ASTM F1263-11
(Guide)Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
SIGNIFICANCE AND USE
Overtesting should be done when (a) testing by variables is impractical because of time and cost considerations or because the probability distribution of stress to failure cannot be estimated with sufficient accuracy, and (b) an unrealistically large number of parts would have to be tested at the specification stress for the necessary confidence and survival probability.
SCOPE
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-conservative estimates of this distribution.
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Designation:F1263 −11
Standard Guide for
Analysis of Overtest Data in Radiation Testing of Electronic
1
Parts
This standard is issued under the fixed designation F1263; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope 3.1.2 Rejection Confidence—the probability, R, that a lot
will be rejected based on destructive tests of selected speci-
1.1 This guide covers the use of overtesting in order to
mens if more than a specified fraction, P, of the parts in the lot
reduce the required number of parts that must be tested to meet
will fail in actual service.
a given quality acceptance standard. Overtesting is testing a
sample number of parts at a stress level higher than their 3.1.3 Discussion of Preceding Terms—Strictly speaking,
specification stress in order to reduce the amount of necessary most lot acceptance tests (be they testing by attributes or
data taking. This guide discusses when and how overtesting variables) do not guarantee survivability, but rather that infe-
may be applied to forming probabilistic estimates for the rior lots, where the survival probability of the parts is less than
survival of electronic piece parts subjected to radiation stress. probability, P, will be rejected with confidence, C. In order to
Some knowledge of the probability distribution governing the infer a true confidence, it would require a Bayes Theorem
stress-to-failure of the parts is necessary, although exact calculation. In many cases, the distinction between confidence
knowledge may be replaced by over-conservative estimates of and rejection confidence is of little practical importance.
this distribution. However, in other cases (typically when a large number of lots
are rejected) the distinction between these two kinds of
1.2 This international standard was developed in accor-
confidence can be significant. The formulas given in this guide
dance with internationally recognized principles on standard-
apply whether one is dealing with confidence or rejection
ization established in the Decision on Principles for the
confidence.
Development of International Standards, Guides and Recom-
mendations issued by the World Trade Organization Technical
4. Summary of Guide
Barriers to Trade (TBT) Committee.
4.1 This guide is intended to primarily apply to sampling by
2. Referenced Documents
attribute plans typified by Lot Tolerance Percent Defective
(LTPD) tables given in MIL-PRF 38535 and MIL-PRF 19500,
2.1 Military Standards:
and contains the following:
MIL-PRF 19500 Semiconductor Devices, General Specifi-
2
4.1.1 An equation for estimating the effectiveness of over-
cations for
testing in terms of increased probability of survival,
MIL-PRF 38535 Integrated Circuits (Microcircuit Manufac-
2
4.1.2 An equation for the required amount of overtesting
turing)
given a necessary survival probability, and
3. Terminology 4.1.3 Cautions and limitations on the method.
3.1 Definitions of Terms Specific to This Standard:
5. Significance and Use
3.1.1 Confidence—the probability, C, that at least a fraction,
5.1 Overtesting should be done when (a) testing by vari-
P, of the electronic parts from a test lot will survive in actual
ables is impractical because of time and cost considerations or
service; since radiation testing of electronic parts is generally
because the probability distribution of stress to failure cannot
destructive, this probability must be calculated from tests on
be estimated with sufficient accuracy, and (b) an unrealistically
selected specimens from the lot.
large number of parts would have to be tested at the specifi-
cation stress for the necessary confidence and survival prob-
1
ThisguideisunderthejurisdictionofASTMCommitteeF01onElectronicsand
ability.
is the direct responsibility of Subcommittee F01.11 on Nuclear and Space Radiation
Effects.
6. Interferences
Current edition approved June 1, 2011. Published July 2011. Originally approved
in 1989. Last previous edition approved in 2005 as F1263 – 99(2005). DOI:
6.1 Probability Distributions—In overtesting, a knowledge
10.1520/F1263-11.
