ASTM E668-00

Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices

SCOPE
1.1 This practice covers procedures for the use of thermoluminescence dosimeters (TLDs) to determine the absorbed dose in a material irradiated by ionizing radiation. Although some elements of the procedures have broader application, the specific area of concern is radiation-hardness testing of electronic devices. This practice is applicable to the measurement of absorbed dose in materials irradiated by gamma rays, X rays, and electrons of energies from 12 to 60 MeV. Specific energy limits are covered in appropriate sections describing specific applications of the procedures. The range of absorbed dose covered is approximately from 10 -2  to 104 Gy (1 to 106 rad), and the range of absorbed dose rates is approximately from 10 -2  to 10 10  Gy/s (1 to 10 12  rad/s). Absorbed dose and absorbed dose-rate measurements in materials subjected to neutron irradiation are not covered in this practice. Further, the portion of these procedures that deal with electron irradiation are primarily intended for use in parts testing. Testing of devices as a part of more massive components such as electronics boards or boxes may require techniques outside the scope of this practice.  Note 1-The purpose of the upper and lower limits on the energy for electron irradiation is to approach a limiting case where dosimetry is simplified. Specifically, the dosimetry methodology specified requires that the following three limiting conditions be approached: (a) energy loss of the primary electrons is small, (b) secondary electrons are largely stopped within the dosimeter, and (c) bremsstrahlung radiation generated by the primary electrons is largely lost.
1.2 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

• Status: Historical
• Publication Date: 09-Jun-2000
• ICS: 31.020 - Electronic components in general
• Technical Committee: E10 - Nuclear Technology and Applications
• Drafting Committee: E10.07 - Radiation Dosimetry for Radiation Effects on Materials and Devices

Relations

• Replaced By: ASTM E668-05 - Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
• Effective Date: 01-Jun-2005
• Referred By: ASTM E1249-15(2021) - Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources
• Effective Date: 10-Jun-2000
• Referred By: ASTM E1894-18 - Standard Guide for Selecting Dosimetry Systems for Application in Pulsed X-Ray Sources
• Effective Date: 10-Jun-2000
• Referred By: ASTM F1190-18 - Standard Guide for Neutron Irradiation of Unbiased Electronic Components
• Effective Date: 10-Jun-2000
• Referred By: ASTM ISO/ASTM51026-15 - Standard Practice for Using the Fricke Dosimetry System
• Effective Date: 10-Jun-2000
• Referred By: ASTM ISO/ASTM51956-13 - Standard Practice for Use of Thermoluminescence-Dosimetry (TLD) Systems for Radiation Processing
• Effective Date: 10-Jun-2000
• Referred By: ASTM E1250-15(2020) - Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
• Effective Date: 10-Jun-2000
• Referred By: ASTM F744M-16 - Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)
• Effective Date: 10-Jun-2000
• Referred By: ASTM F448-18 - Standard Test Method for Measuring Steady-State Primary Photocurrent
• Effective Date: 10-Jun-2000
• Referred By: ASTM F996-11(2018) - Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current–Voltage Characteristics (Withdrawn 2023)
• Effective Date: 10-Jun-2000
• Referred By: ASTM F1893-18 - Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices (Withdrawn 2023)
• Effective Date: 10-Jun-2000
• Referred By: ASTM ISO/ASTM51631-20 - Standard Practice for Use of Calorimetric Dosimetry Systems for Dose Measurements and Routine Dosimetry System Calibration in Electron Beams
• Effective Date: 10-Jun-2000
• Referred By: ASTM F1467-18 - Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
• Effective Date: 10-Jun-2000
• Referred By: ASTM ISO/ASTM51538-17 - Standard Practice for Use of the Ethanol-Chlorobenzene Dosimetry System
• Effective Date: 10-Jun-2000
• Referred By: ASTM F1892-12(2018) - Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
• Effective Date: 10-Jun-2000

