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ASTM E3064-16

(Test Method)

Standard Test Method for Evaluating the Performance of Optical Tracking Systems that Measure Six Degrees of Freedom (6DOF) Pose

Standard Test Method for Evaluating the Performance of Optical Tracking Systems that Measure Six Degrees of Freedom (6DOF) Pose

SIGNIFICANCE AND USE
5.1 Optical tracking systems are used in a wide range of fields including: video gaming, filming, neuroscience, biomechanics, flight/medical/industrial training, simulation, robotics, and automotive applications.  
5.2 This standard provides a common set of metrics and a test procedure for evaluating the performance of optical tracking systems and may help to drive improvements and innovations of optical tracking systems.  
5.3 Potential users often have difficulty comparing optical tracking systems because of the lack of standard performance metrics and test methods, and therefore must rely on the claims of a vendor regarding the system’s performance, capabilities, and suitability for a particular application. This standard makes it possible for a user to assess and compare the performance of candidate optical tracking systems, and allows the user to determine if the measured performance results are within the specifications with regard to the application requirements.
SCOPE
1.1 Purpose—This test method presents metrics and procedures for measuring, analyzing, and reporting the relative pose error of optical tracking systems that compute the pose (that is, position and orientation) of a rigid object while the object is moving.  
1.2 Usage—System vendors may use this test method to determine the performance of their Six Degrees of Freedom (6 DOF) optical tracking system which measures pose. This test method also provides a uniform way to report the measurement errors and measurement capability of the system. System users may use this test method to verify that the system’s performance is within the user’s specific requirements and within the system’s rated performance.  
1.3 Test Location—The procedures defined in this standard shall be performed in a facility in which the environmental conditions are within the optical tracking system’s rated conditions.  
1.4 Test Volume—This standard shall be used for testing an optical tracking system working volumes of 3000 mm long by 2000 mm wide by 2000 mm high, 6000 mm long by 4000 mm wide by 2000 mm high, or 12 000 mm long by 8000 mm wide by 2000 mm high.  
1.5 Units—The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
1.6 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

Status
Published
Publication Date
31-May-2016
ICS
17.180.30 - Optical measuring instruments
Technical Committee
E57 - 3D Imaging Systems
Drafting Committee
E57.50 - Optical Tracking Systems
Current Stage
Ref Project

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ASTM E3064-16 - Standard Test Method for Evaluating the Performance of Optical Tracking Systems that Measure Six Degrees of Freedom (6DOF) PoseASTM E3064-16 - Standard Test Method for Evaluating the Performance of Optical Tracking Systems that Measure Six Degrees of Freedom (6DOF) Pose
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ASTM E3064-16 - Standard Test Method for Evaluating the Performance of Optical Tracking Systems that Measure Six Degrees of Freedom (6DOF) Pose
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This international standard was developed in accordance with internationally recognized principles on standardization established in the Decision on Principles for the
Development of International Standards, Guides and Recommendations issued by the World Trade Organization Technical Barriers to Trade (TBT) Committee.
Designation: E3064 − 16
Standard Test Method for
Evaluating the Performance of Optical Tracking Systems
1
that Measure Six Degrees of Freedom (6DOF) Pose
This standard is issued under the fixed designation E3064; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope mendations issued by the World Trade Organization Technical
Barriers to Trade (TBT) Committee.
1.1 Purpose—This test method presents metrics and proce-
dures for measuring, analyzing, and reporting the relative pose
2. Referenced Documents
errorofopticaltrackingsystemsthatcomputethepose(thatis,
2
2.1 ASTM Standards:
position and orientation) of a rigid object while the object is
E2919Test Method for Evaluating the Performance of
moving.
Systems that Measure Static, Six Degrees of Freedom
1.2 Usage—System vendors may use this test method to
(6DOF), Pose
determine the performance of their Six Degrees of Freedom (6
E177Practice for Use of the Terms Precision and Bias in
DOF) optical tracking system which measures pose. This test
ASTM Test Methods
methodalsoprovidesauniformwaytoreportthemeasurement
3
2.2 ASME Standard:
errorsandmeasurementcapabilityofthesystem.Systemusers
B89.4.19Performance Evaluation of Laser-Based Spherical
may use this test method to verify that the system’s perfor-
Coordinate Measurement Systems
manceiswithintheuser’sspecificrequirementsandwithinthe
4
2.3 ISO/IEC Standards:
system’s rated performance.
ISO/IEC Guide 99:2007 International Vocabulary of
1.3 Test Location—The procedures defined in this standard
Metrology—Basic and General Concepts and Associated
shall be performed in a facility in which the environmental
Terms (VIM: 2007)
conditions are within the optical tracking system’s rated
ISO/IEC Guide 98–3:2008Uncertainty of measurement—
conditions.
Part 3: Guide to the expression of uncertainty in measure-
1.4 Test Volume—This standard shall be used for testing an
ment (GUM: 1995)
optical tracking system working volumes of 3000 mm long by
IEC 60050-300:2001 International Electro technical
2000 mm wide by 2000 mm high, 6000 mm long by 4000 mm
Vocabulary—Electrical and electronic measurements and
wide by 2000 mm high, or 12 000 mm long by 8000 mm wide
measuring instruments
by 2000 mm high.
JCGM 200:2012International Vocabulary of Metrology Ba-
sic and General Concepts and Associated Terms (VIM),
1.5 Units—The values stated in SI units are to be regarded
3rd edition
asstandard.Nootherunitsofmeasurementareincludedinthis
standard.
3. Terminology
1.6 This standard does not purport to address all of the
3.1 Definitions:
safety concerns, if any, associated with its use. It is the
3.1.1 degrees of freedom, DOF, n—any of the minimum
responsibility of the user of this standard to establish appro-
number of translation or rotation components required to
priate safety, health, and environmental practices and deter-
specify completely the pose of a rigid object. E2919
mine the applicability of regulatory limitations prior to use.
3.1.1.1 Discussion—
1.7 This international standard was developed in accor-
dance with internationally recognized principles on standard-
ization established in the Decision on Principles for the
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
Development of International Standards, Guides and Recom-
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website.
1 3
This test method is under the jurisdiction of ASTM Committee E57 on 3D Available from American Society of Mechanical Engineers (ASME), ASME
ImagingSystemsandisthedirectresponsibilityofSubcommitteeE57.50onOptical International Headquarters, Two Park Ave., New York, NY 10016-5990, http://
Tracking Systems. www.asme.org.
4
Current edition approved June 1, 2016. Published June 2016. DOI: 10.1520/ Available fromAmerican National Standards Institute (ANSI), 25 W. 43rd St.,
E3064-16 4th Floor, New York, NY 10036, http://www.ansi.org.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1

