ENV 50219:1996
(Main)Description of the reliability test structures of the European mini test chip
Description of the reliability test structures of the European mini test chip
D116/196: TC 217 disbanded * D124/C049: Withdrawn
Description of the reliability test structures of the European mini test chip
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
SIST ENV 50219:2002
01-september-2002
Description of the reliability test structures of the European mini test chip
Description of the reliability test structures of the European mini test chip
Ta slovenski standard je istoveten z: ENV 50219:1996
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
SIST ENV 50219:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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