-2-14.
Figure 2 – Temperature profile
3.1.2 Specified change rate of temperature: one-chamber
...