Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 12: Schwingen, variable Frequenz

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 12: Vibrations, fréquences variables

l'IEC 60749-12:2017 décrit l’essai de vibrations à fréquences variables réalisé pour déterminer l’effet des vibrations sur les éléments de la structure interne, dans les limites de la gamme des fréquences spécifiées. Il s’agit d’un essai destructif. Il est normalement applicable aux boîtiers de type à cavité. Cette deuxième édition annule et remplace la première édition parue en 2002. La présente édition constitue une révision technique. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: a) alignement sur le document MIL-STD-883J Méthode 2007, Vibrations, fréquences variables.

Polprevodniški elementi - Mehanske in klimatske preskusne metode - 12. del: Vibracije, spremenljiva frekvenca (IEC 60749-12:2017)

Ta del standarda IEC 60749 opisuje preskus za določitev učinka tresljajev s spremenljivo pogostostjo v določenem frekvenčnem območju na notranje gradbene elemente. To je porušitveni preskus. Običajno se uporablja za enote votlinaste oblike.
OPOMBA: ta preskusna metoda opisuje preskus spreminjajočega sinusnega signala. Naključni vibracijski preskus je opisan v dokumentu JESD 22-B103 standarda JEDEC.

General Information

Status
Published
Publication Date
08-Mar-2018
Drafting Committee
Current Stage
6060 - Document made available
Due Date
09-Mar-2018
Completion Date
09-Mar-2018

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SLOVENSKI STANDARD
SIST EN IEC 60749-12:2018
01-maj-2018
1DGRPHãþD
SIST EN 60749-12:2004
Polprevodniški elementi - Mehanske in klimatske preskusne metode - 12. del:
Vibracije, spremenljiva frekvenca (IEC 60749-12:2017)

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration,

variable frequency (IEC 60749-12:2017)
Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren - Teil 12:
Schwingen, variable Frequenz (IEC 60749-12:2017)

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie

12: Vibrations, fréquences variables (IEC 60749-12:2017)
Ta slovenski standard je istoveten z: EN IEC 60749-12:2018
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN IEC 60749-12:2018 en

2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

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SIST EN IEC 60749-12:2018
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SIST EN IEC 60749-12:2018
EUROPEAN STANDARD EN IEC 60749-12
NORME EUROPÉENNE
EUROPÄISCHE NORM
March 2018
ICS 31.080.01 Supersedes EN 60749-12:2002
English Version
Semiconductor devices - Mechanical and climatic test methods -
Part 12: Vibration, variable frequency
(IEC 60749-12:2017)

Dispositifs à semiconducteurs - Méthodes d'essais Halbleiterbauelemente - Mechanische und klimatische

mécaniques et climatiques - Partie 12: Vibrations, Prüfverfahren - Teil 12: Schwingen, variable Frequenz

fréquences variables (IEC 60749-12:2017)
(IEC 60749-12:2017)

This European Standard was approved by CENELEC on 2018-01-17. CENELEC members are bound to comply with the CEN/CENELEC

Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.

Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC

Management Centre or to any CENELEC member.

This European Standard exists in three official versions (English, French, German). A version in any other language made by translation

under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the

same status as the official versions.

CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,

Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,

Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Serbia, Slovakia, Slovenia, Spain, Sweden,

Switzerland, Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Rue de la Science 23, B-1040 Brussels

© 2018 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.

Ref. No. EN IEC 60749-12:2018 E
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SIST EN IEC 60749-12:2018
EN IEC 60749-12:2018 (E)
European foreword

The text of document 47/2386/CDV, future edition 2 of IEC 60749-12, prepared by IEC/TC 47

"Semiconductor devices" was submitted to the IEC-CENELEC parallel vote and approved by

CENELEC as EN IEC 60749-12:2018.
The following dates are fixed:
(dop) 2018-10-17
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2021-01-17
standards conflicting with the
document have to be withdrawn
This document supersedes EN 60749-12:2002.

Attention is drawn to the possibility that some of the elements of this document may be the subject of

patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.

Endorsement notice

The text of the International Standard IEC 60749-12:2017 was approved by CENELEC as a European

Standard without any modification.

In the official version, for Bibliography, the following note has to be added for the standard indicated:

IEC 60068-2-6 NOTE Harmonized as EN 60068-2-6.
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SIST EN IEC 60749-12:2018
IEC 60749-12
Edition 2.0 2017-12
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Semiconductor devices – Mechanical and climatic test methods –
Part 12: Vibration, variable frequency
Dispositifs à semiconducteurs – Méthodes d’essais mécaniques et climatiques –
Partie 12: Vibrations, fréquences variables
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 31.080.01 ISBN 978-2-8322-5156-0

Warning! Make sure that you obtained this publication from an authorized distributor.

Attention! Veuillez vous assurer que vous avez obtenu cette publication via un distributeur agréé.

® Registered trademark of the International Electrotechnical Commission
Marque déposée de la Commission Electrotechnique Internationale
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SIST EN IEC 60749-12:2018
– 2 – IEC 60749-12:2017 © IEC 2017
CONTENTS

FOREWORD ........................................................................................................................... 3

1 Scope .............................................................................................................................. 5

2 Normative references ...................................................................................................... 5

3 Terms and definitions ...................................................................................................... 5

4 Test apparatus ................................................................................................................ 5

5 Test method .................................................................................................................... 5

6 Examination and test measurements ............................................................................... 6

7 Failure criteria ................................................................................................................. 6

8 Summary ......................................................................................................................... 6

Bibliography ............................................................................................................................ 7

Table 1 – Test conditions ........................................................................................................ 6

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SIST EN IEC 60749-12:2018
IEC 60749-12:2017 © IEC 2017 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES – MECHANICAL
AND CLIMATIC TEST METHODS –
Part 12: Vibration, variable frequency
FOREWORD

1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising

all national electrotechnical committees (IEC National Committees). The object of IEC is to promote

international co-operation on all questions concerning standardization in the electrical and electronic fields. To

this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,

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with the International Organization for Standardization (ISO) in accordance with conditions determined by

agreement between the two organizations.

2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international

consensus of opini
...

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