EN IEC 60747-17:2020
(Main)Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
IEC 60747-17:2020(E) specifies the terminology, essential ratings, characteristics, safety test and the measuring methods of magnetic coupler and capacitive coupler. It specifies the principles and requirements of insulation and isolation characteristics for magnetic and capacitive couplers for basic insulation and reinforced insulation. This first edition cancels and replaces IEC PAS 60747-17:2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to IEC PAS 60747-17:2011: a) introduced lifetime safety factors for improved life time consideration, to comply with widely recognized aging mechanisms of silicone dioxide (TDDB) and thin film polymer isolation layers; b) significantly improved "end of life testing" paragraph and statistical life time consideration by adding detailed description on process, safety factors, methods of generating data points and respective lifetime interpolations as well as being specific on minimum amount of samples required; c) introduced concept of certification by similarity, including Annex A, giving guidance on qualification considerations and required certification process; d) alternative pulse shape allowed for surge pulse testing, to avoid issues due to surge tester availability; e) various improvements throughout the standard: definitions, for example type of coupler have been improved, introduction of surge impulse VIMP rating, usage of glass transition temperature, pre-conditioning have been redefined for improved usability and better compatibility with today’s design and functionality of couplers, available mold compounds, etc.
Halbleiterbauelemente - Teil 17: Magnetische und kapazitive Koppler für Basisisolierung und verstärkte Isolierung
Dispositifs à semiconducteurs - Partie 17: Coupleur magnétique et capacitif pour l’isolation principale et renforcée
L'IEC 60747-17:2020 spécifie la terminologie, les valeurs assignées essentielles, les caractéristiques, l’essai de sécurité et les méthodes de mesure des coupleurs magnétiques et des coupleurs capacitifs. Elle spécifie les principes et exigences de l’isolation et les caractéristiques d’isolement des coupleurs magnétiques et capacitifs pour l’isolation principale et l’isolation renforcée. Cette première édition annule et remplace l’IEC PAS 60747-17:2011. Cette édition constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l’IEC PAS 60747‑17:2011: a) introduction des facteurs de sécurité de durée de vie pour la prise en considération de la durée de vie améliorée, conformément aux mécanismes de vieillissement du dioxyde de silicium (TDDB) largement reconnus, et couches d’isolement en polymère à couches minces; b) prise en considération de l’alinéa et de la durée de vie statistique de l’"essai de fin de vie" considérablement améliorée par l’ajout d’une description détaillée du processus, des facteurs de sécurité, des méthodes de génération de points de données et des interpolations de la durée de vie respective, ainsi que par la spécification de la quantité minimale d'échantillons exigés; c) introduction du concept de certification par similarité, comprenant l’Annexe A, qui donne des recommandations relatives aux considérations de qualification et au processus de certification exigé; d) forme d'impulsion alternative admise pour l’essai d’impulsion de choc afin d'éviter les problèmes de disponibilité de l’appareil d’essai aux ondes de choc; e) plusieurs améliorations tout au long de la norme: amélioration des définitions, par exemple des types de coupleurs; introduction de la valeur assignée de l’impulsion de choc VIMP, utilisation d’une température de transition vitreuse, redéfinition du préconditionnement pour une utilisation améliorée et une meilleure compatibilité avec la conception et les fonctionnalités actuelles des coupleurs, les composants moulés disponibles, etc.
Polprevodniški elementi - 17. del: Magnetni in kapacitivni spojnik za osnovno in ojačeno izolacijo (IEC 60747-17:2020)
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
01-januar-2021
Polprevodniški elementi - 17. del: Magnetni in kapacitivni spojnik za osnovno in
ojačeno izolacijo (IEC 60747-17:2020)
Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and
reinforced insulation (IEC 60747-17:2020)
Halbleiterbauelemente - Teil 17: Magnetische und kapazitive Koppler für Basisisolierung
und verstärkte Isolierung (IEC 60747-17:2020)
Dispositifs à semiconducteurs - Partie 17: Coupleur magnétique et capacitif pour
l’isolation principale et renforcée (IEC 60747-17:2020)
Ta slovenski standard je istoveten z: EN IEC 60747-17:2020
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN IEC 60747-17
NORME EUROPÉENNE
EUROPÄISCHE NORM
November 2020
ICS 31.080.99
English Version
Semiconductor devices - Part 17: Magnetic and capacitive
coupler for basic and reinforced insulation
(IEC 60747-17:2020)
Dispositifs à semiconducteurs - Partie 17: Coupleur Halbleiterbauelemente - Teil 17: Magnetische und
magnétique et capacitif pour l'isolation principale et kapazitive Koppler für Basisisolierung und verstärkte
renforcée Isolierung
(IEC 60747-17:2020) (IEC 60747-17:2020)
This European Standard was approved by CENELEC on 2020-10-26. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the
Netherlands, Norway, Poland, Portugal, Republic of North Macedonia, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels
© 2020 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 60747-17:2020 E
European foreword
The text of document 47E/711/FDIS, future edition 1 of IEC 60747-17, prepared by SC 47E "Discrete
semiconductor devices" of IEC/TC 47 "Semiconductor devices" was submitted to the IEC-CENELEC
parallel vote and approved by CENELEC as EN IEC 60747-17:2020.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2021-07-26
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2023-10-26
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Endorsement notice
The text of the International Standard IEC 60747-17:2020 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards
indicated:
IEC 60060-1:2010 NOTE Harmonized as EN 60060-1:2010 (not modified)
IEC 60068-1:2013 NOTE Harmonized as EN 60068-1:2014 (not modified)
IEC 60068-2-6:2007 NOTE Harmonized as EN 60068-2-6:2008 (not modified)
IEC 60068-2-17:1994 NOTE Harmonized as EN 60068-2-17:1994 (not modified)
IEC 60068-2-27:2008 NOTE Harmonized as EN 60068-2-27:2009 (not modified)
IEC 60270:2000 NOTE Harmonized as EN 60270:2001 (not modified)
IEC 60664-4:2005 NOTE Harmonized as EN 60664-4:2006 (not modified)
IEC 60747-5-5:2007 NOTE Harmonized as EN 60747-5-5:2011 (not modified)
IEC 61000-4-5:2014 NOTE Harmonized as EN 61000-4-5:2014 (not modified)
IEC 61000-4-8:2009 NOTE Harmonized as EN 61000-4-8:2010 (not modified)
IEC 61000-4-9:2016 NOTE Harmonized as EN 61000-4-9:2016 (not modified)
IEC 61649:2008 NOTE Harmonized as EN 61649:2008 (not modified)
IEC 62368-1:2018 NOTE Harmonized as EN IEC 62368-1:2020 (not modified)
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any amendments)
applies.
