Space engineering - Assessment of space worst case charging handbook

Common engineering practices involve the assessment, through computer simulation (with software like NASCAP [RD.4] or SPIS [RD.5]), of the levels of absolute and differential potentials reached by space systems in flight. This is usually made mandatory by customers and by standards for the orbits most at risk such as GEO or MEO and long transfers to GEO by, for example, electric propulsion.
The ECSS-E-ST-20-06 standard requires the assessment of spacecraft charging but it is not appropriate in a standard to explain how such an assessment is performed. It is the role of this document ECSS-E-HB-20-06, to explain in more detail important aspects of the charging process and to give guidance on how to carry out charging assessment by computer simulation.
The ECSS-E-ST-10-04 standard specifies many aspects of the space environment, including the plasma and radiation characteristics corresponding to worst cases for surface and internal charging. In this document the use of these environment descriptions in worst case simulations is described.
The emphasis in this document is on high level charging in natural environments. One aspect that is currently not addressed is the use of active sources e.g. for electric propulsion or spacecraft potential control. The tools to address this are still being developed and this area can be addressed in a later edition.

Raumfahrtproduktsicherung - Handbuch zu Minderungsmethoden von Strahlungseffekten auf ASICs und FPGA

Ingénierie spatiale - Guide sur les techniques de durcissement des ASICs et FPGAs vis-à-vis des effets des radiations

Vesoljski inženiring - Ocena priročnika za polnjenje v najslabšem primeru v vesolju

Običajne inženirske prakse vključujejo oceno ravni absolutnih in diferencialnih potencialov, ki jih dosegajo vesoljski sistemi med letom. Za oceno se uporabi računalniško simulacijo (s programsko opremo, kot sta NASCAP [RD.4] ali SPIS [RD.5]). To običajno zahtevajo stranke in standardi za orbite z največjim tveganjem, kot sta GEO ali MEO, in dolgi prenosi v GEO, na primer z električnim pogonom.
Standard ECSS-E-ST-20-06 zahteva oceno polnjenja vesoljskih plovil, vendar v njem ni pojasnjeno, kako se taka ocena izvaja. Naloga dokumenta ECSS-E-HB-20-06 je namreč, da podrobneje opiše pomembne vidike postopka polnjenja in poda napotke, kako izvesti oceno polnjenja z računalniško simulacijo.
Standard ECSS-E-ST-10-04 določa številne vidike vesoljskega okolja, vključno s plazemskimi in sevalnimi lastnostmi, ki ustrezajo najslabšim primerom površinskega in notranjega polnjenja. V tem dokumentu je opisana uporaba teh opisov okolja v simulacijah najslabšega primera.
Poudarek je na visoki ravni polnjenja v naravnem okolju. Eden od vidikov, ki trenutno ni obravnavan, je uporaba aktivnih virov, npr. za električni pogon ali nadzor potenciala vesoljskega plovila. Orodja za obravnavo tega se še razvijajo in to področje bo mogoče obravnavati v poznejši izdaji.

General Information

Status
Published
Publication Date
11-Jan-2022
Technical Committee
Current Stage
6060 - Definitive text made available (DAV) - Publishing
Start Date
12-Jan-2022
Due Date
29-Dec-2022
Completion Date
12-Jan-2022

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Standards Content (Sample)

SLOVENSKI STANDARD
SIST-TP CEN/TR 17603-20-06:2022
01-marec-2022
Vesoljski inženiring - Ocena priročnika za polnjenje v najslabšem primeru v
vesolju
Space engineering - Assessment of space worst case charging handbook
Raumfahrtproduktsicherung - Handbuch zu Minderungsmethoden von
Strahlungseffekten auf ASICs und FPGA
Ingénierie spatiale - Guide sur les techniques de durcissement des ASICs et FPGAs vis-
à-vis des effets des radiations
Ta slovenski standard je istoveten z: CEN/TR 17603-20-06:2022
ICS:
49.140 Vesoljski sistemi in operacije Space systems and
operations
SIST-TP CEN/TR 17603-20-06:2022 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST-TP CEN/TR 17603-20-06:2022

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SIST-TP CEN/TR 17603-20-06:2022


TECHNICAL REPORT CEN/TR 17603-20-06

RAPPORT TECHNIQUE

TECHNISCHER BERICHT
January 2022
ICS 49.140

English version

Space engineering - Assessment of space worst case
charging handbook
Ingénierie spatiale - Guide sur les techniques de Raumfahrtproduktsicherung - Handbuch zu
durcissement des ASICs et FPGAs vis-à-vis des effets Minderungsmethoden von Strahlungseffekten auf
des radiations ASICs und FPGA


This Technical Report was approved by CEN on 29 November 2021. It has been drawn up by the Technical Committee
CEN/CLC/JTC 5.

CEN and CENELEC members are the national standards bodies and national electrotechnical committees of Austria, Belgium,
Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
Latvia, Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia,
Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and United Kingdom.
























CEN-CENELEC Management Centre:
Rue de la Science 23, B-1040 Brussels
© 2022 CEN/CENELEC All rights of exploitation in any form and by any means
Ref. No. CEN/TR 17603-20-06:2022 E
reserved worldwide for CEN national Members and for
CENELEC Members.

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SIST-TP CEN/TR 17603-20-06:2022
CEN/TR 17603-20-06:2022 (E)
Table of contents
European Foreword . 6
Introduction . 7
1 Scope . 8
2 References . 9
3 Terms, definitions and abbreviated terms . 13
Terms from other documents . 13
Abbreviated terms. 13
4 Surface charging . 15
Fundamentals . 15
General methodology of surface charging analyses . 17
4.2.1 Introduction . 17
4.2.2 Necessity of 3D surface charging analyses . 17
4.2.3 Simulation process . 18
4.2.4 Assessment of simulation results . 19
Electrostatic discharge . 20
4.3.1 ESD types . 20
4.3.2 Thresholds for ESD occurrence . 20
4.3.3 Quantitative characterization of ESD electrical transients . 21
4.3.4 Interpretation of results . 25
Critical aspects with respect to worst case surface charging analyses . 25
4.4.1 Orbit . 25
4.4.2 Material properties . 26
4.4.3 Sunlit/Eclipse .
...

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