EN 62047-7:2011

Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

IEC 62047-7:2011 describes terms, definition, symbols, configurations, and test methods that can be used to evaluate and determine the performance characteristics of BAW resonator, filter, and duplexer devices as radio frequency control and selection devices. This standard specifies the methods of tests and general requirements for BAW resonator, filter, and duplexer devices of assessed quality using either capability or qualification approval procedures.

Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 7: BAW-MEMS-Filter und -Duplexer zur Hochfrequenz-Regelung und -Auswahl

Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 7: Filtre et duplexeur BAW MEMS pour la commande et le choix des fréquences radioélectriques

La CEI 62047-7:2011 définit les termes, les définitions, les symboles, les configurations, et les méthodes d'essai susceptibles d'être utilisés pour évaluer et déterminer les caractéristiques d'aptitude à la fonction des dispositifs de résonateurs, filtres et duplexeurs BAW en tant que dispositifs de commande et de choix des fréquences radioélectriques. La présente norme spécifie les méthodes d'essai et les exigences générales relatives aux dispositifs de résonateur, de filtre et de duplexeur BAW sous assurance de la qualité, au moyen des procédures d'agrément de savoir-faire ou d'homologation.

Polprevodniški elementi - Mikroelektromehanski elementi - 7. del: Filter & duplekser MEMS BAW za radiofrekvenčno krmiljenje in izbiranje

Ta del IEC 62047 opisuje izraze, definicijo, simbole, konfiguracije in preskusne metode, ki se lahko uporabljajo za vrednotenje in določevanje značilnosti delovanja resonatorja, filtra in duplekserja BAW kot naprav za radiofrekvenčno krmiljenje in izbiranje. Ta standard določa preskusne metode in splošne zahteve za resonatorje, filtre in duplekserje BAW ocenjene kakovosti z uporabo postopkov za odobritev zmogljivosti ali usposobljenosti.

General Information

• Status: Published
• Publication Date: 04-Aug-2011
• Withdrawal Date: 20-Jul-2014
• ICS: 31.080.99 - Other semiconductor devices
• Technical Committee: CLC/SR 47F - CLC_SR_47F
• Drafting Committee: IEC/SC 47F - IEC_SC_47F
• Parallel Committee: IEC/SC 47F - IEC_SC_47F
• Current Stage: 6060 - Document made available - Publishing
• Start Date: 05-Aug-2011
• Completion Date: 05-Aug-2011
• Ref Project: SIST EN 62047-7:2011 - Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter & duplexer for radio frequency control and selection

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 62047-7:2011
01-oktober-2011
3ROSUHYRGQLãNLHOHPHQWL0LNURHOHNWURPHKDQVNLHOHPHQWLGHO)LOWHU
GXSOHNVHU0(06%$:]DUDGLRIUHNYHQþQRNUPLOMHQMHLQL]ELUDQMH
Semiconductor devices - Micro-electromechanical devices - Part 7: MEMS BAW filter &
duplexer for radio frequency control and selection
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 7: Filtre &
duplexeur BAW MEMS pour la commande et le choix des fréquences radioélectriques
Ta slovenski standard je istoveten z: EN 62047-7:2011
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN 62047-7:2011 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 62047-7:2011

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SIST EN 62047-7:2011

EUROPEAN STANDARD
EN 62047-7

NORME EUROPÉENNE
August 2011
EUROPÄISCHE NORM

ICS 31.080.99


English version


Semiconductor devices -
Micro-electromechanical devices -
Part 7: MEMS BAW filter and duplexer for radio frequency control and
selection
(IEC 62047-7:2011)


Dispositifs à semiconducteurs -  Halbleiterbauelemente -
Dispositifs microélectromécaniques - Bauelemente der Mikrosystemtechnik -
Partie 7: Filtre et duplexeur BAW MEMS Teil 7: BAW-MEMS-Filter und -Duplexer
pour la commande et le choix des zur Hochfrequenz-Regelung und -Auswahl
fréquences radioélectriques (IEC 62047-7:2011)
(CEI 62047-7:2011)





This European Standard was approved by CENELEC on 2011-07-21. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,
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Spain, Sweden, Switzerland and the United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Management Centre: Avenue Marnix 17, B - 1000 Brussels


© 2011 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 62047-7:2011 E

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SIST EN 62047-7:2011
EN 62047-7:2011 - 2 -
Foreword
The text of document 47F/79/FDIS, future edition 1 of IEC 62047-7, prepared by SC 47F, Micro-
electromechanical systems, of IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC
parallel vote and was approved by CENELEC as EN 62047-7 on 2011-07-21.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent
rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2012-04-21
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2014-07-21
with the EN have to be withdrawn
__________
Endorsement notice
The text of the International Standard IEC 62047-7:2011 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:
IEC 60368-1:2000 NOTE  Harmonized as EN 60368-1:2000 + A1:2004 (not modified).
+ A1:2004
IEC 60368-2-2 NOTE  Harmonized as EN 60368-2-2.
IEC 60862-1:2003 NOTE  Harmonized as EN 60862-1:2003 (not modified).
IEC 60862-2 NOTE  Harmonized as EN 60862-2.
__________

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SIST EN 62047-7:2011

IEC 62047-7
®

Edition 1.0 2011-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside


Semiconductor devices – Micro-electromechanical devices –
Part 7: MEMS BAW filter and duplexer for radio frequency control and selection

Dispositifs à semiconducteurs – Dispositifs microélectromécaniques –
Partie 7: Filtre et duplexeur BAW MEMS pour la commande
...