CEN/TR 17603-20-06:2022
(Main)Space engineering - Assessment of space worst case charging handbook
Space engineering - Assessment of space worst case charging handbook
Common engineering practices involve the assessment, through computer simulation (with software like NASCAP [RD.4] or SPIS [RD.5]), of the levels of absolute and differential potentials reached by space systems in flight. This is usually made mandatory by customers and by standards for the orbits most at risk such as GEO or MEO and long transfers to GEO by, for example, electric propulsion.
The ECSS-E-ST-20-06 standard requires the assessment of spacecraft charging but it is not appropriate in a standard to explain how such an assessment is performed. It is the role of this document ECSS-E-HB-20-06, to explain in more detail important aspects of the charging process and to give guidance on how to carry out charging assessment by computer simulation.
The ECSS-E-ST-10-04 standard specifies many aspects of the space environment, including the plasma and radiation characteristics corresponding to worst cases for surface and internal charging. In this document the use of these environment descriptions in worst case simulations is described.
The emphasis in this document is on high level charging in natural environments. One aspect that is currently not addressed is the use of active sources e.g. for electric propulsion or spacecraft potential control. The tools to address this are still being developed and this area can be addressed in a later edition.
Raumfahrtproduktsicherung - Handbuch zu Minderungsmethoden von Strahlungseffekten auf ASICs und FPGA
Ingénierie spatiale - Guide sur les techniques de durcissement des ASICs et FPGAs vis-à-vis des effets des radiations
Vesoljski inženiring - Ocena priročnika za polnjenje v najslabšem primeru v vesolju
Običajne inženirske prakse vključujejo oceno ravni absolutnih in diferencialnih potencialov, ki jih dosegajo vesoljski sistemi med letom. Za oceno se uporabi računalniško simulacijo (s programsko opremo, kot sta NASCAP [RD.4] ali SPIS [RD.5]). To običajno zahtevajo stranke in standardi za orbite z največjim tveganjem, kot sta GEO ali MEO, in dolgi prenosi v GEO, na primer z električnim pogonom.
Standard ECSS-E-ST-20-06 zahteva oceno polnjenja vesoljskih plovil, vendar v njem ni pojasnjeno, kako se taka ocena izvaja. Naloga dokumenta ECSS-E-HB-20-06 je namreč, da podrobneje opiše pomembne vidike postopka polnjenja in poda napotke, kako izvesti oceno polnjenja z računalniško simulacijo.
Standard ECSS-E-ST-10-04 določa številne vidike vesoljskega okolja, vključno s plazemskimi in sevalnimi lastnostmi, ki ustrezajo najslabšim primerom površinskega in notranjega polnjenja. V tem dokumentu je opisana uporaba teh opisov okolja v simulacijah najslabšega primera.
Poudarek je na visoki ravni polnjenja v naravnem okolju. Eden od vidikov, ki trenutno ni obravnavan, je uporaba aktivnih virov, npr. za električni pogon ali nadzor potenciala vesoljskega plovila. Orodja za obravnavo tega se še razvijajo in to področje bo mogoče obravnavati v poznejši izdaji.
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
01-marec-2022
Vesoljski inženiring - Ocena priročnika za polnjenje v najslabšem primeru v
vesolju
Space engineering - Assessment of space worst case charging handbook
Raumfahrtproduktsicherung - Handbuch zu Minderungsmethoden von
Strahlungseffekten auf ASICs und FPGA
Ingénierie spatiale - Guide sur les techniques de durcissement des ASICs et FPGAs vis-
à-vis des effets des radiations
Ta slovenski standard je istoveten z: CEN/TR 17603-20-06:2022
ICS:
49.140 Vesoljski sistemi in operacije Space systems and
operations
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
TECHNICAL REPORT CEN/TR 17603-20-06
RAPPORT TECHNIQUE
TECHNISCHER BERICHT
January 2022
ICS 49.140
English version
Space engineering - Assessment of space worst case
charging handbook
Ingénierie spatiale - Guide sur les techniques de Raumfahrtproduktsicherung - Handbuch zu
durcissement des ASICs et FPGAs vis-à-vis des effets Minderungsmethoden von Strahlungseffekten auf
des radiations ASICs und FPGA
This Technical Report was approved by CEN on 29 November 2021. It has been drawn up by the Technical Committee
CEN/CLC/JTC 5.
CEN and CENELEC members are the national standards bodies and national electrotechnical committees of Austria, Belgium,
Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia,
Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.
CEN-CENELEC Management Centre:
Rue de la Science 23, B-1040 Brussels
© 2022 CEN/CENELEC All rights of exploitation in any form and by any means
Ref. No. CEN/TR 17603-20-06:2022 E
reserved worldwide for CEN national Members and for
CENELEC Members.
