oSIST prEN IEC 60352-2:2023
(Main)Solderless connections - Part 2: Crimped connections - General requirements, test methods and practical guidance
Solderless connections - Part 2: Crimped connections - General requirements, test methods and practical guidance
Lötfreie Verbindungen - Teil 2: Crimpverbindungen - Allgemeine Anforderungen, Prüfverfahren und Anwendungshinweise
Connexions sans soudure - Partie 2: Connexions serties - Exigences générales, méthodes d\'essai et guide pratique
Nespajkani spoji - 2. del: Nespajkani stisnjeni spoji - Splošne zahteve, preskusne metode in praktični napotki
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC 60352-2:2023
01-september-2023
Nespajkani spoji - 2. del: Nespajkani stisnjeni spoji - Splošne zahteve, preskusne
metode in praktični napotki
Solderless connections - Part 2: Crimped connections - General requirements, test
methods and practical guidance
Lötfreie Verbindungen - Teil 2: Crimpverbindungen - Allgemeine Anforderungen,
Prüfverfahren und Anwendungshinweise
Connexions sans soudure - Partie 2: Connexions serties - Exigences générales,
méthodes d\'essai et guide pratique
Ta slovenski standard je istoveten z: prEN IEC 60352-2:2023
ICS:
29.120.20 Spojni elementi Connecting devices
oSIST prEN IEC 60352-2:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN IEC 60352-2:2023
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oSIST prEN IEC 60352-2:2023
48B/3053/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 60352-2 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2023-08-04 2023-09-29
SUPERSEDES DOCUMENTS:
48B/2986/CDV, 48B/3020/RVC
IEC SC 48B : ELECTRICAL CONNECTORS
SECRETARIAT: SECRETARY:
United States of America Mr Jeffrey Toran
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of
which they are aware and to provide supporting documentation.
Recipients of this document are invited to submit, with their comments, notification of any relevant “In So me
Countries” clauses to be included should this proposal proceed. Recipients are reminded that the CDV stage is the
final stage for submitting ISC clauses. (SEE AC/22/2007 OR NEW GUIDANCE DOC).
TITLE:
Solderless connections - Part 2: Crimped connections - General requirements, test methods and
practical guidance
PROPOSED STABILITY DATE: 2025
NOTE FROM TC/SC OFFICERS:
Copyright © 2023 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this
electronic file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions.
You may not copy or "mirror" the file or printed version of the document, or any part of it, for any other purpose without
permission in writing from IEC.
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oSIST prEN IEC 60352-2:2023
IEC CDV 60352-2 © IEC 2023 – 2 – 48B/3053/CDV
CONTENTS
FOREWORD . 10
INTRODUCTION . 13
1 Scope . 14
2 Normative references . 14
3 Terms and definitions . 16
4 Workmanship . 25
5 Prerequisites for basic test schedule . 25
5.1 Classification by end-product class . 25
5.1.1 General . 25
5.1.2 Class A – General electrical and electronics products . 25
5.1.3 Class B – Dedicated service electrical and electronics products . 25
5.1.4 Class C – High performance electrical and electronics products . 26
5.2 Prerequisites for tools . 26
5.3 Prerequisites for crimp barrels . 26
5.3.1 Crimp barrel materials . 26
5.3.2 Crimp barrel dimensions . 27
5.3.3 Crimp barrel surface finishes . 27
5.3.4 Crimp barrel design features . 27