---------------------- Page: 1 ----------------------
E3064 − 16
(1)In a 3D space, a rigid object can have at most 6DOF,
three translations and three rotations.
(2)The term “degree of freedom” is also used with regard
to statistical testing. It will be clear from the context in which
it is used whether the term rel
...

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This practice describes the photomultiplier properties that are essential to their judicious selection and use of in emission and absorption spectrometry. The properties covered here include structural features, electrical properties, and characteristics involved in precautions and problems. The structural features covered are envelope configurations, window materials, electrical connections, and housing for the external structure, and the photocathode, dynodes and anode, and rigidness of structural components for the internal structure. Electrical properties, on the other hand, incorporate the following: optical-electronic characteristics of the photocathode including spectral response; current amplification including gain per stage, overall gain, gain control (voltage-divider bridge), linearity of response, and anode saturation; signal nature; dark current including cathode size, internal aperture, and refrigeration effects; noise nature including additivity of noise power, signal-to-noise ratio, equivalent noise input; and photomultiplier properties as a component in an electrical circuit including output impedance, response time, and signal gating and integration possibilities. Finally, the characteristics involved in precautions and problems cover fatigue and hysteresis effects, illumination of photocathode, and gas leakage.
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4.1 Wavenumber calibration is an important part of Raman analysis. The calibration of a Raman spectrometer is performed or checked frequently in the course of normal operation and even more often when working at high resolution. To date, the most common source of wavenumber values is either emission lines from low-pressure discharge lamps (for example, mercury, argon, or neon) or from the non-lasing plasma lines of the laser. There are several good compilations of these well-established values (1-8).3 The disadvantages of using emission lines are that it can be difficult to align lamps properly in the sample position and the laser wavelength must be known accurately. With argon, krypton, and other ion lasers commonly used for Raman the latter is not a problem because lasing wavelengths are well known. With the advent of diode lasers and other wavelength-tunable lasers, it is now often the case that the exact laser wavelength is not known and may be difficult or time-consuming to determine. In these situations it is more convenient to use samples of known relative wavenumber shift for calibration. Unfortunately, accurate wavenumber shifts have been established for only a few chemicals. This guide provides the Raman spectroscopist with average shift values determined in seven laboratories for seven pure compounds and one liquid mixture.
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1.3 Some of the chemicals specified in this guide may be hazardous. It is the responsibility of the user of this guide to consult material safety data sheets and other pertinent information to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to their use.  
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Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer

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4.1 This practice describes the essential components of a wavelength dispersive X-ray spectrometer. This description is presented so that the user may gain a general understanding of the structure of an X-ray spectrometer system. It also provides a means for comparing and evaluating different systems as well as understanding the capabilities and limitations of each instrument.  
4.2 A laboratory may implement this practice or an X-ray fluorescence method in partnership with a manufacturer of the analytical instrumentation. If a laboratory chooses to consult with an instrument manufacturer, then the following should be considered. The laboratory should know the alloy matrices to be analyzed, elements and mass fraction ranges to be determined, and the expected performance requirements for each of these elements. The laboratory should inform the instrument manufacturer of these requirements so an analytical method may be developed which meets the laboratory’s expectations. Typically, instrument manufacturers customize the instrument configuration to satisfy the end-user’s requirements for elemental coverage, elemental precision, and detection limits. Instrument manufacturer developed analytical methods may include specific parameters for sample excitation, wavelengths, inter-element interference corrections, calibration and regression, equipment configuration/installation, and sample preparation requirements. Laboratories should have a basic understanding of the parameters derived by the manufacturer.
SCOPE
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1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety, health, and environmental practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 7.  
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4.1 This practice permits an analyst to compare the performance of an instrument to the manufacturer's supplied performance specifications and to verify its suitability for continued routine use. It also provides generation of calibration monitoring data on a periodic basis, forming a base from which any changes in the performance of the instrument will be evident.
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1.1 This practice covers the parameters of spectrophotometric performance that are critical for testing the adequacy of instrumentation for most routine tests and methods2 within the wavelength range of 200 nm to 700 nm and the absorbance range of 0 to 2. The recommended tests provide a measurement of the important parameters controlling results in spectrophotometric methods, but it is specifically not to be inferred that all factors in instrument performance are measured.  
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1.4 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.  
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Standard Test Method for Estimating Stray Radiant Power Ratio of Dispersive Spectrophotometers by the Opaque Filter Method

SIGNIFICANCE AND USE
5.1 Stray radiant power can be a significant source of error in spectrophotometric measurements. SRP usually increases with the passage of time; therefore, testing should be performed periodically. Moreover, the SRPR test is an excellent indicator of the overall condition of a spectrophotometer. A control-chart record of the results of routinely performed SRPR tests can be a useful indicator of need for corrective action or, at least, of the changing reliability of critical measurements.  
5.2 This test method provides a means of determining the stray radiant power ratio of a spectrophotometer at selected wavelengths in a spectral range, as determined by the SRP filter used, thereby revealing those wavelength regions where significant photometric errors might occur. It does not provide a means of calculating corrections to indicated absorbance (or transmittance) values. The test method must be used with care and understanding, as erroneous results can occur, especially with respect to some modern grating instruments that incorporate moderately narrow bandpass SRP-blocking filters. This test method does not provide a basis for comparing the performance of different spectrophotometers.
Note 8: Kaye (3) discusses correction methods of measured transmittances (absorbances) that sometimes can be used if sufficient information on the properties and performance of the instrument can be acquired. See also A1.2.5.  
5.3 This test method describes the performance of a spectrophotometer in terms of the specific test parameters used. When an analytical sample is measured, absorption by the sample of radiation outside of the nominal bandpass at the analytical wavelength can cause a photometric error, underestimating the transmittance or overestimating the absorbance, and correspondingly underestimating the SRPR.  
5.4 The SRPR indicated by this test method using SRP filters is almost always an underestimation of the true value (see 1.3). A value cited in a manufacturer’s li...
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1.1 Stray radiant power (SRP) can be a significant source of error in spectrophotometric measurements, and the danger that such error exists is enhanced because its presence often is not suspected (1-4).2 This test method affords an estimate of the relative radiant power, that is, the Stray Radiant Power Ratio (SRPR), at wavelengths remote from those of the nominal bandpass transmitted through the monochromator of an absorption spectrophotometer. Test-filter materials are described that discriminate between the desired wavelengths and those that contribute most to SRP for conventional commercial spectrophotometers used in the ultraviolet, the visible, the near infrared, and the mid-infrared ranges. These procedures apply to instruments of conventional design, with usual sources, detectors, including array detectors, and optical arrangements. The vacuum ultraviolet and the far infrared present special problems that are not discussed herein.
Note 1: Research (3) has shown that particular care must be exercised in testing grating spectrophotometers that use moderately narrow bandpass SRP-blocking filters. Accurate calibration of the wavelength scale is critical when testing such instruments. Refer to Practice E275.  
1.2 These procedures are neither all-inclusive nor infallible. Because of the nature of readily available filter materials, with a few exceptions, the procedures are insensitive to SRP of very short wavelengths in the ultraviolet, or of lower frequencies in the infrared. Sharp cutoff longpass filters are available for testing for shorter wavelength SRP in the visible and the near infrared, and sharp cutoff shortpass filters are available for testing at longer visible wavelengths. The procedures are not necessarily valid for “spike” SRP nor for “nearby SRP.” (See Annexes for general discussion and definitions of these terms.) However, they are adequate in most cases and for typical applications. They do cover...

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