NOTE 1 Where an International Publication has been modified by common modifications, indicated by (mod),
the relevant EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available
here: www.cenelec.eu.
Publication Year Title EN/HD Year
IEC 60068-2-1 2007 Environmental testing - Part 2-1: Tests - EN 60068-2-1 2007
Test A: Cold
IEC 60068-2-2 2007 Environmental testing - Part 2-2: Tests - EN 60068-2-2 2007
Test B: Dry heat
IEC 60068-2-14 2009 Environmental testing - Part 2-14: Tests - EN 60068-2-14 2009
Test N: Change of temperature
IEC 60068-2-20 2008 Environmental testing - Part 2-20: Tests - EN 60068-2-20 2008
Test T: Test methods for solderability and
resistance to soldering heat of devices
with leads
IEC 60068-2-30 2005 Environmental testing - Part 2-30: Tests - EN 60068-2-30 2005
Test Db: Damp heat, cyclic (12 h + 12 h
cycle)
IEC 60068-2-58 2015 Environmental testing - Part 2-58: Tests - EN 60068-2-58 2015
Test Td: Test methods for solderability,
resistance to dissolution of metallization
and to soldering heat of surface mounting
devices (SMD)
IEC 60068-2-67 1995 Environmental testing - Part 2-67: Tests - EN 60068-2-67 1996
Test Cy: Damp heat, steady state,
accelerated test primarily intended for
components
IEC 60112 2003 Method for the determination of the proof EN 60112 2003
and the comparative tracking indices of
solid insulating materials
IEC 60216-1 2013 Electrical insulating materials - Thermal EN 60216-1 2013
endurance properties - Part 1: Ageing
procedures and evaluation of test results
Publication Year Title EN/HD Year
IEC 60216-2 2005 Electrical insulating materials - Thermal EN 60216-2 2005
endurance properties - Part 2:
Determination of thermal endurance
properties of electrical insulating
materials - Choice of test criteria
IEC 60664-1 2007 Insulation coordination for equipment EN 60664-1 2007
within low-voltage systems - Part 1:
Principles, requirements and tests
IEC 60672-2 1999 Ceramic and glass insulating materials - EN 60672-2 2000
Part 2: Methods of test
IEC 60695-11-5 2016 Fire hazard testing - Part 11-5: Test EN 60695-11-5 2017
flames - Needle-flame test method -
Apparatus, confirmatory test arrangement
and guidance
IEC 62539 2007 Guide for the statistical analysis of - -
electrical insulation breakdown data
IEC 60747-17 ®
Edition 1.0 2020-09
INTERNATIONAL
STANDARD
Semiconductor devices –
Part 17: Magnetic and capacitive coupler for basic and reinforced insulation
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.080.99 ISBN 978-2-8322-8801-6
– 2 – IEC 60747-17:2020 © IEC 2020
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 8
4 Electrical characteristics – Coupler logic and timing definitions . 19
5 Coupler for protection against electrical shock . 20
5.1 General . 20
5.2 Type . 20
5.3 Ratings . 20
5.3.1 General . 20
5.3.2 Safety limiting values . 20
5.3.3 Functional ratings . 20
5.3.4 Rated isolation voltages. 20
5.4 Electrical safety requirements . 20
5.5 Electrical, environmental and/or endurance test information . 21
5.5.1 General . 21
5.5.2 Routine test . 23
5.5.3 Sample test . 23
5.5.4 Maximum surge isolation voltage . 23
5.5.5 Type test . 24
6 Measuring methods for couplers . 35
6.1 General . 35
6.2 Isolation capacitance (C ) . 35
lO
6.2.1 Purpose . 35
6.2.2 Circuit diagram . 35
6.2.3 Measurement procedure . 36
6.2.4 Precautions to be observed . 36
6.2.5 Special conditions . 36
6.3 Isolation resistance between input and output, R . 36
lO
6.3.1 Purpose . 36
6.3.2 Circuit diagram . 36
6.3.3 Precautions to be observed . 37
6.3.4 Measurement procedure . 37
6.3.5 Special conditions . 37
6.4 Isolation test . 37
6.4.1 Purpose . 37
6.4.2 Circuit diagram . 37
6.4.3 Test procedure . 38
6.4.4 Requirements . 38
6.5 Partial discharges of coupler . 39
6.5.1 Purpose . 39
6.5.2 Circuit diagram . 39
6.5.3 Description of Figure 9 test circuit and requirements . 39
6.5.4 Test procedure . 40
6.5.5 Description of calibration circuit (see Figure 10) . 40
IEC 60747-17:2020 © IEC 2020 – 3 –
6.5.6 Test methods . 41
6.5.7 Specified conditions . 41
6.5.8 Test voltage conditions . 42
6.6 Switching times of couplers .
...
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