5.4 Prerequisites for wires . 27
5.4.1 General . 27
5.4.2 Conductor materials. 27
5.4.3 Conductor dimensions . 27
5.4.4 Conductor surface finishes . 28
5.4.5 Wire insulation . 28
5.4.6 Wire stripping . 28
5.5 Prerequisites for crimped connections. 30
5.5.1 Compatibility of combination . 30
5.5.2 Conductor location . 30
5.5.3 Crimping location . 30
5.5.4 Contact deformation . 30
5.5.5 Prerequisites for crimped connections with more than one conductor in
the crimp barrel . 30
5.5.6 Adjustment of conductor cross-sectional area to the crimp barrel . 31
5.5.7 Crimp contacts and terminal ends . 31
5.5.8 Splice crimp barrels . 35
5.6 Prerequisites for splice crimped connections . 36
5.6.1 General . 36
5.6.2 Conductor requirements for crimped splices . 36
6 Testing . 37
6.1 General . 37
6.2 Standard conditions for testing . 38
6.3 Pre-conditioning . 38
6.4 Recovery . 38
6.5 Mounting of the specimen . 38
7 Test methods and test requirements . 38
7.1 General examination of crimp barrels and wires . 38
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IEC CDV 60352-2 © IEC 2023 – 3 – 48B/3053/CDV
7.2 Examination of crimp dimensions . 39
7.2.1 Crimp height C , crimp width Cw and measurable crimp width C . 39
h wm
7.2.2 Contact deformation after crimping . 41
7.2.3 Visual examination of insulation distance and conductor overhang . 42
7.2.4 Visual examination of splice crimped connections . 42
7.2.5 Visual examination of crimped connections on closed (machined) crimp
barrels . 43
7.2.6 Visual examination of crimped connections on B-crimp open crimp
barrels . 43
7.2.7 Visual examination of crimped connections with open crimp barrel with
insulation grip . 43
7.3 Mechanical tests . 44
7.3.1 Tensile strength . 44
7.3.2 Microsection . 46
7.3.3 Insulation grip effectiveness . 47
7.3.4 Bending test (uninsulated crimp barrels with insulation grip) . 47
7.3.5 Bending test (pre-insulated crimp barrels with insulation grip) . 48
7.3.6 Bending test on splice crimped connections . 49
7.3.7 Vibration test . 49
7.4 Electrical tests . 50
7.4.1 Crimp resistance. 50
7.4.2 Voltage proof (crimped connection with pre-insulated crimp barrels) . 53
7.4.3 Current-carrying capacity test with temperature rise . 53
7.5 Climatic tests . 55
7.5.1 General . 55
7.5.2 Rapid change of temperature . 55
7.5.3 Dry heat . 56
7.5.4 Climatic sequence . 56
7.5.5 Current loading, cyclic . 57
7.5.6 Crimping at low temperature (crimped connections with pre-insulated
crimp barrels) . 61
7.6 Miscellaneous tests . 61
7.6.1 Fluid resistance of pre-insulated crimp barrels . 61
7.6.2 Flowing mixed gas corrosion test . 62
8 Test schedules . 62
8.1 General . 62
8.1.1 General . 62
8.1.2 Type A specimen (for testing according to 8.2, 8.2.3.3 if required, 8.3.2,
8.3.4 if required) . 63
8.1.3 Type B specimen (for tests according to 8.2.3.1 and 8.3.3.2) . 63
8.1.4 Type C specimen (for insulation grip effectiveness tests, see 8.2.3.3 and
8.3.4) . 64
8.1.5 Type D specimen (for testing of pre-insulated crimp barrels only, see
8.2.3.4, 8.3.9.2 and 8.3.9.3) . 65
8.1.6 Type E specimen (for tests according to 8.2.3.2, 8.2.3.4, 8.3.3.5) . 65
8.1.7 Type F specimen (for testing of pre-insulated crimp barrels according to
8.3.9.4) . 66
8.1.8 Type G specimen (for testing according to 8.2.3.2, 8.3.3.4, 8.3.3.5 and
8.3.6) . 66
8.1.9 Type H specimen (for testing according to 8.2.2, 8.2.3.1, 8.2.3.3, 8.3.2,
8.3.3.2, 8.3.3.3 and 8.3.4) . 67