Standards Content (Sample)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation:E668–00
Standard Practice for
Application of Thermoluminescence-Dosimetry (TLD)
Systems for Determining Absorbed Dose in Radiation-
1
Hardness Testing of Electronic Devices
This standard is issued under the fixed designation E668; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope E170 Terminology Relating to Radiation Measurements
2
and Dosimetry
1.1 This practice covers procedures for the use of thermolu-
E380 Practice for Use of the International System of Units
minescencedosimeters(TLDs)todeterminetheabsorbeddose
3
(SI) (the Modernized Metric System)
in a material irradiated by ionizing radiation. Although some
E665 Practice for Determining Absorbed Dose Versus
elements of the procedures have broader application, the
Depth in Materials Exposed to the X-ray Output of Flash
specific area of concern is radiation-hardness testing of elec-
2
X-Ray Machines
tronic devices. This practice is applicable to the measurement
E666 PracticeforCalculatingAbsorbedDosefromGamma
of absorbed dose in materials irradiated by gamma rays, X
2
or X Radiation
rays, and electrons of energies from 12 to 60 MeV. Specific
2.2 International Commission on Radiation Units and
energy limits are covered in appropriate sections describing
Measurements (ICRU) Reports:
specific applications of the procedures. The range of absorbed
−2 4 6
ICRU Report 14—Radiation Dosimetry: X Rays and
dose covered is approximately from 10 to 10 Gy (1 to 10
Gamma Rays with Maximum Photon Energies Between
rad), and the range of absorbed dose rates is approximately
4
−2 10 12
0.6 and 50 MeV
from 10 to 10 Gy/s (1 to 10 rad/s). Absorbed dose and
ICRU Report 17—Radiation Dosimetry: X Rays Generated
absorbed dose-rate measurements in materials subjected to
4
at Potentials of 5 to 150 keV
neutronirradiationarenotcoveredinthispractice.Further,the
ICRUReport 21—RadiationDosimetry:ElectronswithIni-
portion of these procedures that deal with electron irradiation
4
tial Energies Between 1 and 50 MeV
are primarily intended for use in parts testing. Testing of
ICRU Report 31—Average Energy Required to Produce an
devices as a part of more massive components such as
4
Ion Pair
electronics boards or boxes may require techniques outside the
4
ICRU Report 33—Radiation Quantities and Units
scope of this practice.
4
ICRU Report 34—The Dosimetry of Pulsed Radiation
NOTE 1—The purpose of the upper and lower limits on the energy for
ICRU Report 37—Stopping Powers for Electrons and
electron irradiation is to approach a limiting case where dosimetry is
4
Positrons
simplified.Specifically,thedosimetrymethodologyspecifiedrequiresthat
the following three limiting conditions be approached: (a) energy loss of
3. Terminology
the primary electrons is small, (b) secondary electrons are largely stopped
3.1 Definitions:
within the dosimeter, and (c) bremsstrahlung radiation generated by the
primary electrons is largely lost. 3.1.1 absorbed dose, D—thequotientofde¯bydm,wherede¯
isthemeanenergyimpartedbyionizingradiationtothematter
1.2 This standard dose not purport to address all of the
in a volume element and dm is the mass of matter in that
safety concerns, if any, associated with its use. It is the
volume element.
responsibility of the user of this standard to establish appro-
priate safety and health practices and determine the applica- de¯
D 5 (1)
dm
bility of regulatory limitations prior to use.
Previously, the special unit of absorbed dose was the rad;
2. Referenced Documents
however, the gray (Gy) has been adopted as the official SI unit
2.1 ASTM Standards:
(see Practice E380).
1
This practice is under the jurisdiction of ASTM Committee E10 on Nuclear
2
Technology and Applications and is the direct responsibility of Subcommittee Annual Book of ASTM Standards, Vol 12.02.
3
E10.07 on Radiation Dosimetry for Radiation Effects on Materials and Devices. Annual Book of ASTM Standards, Vol 14.02.
4
Current edition approved June 10, 2000. Published July 2000. Originally Available from International Commission on Radiation Units and Measure-
published as E668–78. Last previous edition E668–97. ments, 7910, Woodmont Ave., Suite 800, Bethesda, MD 20814.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
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E668
21 2
3.1.11 test conditions—the normal environmental condi-
1Gy 51J·kg 510 rad (2)
tions prevailing during routine hardness-test irradiations such
3.1.2 absorbed-dose rate—the absorbed dose per unit time
as the ambient temperature, humidity, and lightin
...