ASTM F1262M-95(2008)

Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)

SIGNIFICANCE AND USE
Digital logic circuits are used in system applications where they are exposed to pulses of radiation. It is important to know the minimum radiation level at which transient failures can be induced, since this affects system operation.
SCOPE
1.1 This guide is to assist experimenters in measuring the transient radiation upset threshold of silicon digital integrated circuits exposed to pulses of ionizing radiation greater than 103 Gy (Si)/s.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

• Status: Historical
• Publication Date: 14-Jun-2008
• Technical Committee: F01 - Electronics
• Drafting Committee: F01.11 - Nuclear and Space Radiation Effects

Relations

• Replaces: ASTM F1262M-95(2002) - Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
• Effective Date: 15-Jun-2008

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation: F1262M − 95(Reapproved 2008)
Standard Guide for
Transient Radiation Upset Threshold Testing of Digital
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Integrated Circuits (Metric)
This standard is issued under the fixed designation F1262M; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 3.1.1 combinational logic—A digital logic system with the
property that its output state at a given time is solely deter-
1.1 This guide is to assist experimenters in measuring the
mined by the logic signals at its inputs at the same time (except
transient radiation upset threshold of silicon digital integrated
3 for small time delays caused by the propagation delay of
circuits exposed to pulses of ionizing radiation greater than 10
internal logic elements).
Gy (Si)/s.
3.1.1.1 Discussion—Combinational circuits contain no in-
1.2 This standard does not purport to address all of the
ternal storage elements. Hence, the output signals are not a
safety concerns, if any, associated with its use. It is the
functionofanysignalsthatoccurredatpasttimes.Examplesof
responsibility of the user of this standard to establish appro-
combinational circuits include gates, adders, multiplexers and
priate safety and health practices and determine the applica-
decoders.
bility of regulatory limitations prior to use.
3.1.2 complex circuit response mechanisms—For medium
scale integration (MSI) and higher devices it is useful to define
2. Referenced Documents
three different categories of devices in terms of their internal
2
2.1 ASTM Standards:
design and radiation response mechanisms.
E666 Practice for CalculatingAbsorbed Dose From Gamma
3.1.3 over-stressed device—A device that has conducted
or X Radiation
more than the manufacturer’s specified maximum current, or
E668 Practice for Application of Thermoluminescence-
dissipated more than the manufacturer’s specified maximum
Dosimetry (TLD) Systems for Determining Absorbed
power.
Dose in Radiation-HardnessTesting of Electronic Devices
3.1.3.1 Discussion—In this case the DUT is considered to
F867M Guide or Ionizing Radiation Effects (Total Dose)
be overstressed even if it still meets all of the manufacturer’s
Testing of Semiconductor Devices [Metric] (Withdrawn
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specifications. Because of the overstress, the device should be
1998)
evaluated before using it in any high reliability application.
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2.2 Military Standards:
3.1.4 sequential logic—A digital logic system with the
Method 1019 in MIL-STD-883. Steady-State Total Dose
property that its output state at a given time depends on the
Irradiation Procedure
sequence and time relationship of logic signals that were
Method 1021 in MIL-STD-883. Dose Rate Threshold for
previously applied to its inputs.
Upset of Digital Microcircuits.
3.1.4.1 Discussion—Examples of sequential logic circuits
3. Terminology include flip-flops, shift registers, counters, and arithmetic logic
units.
3.1 Definitions:
3.1.5 state vector—A state vector completely specifies the
logic condition of all elements within a logic circuit.
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This guide is under the jurisdiction of ASTM Committee F01 on Electronics
3.1.5.1 Discussion—For combinational circuits, the state
and is the direct responsibility of Subcommittee F01.11 on Nuclear and Space
vector includes the logic signals that are applied to all inputs:
Radiation Effects.
for sequential circuits, the state vector must also include the
Current edition approved June 15, 2008. Published July 2008. Originally
approved in 1995. Last previous edition approved in 2002 as F1262M – 95(2002).
sequence and time relationship of all input signals. In this
DOI: 10.1520/F1262M-95R08.
guide the output states will also be considered part of the state
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or
vector definition. For example, an elementary 4-input NAND
contact ASTM Customer Service at [e-mail]. For Annual Book of ASTM
gate has 16 possible state vectors, 15 of which result in the
Standards volume information, refer to the standard’s Document Summary page on
the ASTM website.
same output condition (“1” state). A 4-bit counter has 16
3
Withdrawn. The last approved version of this historical standard is referenced
possible output conditions, but many more state vectors be-
on www.astm.org.
4
cause of its dependence on the dynamic relationship of various
Available from Standardization Documents Order Desk, Bldg. 4, Section D,
700 Robbins Ave., Philadelphia, PA 19111-5094, Attn: NPODS. input signals.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
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