8.1.10 Number of specimens required . 67
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IEC CDV 60352-2 © IEC 2023 – 4 – 48B/3053/CDV
8.2 Basic test schedule . 68
8.2.1 General . 68
8.2.2 Initial examination . 68
8.2.3 Testing of crimped connections . 69
8.3 Full test schedule . 71
8.3.1 General . 71
8.3.2 Initial examination . 71
8.3.3 Testing of crimped connections . 72
8.3.4 Testing of insulation grip effectiveness, test group F5 . 74
8.3.5 Testing of stability of splice crimped connections under bending . 74
8.3.6 Test group F7, if required . 74
8.3.7 Test group F8, if required . 75
8.3.8 Test group F9, if required . 75
8.3.9 Testing of crimped connections with pre-insulated crimp barrels . 75
8.4 Flow charts . 76
Annex A (informative) Practical guidance . 80
A.1 General information on crimped connections . 80
A.1.1 General . 80
A.1.2 Advantages of crimped connections . 80
A.1.3 Current-carrying capacity considerations . 80
A.2 Tool information . 81
A.3 Crimp barrel information . 81
A.3.1 General . 81
A.3.2 Materials . 82
A.3.3 Surface finishes . 83
A.3.4 Shapes of crimped connections . 83
A.4 Wire information. 85
A.4.1 General . 85
A.4.2 Conductor materials. 85
A.4.3 Conductor surface finishes . 85
A.4.4 Wire stripping information . 85
A.5 Crimped connection information . 88
A.5.1 General . 88
A.5.2 Additional information . 88
A.5.3 Crimped connections made with more than one wire in a crimp barrel . 92
A.5.4 Dimensions after crimping . 93
A.5.5 Conductor and crimp barrel materials and finishes selection . 93
A.6 Crimping process . 93
A.6.1 Crimping of contacts with open crimp barrel . 93
A.6.2 Crimping of contacts with open crimp barrel, loose piece contacts . 93
A.6.3 Processing instruction . 93
A.7 Correct crimped connections (additional information) . 94
A.7.1 Correct crimped connections of contacts with open crimp barrel . 94
A.7.2 Measuring of crimp height/depth . 95
A.7.3 Pull-out force . 96
A.8 Examination by microsection . 102
A.8.1 Microsection image creation . 102
A.8.2 Graphical representation of the microsection image requirements . 103
A.8.3 Microsection terminology . 103
A.8.4 Porosity ratio of crimped connections in microsections . 105
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IEC CDV 60352-2 © IEC 2023 – 5 – 48B/3053/CDV
A.8.5 Crimp compression ratio of the crimped connection in the microsection . 106
A.8.6 Ratio of crimp height to crimp width in the microsection . 106
A.8.7 Requirements for B-crimped connections in the microsection . 107
A.8.8 Condition of microsections . 108
A.8.9 Insulation grip . 110
A.9 Faults with crimped contacts having open crimp barrels . 111
A.10 Splices . 112
A.11 Crimp resistance test . 112
A.11.1 General . 112
A.11.2 Notes on specimen preparation and measurement . 115
A.12 General information about crimp contacts as part of a multipole connector . 116
A.12.1 Insertion of crimped contacts into the contact cavities of the connector
insert . 116
A.12.2 Removal of inserted contacts . 116
A.12.3 Mounting and bending of wire bundles/cables with crimped contacts . 117
A.12.4 Mating and unmating of multipole connectors with crimped contacts . 118
A.13 Final remarks . 118
Bibliography . 119
Figure 1 – Examples of crimp contact . 17
Figure 2 – Examples of splice . 18
Figure 3 – Example of insulation support . 18
Figure 4 – Examples of insulation grip . 19
Figure 5 – Examples of crimping tool . 19
Figure 6 – Example of positioner holding the crimp barrel . 20