2
of the probability distribution governing stress to failure is
Available from Standardization Documents Order Desk, Bldg. 4 Section D, 700
Robbins Ave., Philadelphia, PA 19111-5094, Attn: NPODS. required, though it need not be specified with the same
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959. United States
1
---------------------- Page: 1 ----------------------
F1263−11
5,6
accuracy necessary for testing by variables. For bipolar tran- 7.2 For neutrons, 0.5 is a good estimate of σ
...
This document is not an ASTM standard and is intended only to provide the user of an ASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation:F1263–99(Reapproved2005) Designation: F1263 – 11
Standard Guide for
Analysis of Overtest Data in Radiation Testing of Electronic
1
Parts
This standard is issued under the fixed designation F1263; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given
quality acceptance standard. Overtesting is testing a sample number of parts at a stress level higher than their specification stress
in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming
probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability
distribution governing the stress-to-failure of the parts is necessary, although exact knowledge may be replaced by over-
conservative estimates of this distribution.
2. Referenced Documents
2.1 Military Standards:
2
MIL-PRF 19500 Semiconductor Devices, General Specifications for
2
MIL-PRF 38535 Integrated Circuits (Microcircuit Manufacturing)
3. Terminology
3.1 Description of Term:
3.1.1 confidenceConfidence—the probability, C, that at least a fraction, P, of the electronic parts from a test lot will survive in
actual service; since radiation testing of electronic parts is generally destructive, this probability must be calculated from tests on
selected specimens from the lot.
3.1.2 rejection confidenceRejection Confidence—the probability, R, that a lot will be rejected based on destructive tests of
selected specimens if more than a specified fraction, P, of the parts in the lot will fail in actual service.
3.1.3 Discussion of Preceding Terms—Strictly speaking, most lot acceptance tests (be they testing by attributes or variables)
do not guarantee survivability, but rather that inferior lots, where the survival probability of the parts is less than probability, P,
will be rejected with confidence, C. In order to infer a true confidence, it would require a Bayes Theorem calculation. In many
cases, the distinction between confidence and rejection confidence is of little practical importance. However, in other cases
(typically when a large number of lots are rejected) the distinction between these two kinds of confidence can be significant. The
formulas given in this guide apply whether one is dealing with confidence or rejection confidence.
4. Summary of Guide
4.1 This guide is intended to primarily apply to sampling by attribute plans typified by LotTolerance Percent Defective (LTPD)
tables given in MIL-PRF 38535 and MIL-PRF 19500, and contains the following:
4.1.1 An equation for estimating the effectiveness of overtesting in terms of increased probability of survival,
4.1.2 An equation for the required amount of overtesting given a necessary survival probability, and
4.1.3 Cautions and limitations on the method.
5. Significance and Use
5.1 Overtesting should be done when (a) testing by variables is impractical because of time and cost considerations or because
the probability distribution of stress to failure cannot be estimated with sufficient accuracy, and (b) an unrealistically large number
of parts would have to be tested at the specification stress for the necessary confidence and survival probability.
1
This guide is under the jurisdiction ofASTM Committee F01 on Electronics and is the direct responsibility of Subcommittee F01.11 on Quality and HardnessAssurance.
Current edition approved Jan. 1, 2005. Published January 2005. Originally approved in 1989. Last previous edition approved in 1999 as F1263–99. DOI:
10.1520/F1263-99R05.on Nuclear and Space Radiation Effects.
Current edition approved June 1, 2011. Published July 2011. Originally approved in 1989. Last previous edition approved in 2005 as F1263 – 99(2005). DOI:
10.1520/F1263-11.
2
Available from Standardization Documents Order Desk, Bldg. 4 Section D, 700 Robbins Ave., Philadelphia, PA 19111-5094, Attn: NPODS.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1
---------------------- Page: 1 ----------------------
F1263 – 11
6. Interferences
6.1 Probability Distributions—In overtesting, a knowledge of the probability distribution gover
...
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