Space product assurance - Particles contamination monitoring for spacecraft systems and cleanrooms

This standard defines the requirements and guidelines for the measurement of particulate contamination on the surfaces of spacecraft systems and those of the cleanrooms or other cleanliness controlled areas in which they reside.
This includes the measurement of particulate contamination that is present on the spacecraft or cleanroom surfaces via the use of representative witness samples placed in the vicinity of the spacecraft hardware, the direct measurement of particulate contamination
levels on surfaces of spacecraft hardware from the direct surface transfer to adhesive tape-lift samples and particulate contaminant levels within fluids used for the cleaning or rinsing of such spacecraft system components and cleanroom surfaces. This standard also defines the methods to be used for the visual inspection of spacecraft system hardware for particulate contamination.
The measurement of airborne particulate contamination is not covered in this standard and ISO 14644 “Cleanrooms and associated
controlled environments” is applicable in this case.
This standard does not cover particulate contamination monitoring for spacecraft propulsion hardware which is covered in ECSS-E-ST-35-06.
This standard may be tailored for the specific characteristic and constrains of a space project in conformance with ECSS-S-ST-00.

Raumfahrtproduktsicherung - Überwachung der Teilchenkontamination von Raumfahrzeugsystemen und Reinräumen

Assurance produit des projets spatiaux - Surveillance de la contamination aux particules des systèmes orbitaux et des salles blanches

Zagotavljanje varnih proizvodov v vesoljski tehniki - Nadzorovanje onesnaženja z delci v sistemih vesoljskega plovila in čistih prostorih

Ta standard določa zahteve in smernice za merjenje onesnaženja z delci na površinah sistemov vesoljskega plovila in površinah čistih prostorov ali drugih območij z nadzorom čistoče, v katerih bivajo. Sem spada merjenje onesnaženja z delci, ki je prisotno na površinah vesoljskega plovila ali čistih prostorov, z uporabo reprezentativnih vzorcev v bližini strojne opreme vesoljskega plovila, neposredno merjenje ravni onesnaženja z delci na površinah strojne opreme vesoljskega plovila z neposrednega prenosa s površin na vzorce, zbrane z adhezivnim trakom, in ravni onesnaženja z delci v tekočinah, ki se uporabljajo za čiščenje ali splakovanje teh komponent sistemov vesoljskega plovila in površin čistih prostorov. Ta standard določa tudi metode, ki se uporabljajo za vizualni pregled strojne opreme sistemov vesoljskega plovila za onesnaženje z delci. Merjenje onesnaženja z delci v zraku ni obravnavano v tem standardu; v tem primeru se uporablja standard ISO 14644 »Čiste sobe in podobna nadzorovana okolja«. Ta standard ne obravnava nadzorovanja onesnaženja z delci za pogonsko strojno opremo vesoljskega plovila, kar je obravnavano v standardu ECSS-E-ST-35-06. Ta standard se lahko prilagodi posameznim lastnostim in omejitvam vesoljskega projekta v skladu s standardom ECSS-S-ST-00

General Information

Status
Published
Publication Date
27-Jan-2015
Withdrawal Date
30-Jul-2015
Technical Committee
Drafting Committee
Current Stage
9093 - Decision to confirm - Review Enquiry
Completion Date
13-Jan-2021

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Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 16602-70-50:2015
01-april-2015
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Space product assurance - Particles contamination monitoring for spacecraft systems
and cleanrooms
Raumfahrtproduktsicherung - Überwachung der Teilchenkontamination von
Raumfahrzeugsystemen und Reinräumen
Assurance produit des projets spatiaux - Surveillance de la contamination aux particules
des systèmes orbitaux et des salles blanches
Ta slovenski standard je istoveten z: EN 16602-70-50:2015
ICS:
13.040.35 Brezprašni prostori in Cleanrooms and associated
povezana nadzorovana controlled environments
okolja
49.140 Vesoljski sistemi in operacije Space systems and
operations
SIST EN 16602-70-50:2015 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 16602-70-50:2015

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SIST EN 16602-70-50:2015


EUROPEAN STANDARD
EN 16602-70-50

NORME EUROPÉENNE

EUROPÄISCHE NORM
January 2015
ICS 49.140

English version
Space product assurance - Particles contamination monitoring
for spacecraft systems and cleanrooms
Assurance produit des projets spatiaux - Surveillance de la Raumfahrtproduktsicherung - Überwachung der
contamination aux particules des systèmes orbitaux et des Teilchenkontamination von Raumfahrzeugsystemen und
salles blanches Reinräumen
This European Standard was approved by CEN on 25 October 2014.

CEN and CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving
this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning
such national standards may be obtained on application to the CEN-CENELEC Management Centre or to any CEN and CENELEC
member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CEN and CENELEC member into its own language and notified to the CEN-CENELEC Management Centre
has the same status as the official versions.

CEN and CENELEC members are the national standards bodies and national electrotechnical committees of Austria, Belgium, Bulgaria,
Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece,
Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia,
Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.






CEN-CENELEC Management Centre:
Avenue Marnix 17, B-1000 Brussels
© 2015 CEN/CENELEC All rights of exploitation in any form and by any means reserved Ref. No. EN 16602-70-50:2015 E
worldwide for CEN national Members and for CENELEC
Members.

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SIST EN 16602-70-50:2015
EN 16602-70-50:2015 (E)
Table of contents
Foreword . 4
Introduction . 5
1 Scope . 6
2 Normative references . 7
3 Terms, definitions and abbreviated terms . 8
3.1 Terms defined in other standards . 8
3.2 Terms specific to the present standard . 8
3.3 Abbreviated terms. 11
4 Particulate cleanliness monitoring requirements . 12
4.1 Cleanliness requirement specification overview . 12
4.2 Cleanliness and contamination control plan . 12
5 Quantitative method requirements . 13
5.1 Particles sampling from surfaces . 13
5.1.1 Tape lift method . 13
5.1.2 Direct deposition on silicon wafers . 16
5.1.3 Rinsing (direct or indirect) .
...

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