Figure 7 – Example of positioner holding the stripped wire . 20
Figure 8 – Open crimp barrel . 21
Figure 9 – Closed crimp barrels . 22
Figure 10 – Pre-insulated crimp barrel . 22
Figure 11 – Crimping zones . 23
Figure 12 – Example of crimp funnel . 24
Figure 13 – Concentricity of wire insulation . 28
Figure 14 – Concentricity ratio of wire insulation . 28
Figure 15 – Diameter ratio when crimping wires with different single conductor strand
diameters . 31
Figure 16 – Examples of open stamped crimp contacts for automatic production . 31
Figure 17 – Stamped open B-crimp contact with anvil and punch shapes . 32
Figure 18 – Designations on open B-crimp contact . 32
Figure 19 – Examples of crimping dies (press dies) . 32
Figure 20 – Stamped closed crimp barrel (crimp cable lug) . 33
Figure 21 – Different crimp shapes . 33
Figure 22 – Examples of crimping dies for closed crimp barrels . 33
Figure 23 – Tubular cable lugs for class 5 conductors . 34
Figure 24 – Tubular cable lugs for class 6 conductors . 34
Figure 25 – Crimping process of 4-indent crimping with adjustable tools . 34
Figure 26 – Pre-insulated stamped close crimp barrel, area definitions . 35
Figure 27 – Pre-insulated closed crimp barrels of various designs . 35
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oSIST prEN IEC 60352-2:2023
IEC CDV 60352-2 © IEC 2023 – 6 – 48B/3053/CDV
Figure 28 – Examples of pre-insulated crimp cable lugs as strip parts . 35
Figure 29 – Uninsulated splice variants . 36
Figure 30 – Diameter ratio when crimping wires with different single conductor strand
diameters in splices . 37
Figure 31 – Crimp height measurement on open crimp barrel (B-crimp) . 40
Figure 32 – Crimp height measurement on closed crimp barrel (mandrel crimping) . 40
Figure 33 – Crimp height measurement on closed crimp barrel (4-indent crimping) . 40
Figure 34 – Example of holding and measuring points for contact deformation . 41
Figure 35 – Insulation distance and conductor overhang . 42
Figure 36 – Examples of insulation grip die shapes . 44
Figure 37 – Examples of insulation grip . 44
Figure 38 – Bending test of crimped connections with uninsulated crimp barrels . 48
Figure 39 – Bending test of crimped connections with pre-insulated crimp barrels . 48
Figure 40 – Bending test on splice crimped connections . 49
Figure 41 – Arrangement for vibration test . 50
Figure 42 – Test arrangement for measurement of crimp resistance . 50
Figure 43 – Measuring of crimp resistance of splice crimped connections . 51
Figure 45 – Crimp resistance R of crimped connections with copper barrels and
C
copper conductor (K = 1) . 52
Figure 46 – Test setup for temperature rise measurements under current load . 54
Figure 47 – Temperature chamber with ventilation opening for current-temperature
derating measurements . 55
Figure 48 – Examples of test arrangements . 59
Figure 49 – Test current for crimped connections . 60
Figure 50 – Examples of type A specimens . 63
Figure 51 – Examples of type B specimens . 64
Figure 52 – Examples of type C specimens . 64
Figure 53 – Example of type D specimen (pre-insulated) . 65
Figure 54 – Examples of type E specimen. 66
Figure 55 – Example of type F specimen . 66
Figure 56 – Type G specimen (splice) . 67
Figure 59 – Type H specimen (splice) . 67
Figure 58 – Basic test schedule (see 8.2) . 78
Figure 59 – Full test schedule (see 8.3) . 79
Figure A.1 – Open crimp barrels .
...