Table of contents
European Foreword . 6
Introduction . 7
1 Scope . 8
2 References . 9
3 Terms, definitions and abbreviated terms . 13
Terms from other documents . 13
Abbreviated terms. 13
4 Surface charging . 15
Fundamentals . 15
General methodology of surface charging analyses . 17
4.2.1 Introduction . 17
4.2.2 Necessity of 3D surface charging analyses . 17
4.2.3 Simulation process . 18
4.2.4 Assessment of simulation results . 19
Electrostatic discharge . 20
4.3.1 ESD types . 20
4.3.2 Thresholds for ESD occurrence . 20
4.3.3 Quantitative characterization of ESD electrical transients . 21
4.3.4 Interpretation of results . 25
Critical aspects with respect to worst case surface charging analyses . 25
4.4.1 Orbit . 25
4.4.2 Material properties . 26
4.4.3 Sunlit/Eclipse . 26
4.4.4 Protons . 27
4.4.5 Electric propulsion . 27
How to set up a simulation . 27
4.5.1 Charging environment parameters . 27
4.5.2 Modelling requirements for surface charging analyses . 27
4.5.3 Spacecraft geometry modelling . 28
4.5.4 Gmsh – The CAD interface to SPIS . 29
4.5.5 Physical groups and surface materials definition . 33
4.5.6 Basic electrical circuit of the satellite . 36
4.5.7 Plasma models . 37
4.5.8 Global parameters. 37
4.5.9 Consistency checks . 38
5 Internal Charging . 40
Fundamentals . 40
5.1.1 Introduction . 40
5.1.2 Floating metals . 40
5.1.3 Insulators . 40
5.1.4 Charge Deposition . 41
5.1.5 Conductivity . 41
5.1.6 Time-dependence . 43
General methodology . 43
5.2.1 Introduction . 43
5.2.2 Internal charging analyses . 44
5.2.3 Critical aspects with respect to worst case internal charging analysis . 45
5.2.4 Modelling aspects for internal charging analyses . 49
5.2.5 Environment . 50
5.2.6 Geometry . 50
5.2.7 Materials parameters . 51
5.2.8 Simulation tools in 1D and 3D . 51
5.2.9 Scenarios . 52
5.2.10 Important Outputs . 52
6 General aspects of surface and internal charging analysis . 53
Material characterization aspects . 53
Charging analyses and project phases . 53
6.2.1 Phase 0: Mission analysis . 53
6.2.2 Phase A: Feasibility . 53
6.2.3 Phase B: Preliminary definition . 53
6.2.4 Phase C: Detailed definition . 54
6.2.5 Phase D: Production . 54
6.2.6 Phase E: Utilisation . 54
Orbit plasma environment . 55
Plasma environment for different Earth orbits . 55
GEO worst case environments . 56
A.2.1 Introduction . 56
A.2.2 ECSS . 56
A.2.3 NASA . 56
A.2.4 ONERA/CNES . 58
LEO/Polar . 58
Figures
Figure 4-1: Current contributions influencing the surface charging of a body in space
plasma . 16
Figure 4-2: Flowchart showing the steps needed to determine the necessity of a 3D
surface charging analysis . 18
Figure 4-3: Flow diagram of the typical process of a 3D charging analysis . 19
Figure 4-4: Charged surface with area A showing the geometrical meaning and the
range for the parameter R . 23
Figure 4-5: Two-dimensional meshing of a solar array (from Sarrailh et al 2013 0) . 24
Figure 4-6: Examples of 2 discharges . 24
Figure 4-7: Definition of nodes and lines with Gmsh . 30
Figure 4-8: Definition of surfaces and volume with Gmsh . 31
Figure 4-9: Top: Surface meshes of the spacecraft and boundary. Bottom: Volume
mesh of the computational space. . 32
Figure 4-10: Definition of surface materials through the SPIS group editor . 33
Figure 4-11: Example of material properties list used by SPIS . 35
Figure 4-12: SPIS configuration of satellite electrical connections . 36
Figure 4-13: SPIS plasma parameters settings for the ECSS-E-ST-10-04 GEO worst
case environment for surface charging. . 37
Figure 5-1: Mulassis 0 simulation of net flux (forward minus backward travelling) due to
a 5 MeV incident beam in a planar sample of Aluminium. CSDA range is
approximately 11,4 mm . 41
Figure 5-2: Decision flow diagram for performing an internal charging analysis . 44
Figure 5-3: Current density v shielding depth curve for a geostationary orbit with
longitude 195deg East with nominal date 21/09/1994 according to the
FLUMIC model as calculated by the Mulassis tool in SPENVIS. The
FLUMIC spectrum was calculated by DICTAT in SPENVIS. . 46
Figure 5-4: Current density v shielding depth curve for the peak of the outer radiation
belt L=4,4, B/B0=1,0 with nominal date 21/09/1994 according to the
FLUMIC model as calculated by the Mulassis tool in SPENVIS. The
FLUMIC spectrum was calculated by DICTAT in SPENVIS. . 48
Tables
Table 4-1: Meanings of the material properties used in SPIS . 35
Table 5-1: Current density v shielding depth values for a geostationary orbit with
longitude 195deg East with nominal date 21/09/1994 according to the
FLUMIC model as calculated by the Mulassis tool in SPENVIS. The
FLUMIC spectrum was calculated by DICTAT in SPENVIS. . 47
Table 5-2: Current density v shielding depth values for the peak of the outer radiation
belt L=4,4, B/B0=1,0 with nominal date 21/09/1994 according to the
FLUMIC model as calculated by the Mulassis tool in SPENVIS. The
FLUMIC spectrum was calculated by DICTAT in SPENVIS. . 48
Table A-1 : Type of environments and order of magnitudes of density and temperature
encountered along typical orbits . 55
Table A-2 : Order of magnitudes of key plasma and charging parameters expected in
typical environments . 55
Table A-3 : ECSS-E-ST-10-04 worst case charging environment . 56
Table A-4 : NASA-HDBK-4002A worst case charging environment . 56
Table A-5 :
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