Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry

SIGNIFICANCE AND USE
This document will be of use to forensic laboratory personnel who are involved in the analysis of GSR samples by SEM/EDS (4).
SEM/EDS analysis of GSR is a non-destructive method that provides (5, 6) both morphological information and the elemental profiles of individual particles.  
Particle analysis contrasts with bulk sample methods, such as atomic absorption spectrophotometry (AAS) (7), neutron activation analysis (NAA) (8), inductively coupled plasma atomic emission spectrometry (ICP-AES), and inductively coupled plasma mass spectrometry (ICP-MS), where the sampled material is dissolved or extracted prior to the determination of total element concentrations, thereby sacrificing morphological information and individual particle identification.  
X-ray fluorescence spectrometry (XRF) is a technique that has been used to map the placement and distribution of GSR particles surrounding bullet holes in order to establish shooting distances (9). Unlike the solution-based bulk methods of analysis, XRF is non-destructive; however, XRF still does not provide morphological information and is incapable of individual GSR particle identification.
SCOPE
1.1 This guide covers the analysis of gunshot residue (GSR) by scanning electron microscopy/energy-dispersive X-ray spectrometry (SEM/EDS) by manual and automated methods. The analysis may be performed manually, with the operator manipulating the microscope controls and the EDS system software, or in an automated fashion, where some amount of the analysis is controlled by pre-set software functions.
1.2 Since software and hardware formats vary among commercial systems, guidelines will be offered in the most general terms possible. For proper terminology and operation, consult the SEM/EDS system manuals for each system.
1.3 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.
1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

Status
Historical
Publication Date
31-May-2010
Technical Committee
Drafting Committee
Current Stage
Ref Project

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NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
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´1
Designation: E1588 − 10
StandardGuide for
Gunshot Residue Analysis by Scanning Electron
1
Microscopy/Energy Dispersive X-Ray Spectrometry
This standard is issued under the fixed designation E1588; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1
´ NOTE—Sections 7.1.5.2 and 7.2.1.2 were editorially corrected in July 2010.
1. Scope 3. Significance and Use
3.1 This document will be of use to forensic laboratory
1.1 This guide covers the analysis of gunshot residue (GSR)
personnel who are involved in the analysis of GSR samples by
by scanning electron microscopy/energy-dispersive X-ray
SEM/EDS (4).
spectrometry (SEM/EDS) by manual and automated methods.
The analysis may be performed manually, with the operator
3.2 SEM/EDS analysis of GSR is a non-destructive method
manipulating the microscope controls and the EDS system
that provides (5, 6) both morphological information and the
software, or in an automated fashion, where some amount of
elemental profiles of individual particles.
the analysis is controlled by pre-set software functions.
3.3 Particle analysis contrasts with bulk sample methods,
1.2 Since software and hardware formats vary among com-
such as atomic absorption spectrophotometry (AAS) (7), neu-
mercial systems, guidelines will be offered in the most general
tronactivationanalysis(NAA) (8),inductivelycoupledplasma
terms possible. For proper terminology and operation, consult
atomic emission spectrometry (ICP-AES), and inductively
the SEM/EDS system manuals for each system.
coupled plasma mass spectrometry (ICP-MS), where the
sampled material is dissolved or extracted prior to the deter-
1.3 The values stated in SI units are to be regarded as
mination of total element concentrations, thereby sacrificing
standard. No other units of measurement are included in this
morphological information and individual particle identifica-
standard.
tion.
1.4 This standard does not purport to address all of the
3.4 X-ray fluorescence spectrometry (XRF) is a technique
safety concerns, if any, associated with its use. It is the
that has been used to map the placement and distribution of
responsibility of the user of this standard to establish appro-
GSR particles surrounding bullet holes in order to establish
priate safety and health practices and determine the applica-
shooting distances (9). Unlike the solution-based bulk methods
bility of regulatory limitations prior to use.
of analysis, XRF is non-destructive; however, XRF still does
not provide morphological information and is incapable of
2. Summary of Practice
individual GSR particle identification.
2.1 From the total population of particles collected, those
that are detected by SEM to be within the limits of certain
4. Sample Preparation
parameters (for example, atomic number, size, or shape) are
4.1 Once the evidence seal is broken, care should be taken
2
analyzed by EDS (1-3). Typically, particles composed of high
sothatnoobjecttouchesthesurfaceoftheadhesiveSEM/EDS
mean atomic number elements are detected by their SEM
sample collection stub and that the stub is not left uncovered
backscattered electron signals and an EDS spectrum is ob-
any longer than is reasonable for transfer, mounting, or
tained from each. The EDS spectrum is evaluated for constitu-
labeling.
ent elements that may identify the particle as being consistent
4.2 Label the sample collection stub in such a manner that it
with or characteristic of GSR, or both.
is distinguishable from other sample collection stubs without
compromising the sample; for example, label the bottom or
side of the stub.
1
This guide is under the jurisdiction of ASTM Committee E30 on Forensic
4.3 If a non-conductive adhesive was used in the sample
Sciences and is the direct responsibility of Subcommittee E30.01 on Criminalistics.
Current edition approved June 1, 2010. Published June 2010. Originally
collectionstub,thesamplewillneedtobecoatedtoincreaseits
approved in 1994. Last previous version approved in 2008 as E1588 – 08. DOI:
electrical conductivity, unless an environmental SEM or
10.1520/E1588-10E01.
2
variable-pressure/low-vacuum SEM is used for the analysis.
The boldface numbers in parentheses refer to a list of references at the end of
this standard. Carbon is a common choice of coating material, since it will
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
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E1588 − 10
not interfere with X-ray lines of interest. For high-vacuum 6.3.3 Display of the EDS output must encompass t
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