SLOVENSKI STANDARD
oSIST prEN IEC 60352-2:2022
01-december-2022
Spoji brez spajke - 2. del: Nespajkani stisnjeni spoji - Splošne zahteve, preskusne
metode in praktični napotki
Solderless connections - Part 2: Crimped connections - General requirements, test
methods and practical guidance
Lötfreie Verbindungen - Teil 2: Crimpverbindungen - Allgemeine Anforderungen,
Prüfverfahren und Anwendungshinweise
Connexions sans soudure - Partie 2: Connexions serties - Exigences générales,
méthodes d\'essai et guide pratique
Ta slovenski standard je istoveten z: prEN IEC 60352-2:2022
ICS:
29.120.20 Spojni elementi Connecting devices
31.220.10 Vtiči in vtičnice, konektorji Plug-and-socket devices.
Connectors
oSIST prEN IEC 60352-2:2022 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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oSIST prEN IEC 60352-2:2022
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oSIST prEN IEC 60352-2:2022
48B/2986/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 60352-2 ED3
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2022-10-07 2022-12-30
SUPERSEDES DOCUMENTS:
48B/2932/CD, 48B/2958/CC
IEC SC 48B : ELECTRICAL CONNECTORS
SECRETARIAT: SECRETARY:
United States of America Mr Jeffrey Toran
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
Other TC/SCs are requested to indicate their interest, if any, in this CDV
to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of any relevant patent rights of which they are
aware and to provide supporting documentation.
TITLE:
Solderless connections - Part 2: Crimped connections - General requirements, test methods and practical
guidance
PROPOSED STABILITY DATE: 2025
NOTE FROM TC/SC OFFICERS:
Copyright © 2022 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to download this electronic
file, to make a copy and to print out the content for the sole purpose of preparing National Committee positions. You may not copy
or "mirror" the file or printed version of the document, or any part of it, for any other purpose without permission in writing from IEC.
---------------------- Page: 3 ----------------------
oSIST prEN IEC 60352-2:2022
IEC CDV 60352-2/ED3 IEC:2022 – 2 – 48B/2986/CDV
1 CONTENTS
2 CONTENTS . 2
3 FOREWORD . 10
4 INTRODUCTION . 13
5 1 Scope . 14
6 2 Normative references . 14
7 3 Terms and definitions . 16
8 4 Workmanship . 24
9 5 Prerequisites for basic test schedule . 24
10 5.1 Classification by end-product class . 24
11 5.1.1 Class A – General electrical and electronics products . 24
12 5.1.2 Class B – Dedicated service electrical and electronics products . 25
13 5.1.3 Class C – High performance electrical and electronics products . 25
14 5.2 Prerequisites for tools . 25
15 5.3 Prerequisites for crimp barrels . 25
16 5.3.1 Crimp barrel materials . 25
17 5.3.2 Crimp barrel dimensions . 26
18 5.3.3 Crimp barrel surface finishes . 26
19 5.3.4 Crimp barrel design features . 26
20 5.4 Prerequisites for wires . 26
21 5.4.1 General . 26
22 5.4.2 Conductor materials . 26
23 5.4.3 Conductor dimensions . 27
24 5.4.4 Conductor surface finishes . 27
25 5.4.5 Wire insulation . 27
26 5.4.6 Wire stripping . 28
27 5.5 Prerequisites for crimped connections . 29
28 5.5.1 Compatibility of combination . 29
29 5.5.2 Conductor location . 29
30 5.5.3 Crimping location . 29
31 5.5.4 Contact deformation . 29
32 5.5.5 Prerequisites for crimped connections with more than one conductor in
33 the crimp barrel . 29
34 5.5.6 Adjustment of conductor cross-sectional area to the crimp barrel . 30
35 5.5.7 Crimp contacts and terminal ends . 30
