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SIST ENV 50219:2002

(Main)

Description of the reliability test structures of the European mini test chip

Description of the reliability test structures of the European mini test chip

D116/196: TC 217 disbanded * D124/C049: Withdrawn

Description of the reliability test structures of the European mini test chip

General Information

Status
Withdrawn
Publication Date
31-Aug-2002
Withdrawal Date
20-Oct-2009
ICS
31.200 - Integrated circuits. Microelectronics
Technical Committee
I11 - Imaginarni 11
Current Stage
9900 - Withdrawal (Adopted Project)
Start Date
19-Oct-2009
Due Date
11-Nov-2009
Completion Date
21-Oct-2009
Ref Project
ENV 50219:1996 - Description of the reliability test structures of the European mini test chip

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SLOVENSKI STANDARD
SIST ENV 50219:2002
01-september-2002
Description of the reliability test structures of the European mini test chip
Description of the reliability test structures of the European mini test chip
Ta slovenski standard je istoveten z: ENV 50219:1996
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
SIST ENV 50219:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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