Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe profilometer

Hochleistungskeramik - Verfahren zur Prüfung keramischer Schichten - Teil 1: Bestimmung der Schichtdicke mit einem Kontaktprofilometer

Céramiques techniques avancées - Méthodes d'essai pour revêtements céramiques - Partie 1: Détermination de l'épaisseur du revêtement par profilomètre à contact

Advanced technical ceramics - Methods of test for ceramic coatings - Part 1: Determination of coating thickness by contact probe profilometer

General Information

Status
Withdrawn
Publication Date
09-Sep-1993
Withdrawal Date
11-Mar-2003
Current Stage
9960 - Withdrawal effective - Withdrawal
Due Date
12-Mar-2003
Completion Date
12-Mar-2003

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Standardization document
ENV 1071-1:2000
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Standards Content (sample)

SLOVENSKI STANDARD
SIST ENV 1071-1:2000
01-december-2000
Advanced technical ceramics - Methods of test for ceramic coatings - Part 1:
Determination of coating thickness by contact probe profilometer
Advanced technical ceramics - Methods of test for ceramic coatings - Part 1:
Determination of coating thickness by contact probe profilometer
Hochleistungskeramik - Verfahren zur Prüfung keramischer Schichten - Teil 1:
Bestimmung der Schichtdicke mit einem Kontaktprofilometer
Céramiques techniques avancées - Méthodes d'essai pour revetements céramiques -
Partie 1: Détermination de l'épaisseur du revetement par profilometre a contact
Ta slovenski standard je istoveten z: ENV 1071-1:1993
ICS:
25.220.99 Druge obdelave in prevleke Other treatments and
coatings
81.060.30 Sodobna keramika Advanced ceramics
SIST ENV 1071-1:2000 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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