36 5.5.8 Splice crimp barrels . 34
37 5.6 Prerequisites for splice crimped connections . 34
38 5.6.1 Conductor requirements for crimped splices . 35
39 6 Testing . 35
40 6.1 General . 35
41 6.2 Standard conditions for testing . 37
42 6.3 Pre-conditioning . 37
43 6.4 Recovery . 37
44 6.5 Mounting of the specimen . 37
45 7 Test methods and test requirements . 37
46 7.1 General examination of crimp barrels and wires . 37
47 7.2 Examination of crimp dimensions . 38
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oSIST prEN IEC 60352-2:2022
IEC CDV 60352-2/ED3 IEC:2022 – 3 – 48B/2986/CDV
48 7.2.1 Crimp height Ch, crimp width Cw and measurable crimp width Cwm . 38
49 7.2.2 Contact deformation after crimping . 39
50 7.2.3 Visual examination of insulation distance and conductor overhang . 40
51 7.2.4 Visual examination of splice crimped connections . 41
52 7.2.5 Visual examination of crimped connections on closed (machined) crimp
53 barrels . 41
54 7.2.6 Visual examination of crimped connections on B-crimp open crimp
55 barrels . 41
56 7.2.7 Visual examination of crimped connections with open crimp barrel with
57 insulation grip . 41
58 7.3 Mechanical tests . 43
59 7.3.1 Tensile strength . 43
60 7.3.2 Microsection . 44
61 7.3.3 Insulation grip effectiveness . 46
62 7.3.4 Bending test (uninsulated crimp barrels with insulation grip) . 46
63 7.3.5 Bending test (pre-insulated crimp barrels with insulation grip) . 46
64 7.3.6 Bending test on splice crimped connections . 47
65 7.3.7 Vibration test . 48
66 7.4 Electrical tests . 48
67 7.4.1 Crimp resistance . 48
68 7.4.2 Voltage proof (crimped connection with pre-insulated crimp barrels) . 52
69 7.4.3 Current-carrying capacity test with temperature rise . 52
70 7.5 Climatic tests . 53
71 7.5.1 General . 53
72 7.5.2 Rapid change of temperature . 54
73 7.5.3 Dry heat . 54
74 7.5.4 Climatic sequence . 54
75 7.5.5 Current loading, cyclic . 55
76 7.5.6 Crimping at low temperature (crimped connections with pre-insulated
77 crimp barrels) . 58
78 7.6 Miscellaneous tests . 59
79 7.6.1 Fluid resistance of pre-insulated crimp barrels . 59
80 7.6.2 Flowing mixed gas corrosion test . 59
81 8 Test schedules . 59
82 8.1 General . 59
83 8.1.1 Type A specimen (for testing according to 8.2, 8.2.3.3 if required, 8.3.2,
84 8.3.4 if required) . 60
85 8.1.2 Type B specimen (for tests according to 8.2.3.1 and 8.3.3.2) . 60
86 8.1.3 Type C specimen (for insulation grip effectiveness tests, see 8.2.3.3
87 and 8.3.4) . 61
88 8.1.4 Type D specimen (for testing of pre-insulated crimp barrels only, see
89 8.2.3.4, 8.3.9.2 and 8.3.9.3) . 62
90 8.1.5 Type E specimen (for tests according to 8.2.3.2, 8.2.3.4, 8.3.3.58.3.3.5) . 62
91 8.1.6 Type F specimen (for testing of pre-insulated crimp barrels according to
92 8.3.9.4) . 63
93 8.1.7 Type G specimen (for testing according to 8.2.3.2, 8.3.3.4, 8.3.3.5 and
94 8.3.6) . 64
95 8.1.8 Type H specimen (for testing according to 8.2.2, 8.2.3.1, 8.2.3.3, 8.3.2,
96 8.3.3.2, 8.3.3.3 and 8.3.4) . 64
97 8.1.9 Number of specimens required . 65
98 8.2 Basic test schedule . 65
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99 8.2.1 General . 65
100 8.2.2 Initial examination . 66
101 8.2.3 Testing of crimped connections . 66
102 8.3 Full test schedule . 69
103 8.3.1 General . 69
104 8.3.2 Initial examination . 69
105 8.3.3 Testing of crimped connections . 69
106 8.3.4 Testing of insulation grip effectiveness, test group F5 . 71
107 8.3.5 Testing of stability of splice crimped connections under bending . 72
108 8.3.6 Test group F7, if required . 72
