EN 60749-4:2002

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 4: Feuchte Wärme, konstant, Prüfung mit hochbeschleunigter Wirkung (HAST)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 4: Essai continu fortement acceléré de contrainte de chaleur humide (HAST)

Décrit un essai de contrainte de température et d'humidité fortement accéléré (HAST) qui est réalisé dans le but d'évaluer la fiabilité des dispositifs à semiconducteurs sous boîtier non hermétique dans les environnements humides.

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST) (IEC 60749- 4:2002)

General Information

• Status: Withdrawn
• Publication Date: 12-Aug-2002
• Withdrawal Date: 30-Jun-2005
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: CLC/SR 47 - Semiconductor devices
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Parallel Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 9960 - Withdrawal effective - Withdrawal
• Start Date: 07-Apr-2020
• Completion Date: 07-Apr-2020
• Ref Project: SIST EN 60749-4:2004 - Semiconductor devices - Mechanical and climatic test methods -- Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

Relations

• Replaces: EN 60749:1999/A1:2000 - Semiconductor devices - Mechanical and climatic test methods
• Effective Date: 29-Jan-2023
• Replaced By: EN 60749-4:2017 - Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
• Effective Date: 08-Mar-2016

Standards Content (Sample)

SLOVENSKI SIST EN 60749-4:2004

STANDARD
julij 2004
Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat,
steady state, highly accelerated stress test (HAST) (IEC 60749- 4:2002)
ICS 31.080.01 Referenčna številka
SIST EN 60749-4:2004(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 60749-4
NORME EUROPÉENNE
EUROPÄISCHE NORM August 2002
ICS 31.080.01 Partly supersedes EN 60749:1999 + A1:2000 + A2:2001
English version
Semiconductor devices –
Mechanical and climatic test methods
Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
(IEC 60749-4:2002)
Dispositifs à semiconducteurs – Halbleiterbauelemente -
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques Prüfverfahren
Partie 4: Essai continu fortement acceléré Teil 4: Feuchte Wärme, konstant, Prüfung
de contrainte de chaleur humide (HAST) mit hochbeschleunigter Wirkung (HAST)
(CEI 60749-4:2002) (IEC 60749-4:2002)
This European Standard was approved by CENELEC on 2002-07-02. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60749-4:2002 E

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EN 60749-4:2002 - 2 -
Foreword
The text of document 47/1602/FDIS, future edition 1 of IEC 60749-4, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-4 on 2002-07-02.
This mechanical and climatic test method, as it relates to damp heat, steady state, highly accelerated
stress test (HAS), is a complete rewrite of the test contained in clause 4C, chapter 3 of EN 60749:1999.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2003-04-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2005-07-01
__________
Endorsement notice
The text of the International Standard IEC 60749-4:2002 was approved by CENELEC as a European
Standard without any modification.
__________

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NORME CEI
INTERNATIONALE IEC
60749-4
INTERNATIONAL
Première édition
STANDARD
First edition
2002-04
Dispositifs à semiconducteurs –
Méthodes d'essais mécaniques et climatiques –
Partie 4:
Essai continu fortement accéléré
de contrainte de chaleur humide (HAST)
Semiconductor devices –
Mechanical and climatic test methods –
Part 4:
Damp heat, steady state,
highly accelerated stress test (HAST)
 IEC 2002 Droits de reproduction réservés  Copyright - all rights reserved
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microfilms, sans l'accord écrit de l'éditeur. the publisher.
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Telephone: [phone] Telefax: [phone] E-mail: [e-mail]  Web: www.iec.ch
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Pour prix, voir catalogue en vigueur
For price, see current catalogue

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60749-4  IEC:2002 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
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SEMICON
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