EN 60749-18:2003

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 gamma ray source. Proposes an accelerated annealing test for estimating low dose rate ionizing radiation effects on devices. This annealing test is important for low dose rate or certain other applications in which devices may exhibit significant time-dependent effects. It is intended for military- and space-related applications.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 18: Ionisierende Strahlung (Gesamtdosis)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 18: Rayonnements ionisants (dose totale)

Présente une procédure d'essai permettant de définir les exigences des essais des circuits intégrés sous boîtier et des dispositifs discrets à semiconducteurs concernant les effets des rayonnements ionisants (dose totale) provenant d'une source de rayons gamma au cobalt-60. Propose un essai de recuit accéléré pour l'estimation des effets des rayonnements ionisants à faible débit de dose sur les dispositifs. Cet essai de recuit est important pour les faibles débits de dose ou certaines autres applications dans lesquelles les dispositifs peuvent présenter des effets liés au temps significatifs. Cet essai est destiné aux applications des domaines militaire et spatial.

Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) (IEC 60749-18:2002)

General Information

• Status: Withdrawn
• Publication Date: 06-Feb-2003
• Withdrawal Date: 31-Jan-2006
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: CLC/SR 47 - Semiconductor devices
• Drafting Committee: IEC/TC 47 - IEC_TC_47
• Parallel Committee: IEC/TC 47 - IEC_TC_47
• Current Stage: 9960 - Withdrawal effective - Withdrawal
• Start Date: 15-May-2022
• Completion Date: 15-May-2022
• Ref Project: SIST EN 60749-18:2004 - Semiconductor devices - Mechanical and climatic test methods -- Part 18: Ionizing radiation (total dose)

Relations

• Replaced By: EN IEC 60749-18:2019 - Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)
• Effective Date: 23-Jan-2023

Standards Content (Sample)

SLOVENSKI SIST EN 60749-18:2004

STANDARD
julij 2004
Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing
radiation (total dose) (IEC 60749-18:2002)
ICS 31.080.01 Referenčna številka
SIST EN 60749-18:2004(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 60749-18
NORME EUROPÉENNE
EUROPÄISCHE NORM February 2003

ICS 31.080.01


English version


Semiconductor devices –
Mechanical and climatic test methods
Part 18: Ionizing radiation (total dose)
(IEC 60749-18:2002)


Dispositifs à semiconducteurs –  Halbleiterbauelemente –
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques Prüfverfahren
Partie 18: Rayonnements ionisants Teil 18: Ionisierende Strahlung
(dose totale) (Gesamtdosis)
(CEI 60749-18:2002) (IEC 60749-18:2002)






This European Standard was approved by CENELEC on 2003-02-01. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.

CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung

Central Secretariat: rue de Stassart 35, B - 1050 Brussels


© 2003 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.

Ref. No. EN 60749-18:2003 E

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EN 60749-18:2003 - 2 -
Foreword

The text of document 47/1657/FDIS, future edition 1 of IEC 60749-18, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-18 on 2003-02-01.

The following dates were fixed:

– latest date by which the EN has to be implemented
 at national level by publication of an identical
 national standard or by endorsement (dop) 2003-11-01

– latest date by which the national standards conflicting
 with the EN have to be withdrawn (dow) 2006-02-01
__________

Endorsement notice

The text of the International Standard IEC60749-18:2002 was approved by CENELEC as a European
Standard without any modification.
__________

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NORME CEI
INTERNATIONALE IEC
60749-18
INTERNATIONAL
Première édition
STANDARD
First edition
2002-12
Dispositifs à semiconducteurs –
Méthodes d'essais mécaniques et climatiques –
Partie 18:
Rayonnements ionisants (dose totale)
Semiconductor devices –
Mechanical and climatic test methods –
Part 18:
Ionizing radiation (total dose)
© IEC 2002 Droits de reproduction réservés ⎯ Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
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microfilms, sans l'accord écrit de l'éditeur. the publisher.
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Pour prix, voir catalogue en vigueur
For price, see current catalogue

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60749-18 © IEC:2002 – 3 –
CONTENTS
FOREWORD . 5
1 Scope . 7
2 Terms and definitions .
...