109 8.3.7 Test group F8, if required . 73
110 8.3.8 Test group F9, if required . 73
111 8.3.9 Testing of crimped connections with pre-insulated crimp barrels . 73
112 8.4 Flow charts . 74
113 Annex A A (informative) Practical guidance . 77
114 A.1 General information on crimped connections . 77
115 A.1.1 General . 77
116 A.1.2 Advantages of crimped connections . 77
117 A.1.3 Current-carrying capacity considerations . 77
118 A.2 Tool information . 78
119 A.3 Crimp barrel information. 78
120 A.3.1 General . 78
121 A.3.2 Materials . 80
122 A.3.3 Surface finishes . 80
123 A.3.4 Shapes of crimped connections . 80
124 A.4 Wire information . 82
125 A.4.1 General . 82
126 A.4.2 Conductor materials . 82
127 A.4.3 Conductor surface finishes . 82
128 A.4.4 Wire stripping information . 82
129 A.5 Crimped connection information . 85
130 A.5.1 General . 85
131 A.5.2 Additional information . 85
132 A.5.3 Crimped connections made with more than one wire in a crimp barrel . 89
133 A.5.4 Dimensions after crimping . 90
134 A.5.5 Conductor and crimp barrel materials and finishes selection . 90
135 A.6 Crimping process . 90
136 A.6.1 Crimping of contacts with open crimp barrel . 90
137 A.6.2 Crimping of contacts with open crimp barrel, loose piece contacts . 90
138 A.6.3 Processing instruction. 90
139 A.7 Correct crimped connections (additional information) . 91
140 A.7.1 Correct crimped connections of contacts with open crimp barrel . 91
141 A.7.2 Measuring of crimp height/depth . 92
142 A.7.3 Pull-out force . 93
143 A.8 Examination by microsection . 99
144 A.8.1 Microsection image creation . 99
145 A.8.2 Graphical representation of the microsection image requirements. 100
146 A.8.3 Microsection terminology . 100
147 A.8.4 Porosity ratio of crimped connections in microsections . 102
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oSIST prEN IEC 60352-2:2022
IEC CDV 60352-2/ED3 IEC:2022 – 5 – 48B/2986/CDV
148 A.8.5 Crimp compression ratio of the crimped connection in the microsection . 103
149 A.8.6 Ratio of crimp height to crimp width in the microsection . 103
150 A.8.7 Requirements for B-crimped connections in the microsection . 104
151 A.8.8 Condition of microsections . 105
152 A.8.9 Insulation grip . 107
153 A.9 Faults with crimped contacts having open crimp barrels . 108
154 A.10 Splices . 108
155 A.11 Crimp resistance test . 109
156 A.12 General information about crimp contacts as part of a multipole connector . 113
157 A.12.1 Insertion of crimped contacts into the contact cavities of the connector
158 insert . 113
159 A.12.2 Removal of inserted contacts . 113
160 A.12.3 Mounting and bending of wire bundles/cables with crimped contacts . 114
161 A.12.4 Mating and unmating of multipole connectors with crimped contacts . 115
162 A.13 Final remarks . 115
163 Figure 1 – Examples of crimp contact . 17
164 Figure 3 – Example of insulation support . 18
165 Figure 4 – Examples of insulation grip . 18
166 Figure 5 – Examples of crimping tool . 19
167 Figure 6 – Example of positioner holding the crimp barrel . 19
168 Figure 7 – Example of positioner holding the stripped wire . 19
169 Figure 8 – Open crimp barrel . 21
170 Figure 9 – Closed crimp barrels . 21
171 Figure 10 – Pre-insulated crimp barrel . 21
172 Figure 11 – Crimping zones . 22
173 Figure 12 – Example of crimp funnel . 23
174 Figure 13 – Concentricity of wire insulation . 27
175 Figure 14 – Concentricity ratio of wire insulation . 27
176 Figure 15 – Diameter ratio when crimping wires with different single conductor strand
177 diameters . 30
