ESL measuring method - Part 2: Surface mount capacitors for use in electronic equipment

IEC 62490-2:2010 provides the ESL measuring method for the surface mount capacitors for use in electronic equipment.

ESL-Messverfahren - Teil 2: Oberflächenmontierbare Kondensatoren zur Verwendung in Geräten der Elektrotechnik und Elektronik

Méthode de mesure de l'ESL - Partie 2: Condensateurs pour montage en surface utilisés dans les équipements électroniques

La CEI 62490-2:2010 fournit la méthode de mesure de l'inductance série équivalente L (ESL) destinée aux condensateurs pour montage en surface utilisés dans les équipements électroniques.

Merilna metoda ESL - 2. del: Kondenzatorji za površinsko montažo v elektronski opremi (IEC 62490-2:2010)

General Information

Status
Published
Publication Date
02-Sep-2010
Technical Committee
Drafting Committee
Parallel Committee
Current Stage
6060 - Document made available
Due Date
03-Sep-2010
Completion Date
03-Sep-2010

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SLOVENSKI STANDARD
SIST EN 62490-2:2010
01-november-2010
Merilna metoda ESL - 2. del: Kondenzatorji za površinsko montažo v elektronski
opremi (IEC 62490-2:2010)
ESL measuring method - Part 2: Surface mount capacitors for use in electronic
equipment (IEC 62490-2:2010)

ESL-Messverfahren - Teil 2: Oberflächenmontierbare Kondensatoren zur Verwendung in

Geräten der Elektrotechnik und Elektronik (IEC 62490-2:2010)

Méthode de mesure de l'ESL - Partie 2: Condensateurs pour montage en surface utilisés

dans les équipements électroniques (CEI 62490-2:2010)
Ta slovenski standard je istoveten z: EN 62490-2:2010
ICS:
31.060.01 Kondenzatorji na splošno Capacitors in general
SIST EN 62490-2:2010 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN 62490-2:2010
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SIST EN 62490-2:2010
EUROPEAN STANDARD
EN 62490-2
NORME EUROPÉENNE
September 2010
EUROPÄISCHE NORM
ICS 31.060.01
English version
ESL measuring method -
Part 2: Surface mount capacitors for use in electronic equipment
(IEC 62490-2:2010)
Méthode de mesure de l'ESL - ESL-Messverfahren -
Partie 2: Condensateurs pour montage Teil 2: Oberflächenmontierbare
en surface utilisés dans les équipements Kondensatoren zur Verwendung
électroniques in Geräten der Elektrotechnik
(CEI 62490-2:2010) und Elektronik
(IEC 62490-2:2010)

This European Standard was approved by CENELEC on 2010-09-01. CENELEC members are bound to comply

with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard

the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on

application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other

language made by translation under the responsibility of a CENELEC member into its own language and notified

to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,

the Czech Republic, Denmark, Estonia, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy,

Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia,

Spain, Sweden, Switzerland and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Management Centre: Avenue Marnix 17, B - 1000 Brussels

© 2010 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 62490-2:2010 E
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SIST EN 62490-2:2010
EN 62490-2:2010 - 2 -
Foreword

The text of document 40/2045/FDIS, future edition 1 of IEC 60490-2, prepared by IEC TC 40, Capacitors

and resistors for electronic equipment, was submitted to the IEC-CENELEC parallel vote and was

approved by CENELEC as EN 62490-2 on 2010-09-01.

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CEN and CENELEC shall not be held responsible for identifying any or all such patent

rights.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
(dop) 2011-06-01
national standard or by endorsement
– latest date by which the national standards conflicting
(dow) 2013-09-01
with the EN have to be withdrawn
Annex ZA has been added by CENELEC.
__________
Endorsement notice

The text of the International Standard IEC 62490-2:2010 was approved by CENELEC as a European

Standard without any modification.
__________
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SIST EN 62490-2:2010
- 3 - EN 62490-2:2010
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following referenced documents are indispensable for the application of this document. For dated

references, only the edition cited applies. For undated references, the latest edition of the referenced

document (including any amendments) applies.

NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD

applies.
Publication Year Title EN/HD Year
IEC 60384-1 2008 Fixed capacitors for use in electronic EN 60384-1 2009
equipment -
Part 1: Generic specification
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SIST EN 62490-2:2010
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SIST EN 62490-2:2010
IEC 62490-2
Edition 1.0 2010-07
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
ESL measuring method –
Part 2: Surface mount capacitors for use in electronic equipment
Méthode de mesure de l’ESL –
Partie 2: Condensateurs pour montage en surface utilisés dans les équipements
électroniques
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX
ICS 31.060.01 ISBN 978-2-88912-069-7
® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN 62490-2:2010
– 2 – 62490-2 © IEC:2010
CONTENTS

FOREWORD...........................................................................................................................3

1 Scope...............................................................................................................................5

2 Normative references .......................................................................................................5

3 Terms and definitions .......................................................................................................6

4 Test fixture and compensation chip ..................................................................................6

4.1 Test fixture ..............................................................................................................6

4.2 The open, short, and load compensation chip..........................................................9

4.2.1 The open compensation chip .......................................................................9

4.2.2 The load compensation chip ........................................................................9

4.2.3 The short compensation chip .......................................................................9

5 Measuring method..........................................................................................................10

5.1 Measuring equipment ............................................................................................10

5.2 Measurement conditions........................................................................................10

5.3 Measurement points ..............................................................................................10

5.4 Frequency and signal level....................................................................................10

5.5 Measurement procedure........................................................................................11

5.5.1 General .....................................................................................................11

5.5.2 Open compensation...................................................................................11

5.5.3 Load compensation ...................................................................................11

5.5.4 Short compensation...................................................................................12

5.5.5 ESL measurement .....................................................................................13

6 Items to be indicated in the test result report ..................................................................13

Annex A (informative) Theoretical ESL value of the short compensation chip.......................14

Figure 1 – Lead frame and thin coating types of surface mount capacitors and the

specification of the dimensions (L, W, and H)..........................................................................5

Figure 2 – Surface mount capacitors with face down terminal .................................................5

Figure 3 – Test fixture and terminals of test fixture .................................................................6

Figure 4 – Connection diagram ...............................................................................................7

Figure 5 – Sectional view of the test fixture with an inserted surface mount capacitor

pressured to the terminals of the test fixture ...........................................................................8

Figure 6 – Example of surface mount capacitor mounted on terminals of test fixture ...............8

Figure 7 – Front view of mounting position of objects on test fixture........................................9

Figure 8 – Measurement points.............................................................................................10

Figure 9 – Open compensation-chip position.........................................................................11

Figure 10 – Load compensation-chip position .......................................................................12

Figure 11 – Short compensation-chip position.......................................................................12

Figure A.1 – Points of contact of the short compensation chip and terminals of test

fixture ...................................................................................................................................15

Table A.1 – The calculation results of inductance of the short compensation chip.................14

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SIST EN 62490-2:2010
62490-2 © IEC:2010 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
ESL MEASURING METHOD –
Part 2: Surface mount capacitors
for use in electronic equipment
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC

Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested

in the subject dealt with may participate in this preparatory work. International, governmental and non-

governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely

with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opinion on the relevant subjects since each technical committee has representation from all

interested IEC National Committees.

3) IEC Publications have the form of recommendations for international use and are accepted by IEC National

Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC

Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any

misinterpretation by any end user.

4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications

transparently to the maximum extent possible in their national and regional publications. Any divergence

between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in

the latter.

5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity

assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any

services carried out by independent certification bodies.

6) All users should ensure that they have the latest edition of this publication.

7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and

members of its technical committees and IEC National Committees for any personal injury, property damage or

other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and

expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC

Publications.

8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is

indispensable for the correct application of this publication.

9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of

patent rights. IEC shall not be held responsible for identifying any or all such patent rights.

International Standard IEC 62490-2 has been prepared by IEC technical committee 40:

Capacitors and resistors for electronic equipment.
The text of this standard is based on the following documents:
FDIS Report on voting
40/2045/FDIS 40/2057/RVD

Full information on the voting for the approval of this standard can be found in the report on

voting indicated in the above table.

This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.

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SIST EN 62490-2:2010
– 4 – 62490-2 © IEC:2010

A list of all the parts in the IEC 62490 series, under the general title ESL measuring method,

can be found on the IEC web site.

The committee has decided that the contents of this publication will remain unchanged until

the stability date indicated on the IEC web site under "http://webstore.iec.ch" in the data

related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.

IMPORTANT – The 'colour inside' logo on the cover page of this publication indicates

that it contains colours which are considered to be useful f
...

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