ASTM F676-97

Standard Test Method for Measuring Unsaturated TTL Sink Current

SCOPE
1.1 This test method covers the measurement of the unsaturated sink current of transistor-transistor logic (TTL) devices under specified conditions.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

General Information

• Status: Historical
• Publication Date: 31-Dec-1992
• ICS: 31.080.30 - Transistors
• Technical Committee: F01 - Electronics
• Drafting Committee: F01.11 - Nuclear and Space Radiation Effects

Relations

• Replaced By: ASTM F676-97(2003) - Standard Test Method for Measuring Unsaturated TTL Sink Current (Withdrawn 2009)
• Effective Date: 10-Dec-1997

Standards Content (Sample)

NOTICE: This standard has either been superceded and replaced by a new version or discontinued.
Contact ASTM International (www.astm.org) for the latest information.
Designation: F 676 – 97
Standard Test Method for
Measuring Unsaturated TTL Sink Current
This standard is issued under the fixed designation F 676; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
1. Scope 4. Significance and Use
1.1 This test method covers the measurement of the unsat- 4.1 Unsaturated sink current is a special parameter that is
urated sink current of transistor-transistor logic (TTL) devices closely related to the gain of the output transistor of TTL
under specified conditions. circuits. This parameter is particularly useful in evaluating
1.2 Units—The values stated in the International System of neutron degradation in TTL devices because it changes
Units (SI) are to be regarded as standard. No other units of smoothly as the device degrades, and exhibits larger changes at
measurement are included in this standard. moderate radiation levels than the standard electrical param-
1.3 This standard does not purport to address all of the eters.
safety concerns, if any, associated with its use. It is the
5. Interferences
responsibility of the user of this standard to establish appro-
priate safety and health practices and determine the applica- 5.1 Long pulses will cause many current probes to saturate.
The current-time rating of the probe must not be exceeded.
bility of regulatory limitations prior to use.
5.2 Valid measurements will not be obtained unless the
2. Referenced Documents
voltage applied to the output is sufficient to bring the output
2.1 ASTM Standards: transistor out of saturation.
E 178 Practice for Dealing with Outlying Observations 5.3 If the voltage applied to the output exceeds 1.5 V, errors
may result. Some devices may change state. Some devices
3. Summary of Test Method
have internal diode connections which will conduct if the
3.1 Input and bias voltage levels and any required input
output exceeds 1.5 V.
signals are applied to the device under test to put the output to 5.4 High contact resistance will cause the voltage at the
be tested in the low-level state. Voltage pulses of sufficient
device to differ from the applied voltage. Kelvin contacts may
magnitude to pull the output transistor out of saturation are be required.
applied to the output pin under test. The corresponding current
5.5 Device temperature will affect this measurement. Pulse
pulses are measured. width and duty cycle must be maintained low enough that the
3.2 The following test conditions are not specified by the
test does not cause heating of the device.
test method and shall be agreed upon by the parties to the test:
6. Apparatus
3.2.1 The output pin(s) to be tested,
3.2.2 Ambient temperature range, 6.1 Pulse Generator, capable of supplying the current
3.2.3 Supply voltage(s) to be used, required by the output pin under test at the agreed-upon
3.2.4 Input sequence to be applied before the device output voltage.
is pulsed, 6.2 Oscilloscope, or Digital Recorder, dual-beam or dual-
3.2.5 Pulse voltage to be applied to the output pin under test, trace, meeting the following requirements:
3.2.6 Duty cycle and duration of the applied pulses, and 6.2.1 Bandwidth of 30 MHz or greater.
3.2.7 Accuracy and tolerances required for supply volt- 6.2.2 Deflection factor range of 5 mV per division to 1 V per
age(s), input voltages, pulse voltage, current measurement, division.
duty cycle, and pulse-width. 6.3 Termination R , suitable for the current probe used.
T
6.4 Current Probe, meeting the following requirements:
6.4.1 Rise time less than 10 % of the agreed-upon pulse
This test method is under the jurisdiction of ASTM Committee F-1 on
width.
Electronics and is the direct responsibility of Subcommittee F01.11 on Quality and
6.4.2 Droop no more than 5 % of the agreed-upon pulse
Hardness Assurance.
Current edition approved Dec. 10, 1997. Published March 1998. Originally width.
published as F 676 – 80. Last previous edition F 676 – 93.
1983 Annual Book of ASTM Standards, Vol 14.02.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
NOTICE: This standard has either been superceded and replaced by a new version or discontinued.
Contact ASTM International (www.astm.org) for the latest information.
F 676–97
6.4.3 Current-time rating sufficient to avoid saturation. See 8. Procedure
4.1.
8.1 Assemble the circuit shown in Fig. 1. Leave the output
6.5 Power Supplies and Pulse Generators, as required to
pin pulse generator disconnected. Connect the 0.1-μF capacitor
establish bias and input conditions for the test.
as close as possible to device socket.
6.6 Oscilloscope Probe, having an input impedance of 1
8.2 Turn on all electronic equipment and allow to warm up
MV or greater in parallel wi
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