178 Figure 16 – Examples of open stamped crimp contacts for automatic production . 30
179 Figure 17 – Stamped open B-crimp contact with anvil and punch shapes . 31
180 Figure 18 – Designations on open B-crimp contact . 31
181 Figure 19 – Examples of crimping dies (press dies) . 31
182 Figure 20 – Stamped closed crimp barrel (crimp cable lug) . 32
183 Figure 21 – Different crimp shapes . 32
184 Figure 22 – Examples of crimping dies for closed crimp barrels . 32
185 Figure 23 – Tubular cable lugs for class 5 conductors . 32
186 Figure 24 – Tubular cable lugs for class 6 conductors . 33
187 Figure 25 – Crimping process of 4-indent crimping with adjustable tools . 33
188 Figure 26 – Pre-insulated stamped close crimp barrel, area definitions . 33
189 Figure 28 – Examples of pre-insulated crimp cable lugs as strip parts . 34
190 Figure 29 – Uninsulated splice variants . 34
191 Figure 30 – Diameter ratio when crimping wires with different single conductor strand
192 diameters in splices . 35
193 Figure 31 – Crimp height measurement on open crimp barrel (B-crimp) . 39
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oSIST prEN IEC 60352-2:2022
IEC CDV 60352-2/ED3 IEC:2022 – 6 – 48B/2986/CDV
194 Figure 32 – Crimp height measurement on closed crimp barrel (mandrel crimping) . 39
195 Figure 33 – Crimp height measurement on closed crimp barrel (4-indent crimping) . 39
196 Figure 34 – Example of holding and measuring points for contact deformation . 40
197 Figure 35 – Insulation distance and conductor overhang . 41
198 Figure 36 – Examples of insulation grip die shapes . 42
199 Figure 37 – Examples of insulation grip. 42
200 Figure 38 – Bending test of crimped connections with uninsulated crimp barrels . 46
201 Figure 39 – Bending test of crimped connections with pre-insulated crimp barrels . 47
202 Figure 40 – Bending test on splice crimped connections . 47
203 Figure 41 – Arrangement for vibration test . 48
204 Figure 42 – Test arrangement for measurement of crimp resistance . 49
205 Figure 43 – Formula for the crimp resistance of a crimped connection . 49
206 Figure 44– Measuring of crimp resistance of spliced crimp connections . 49
207 Figure 45 – Formula for crimp resistance of a spliced crimp connection . 49
208 Figure 46 – Crimp resistance RC of crimped connections with copper barrels and
209 copper conductor (K = 1) . 51
210 Figure 47 – Test setup for temperature rise measurements under current load . 52
211 Figure 48 – Formula for end temperature . 52
212 Figure 49 – Temperature chamber with ventilation opening for current-termperature
213 derating measurments . 53
214 Figure 50a – Example of cable lug (testing only the crimp). 55
215 Figure 50b – Example of B-crimp contact (testing only the crimp) . 56
216 Figure 50c – Example of crimp barrels with terminal ends . 56
217 Figure 50d – Example of crimp barrels with separable contacts . 56
218 Figure 50e – Example of crimped connections with contacts of a multi-contact
219 component (for example terminal block or connector) . 56
220 Figure 50 – Examples of test arrangements . 56
221 Figure 51 – Test current for crimped connections . 57
222 Figure 52 – Examples of type A specimens . 60
223 Figure 53 – Examples of type B specimens . 61
224 Figure 54 – Examples of type C specimens . 62
225 Figure 55 – Example of type D specimen (pre-insulated). 62
226 Figure 56 – Examples of type E specimen . 63
227 Figure 57 – Example of type F specimen . 63
228 Figure 58 – Type G specimen (splice) . 64
229 Figure 59 – type H specimen (splice) .
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