EN 60444-6:2013
(Main)Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following significant technical changes with respect to the previous edition: a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal modes at present time. Therefore, this method made the transition to the Annex B. b) High reliability crystal unit is needed to use for various applications at the present day, in order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference measurement method was introduced into this specification.
Messung von Schwingquarz-Parametern - Teil 6: Messung der Belastungsabhängigkeit (DLD)
Mesure des paramètres des résonateurs à quartz - Partie 6: Mesure de la dépendance du niveau d'excitation (DNE)
La CEI 60444-6:2013 s'applique aux mesures de la dépendance du niveau d'excitation (DNE) des résonateurs à quartz. Deux méthodes d'essai et une méthode de référence sont décrites. Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente: a) La mesure de DNE avec le circuit oscillation utilisait la méthode traditionnelle de détection des modes anormaux DNE au temps présent. Donc, cette méthode fait la transition avec l'Annexe B. b) La grande fiabilité de l'unité de cristal utilisé est nécessaire pour diverses applications actuelles, pour permettre de mettre à jour les capacités d'inspection des modes anormaux des DNE, la méthode de mesure de référence de multi-niveaux a été présentée dans cette spécification.
Meritve parametrov kvarčno-kristalnih enot - 6. del: Merjenje odvisnosti od ravni napajanja
Ta del standarda IEC 60444 se uporablja za merjenje odvisnosti od ravni napajanja (DLD) pri kvarčno-kristalnih enotah. Opisani sta dve preskusni metodi (A in C) in ena referenčna metoda (B). »Metoda A«, ki v skladu s standardom IEC 60444-1 temelji na omrežju π, se lahko uporablja za celotno frekvenčno območje, ki ga pokriva ta del standarda IEC 60444. »Referenčna metoda B«, ki v skladu s standardom IEC 60444-1, IEC 60444-5 ali IEC 60444-8 temelji na omrežju π ali odbojni metodi, se lahko uporablja za celotno frekvenčno območje, ki ga pokriva ta del standarda IEC 60444. »Metoda C«, tj. oscilatorska metoda, je primerna za meritve kristalnih enot v temeljnem načinu v večjih količinah s fiksnimi pogoji.
General Information
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Standards Content (Sample)
SLOVENSKI STANDARD
01-januar-2014
1DGRPHãþD
SIST EN 60444-6:2002
0HULWYHSDUDPHWURYNYDUþQRNULVWDOQLKHQRWGHO 0HUMHQMHRGYLVQRVWLRGUDYQL
QDSDMDQMD
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level
dependence (DLD)
/
Mesure des paramètres des résonateurs à quartz - Partie 6: Mesure de la dépendance
du niveau d'excitation (DNE)
Ta slovenski standard je istoveten z: EN 60444-6:2013
ICS:
31.140 3LH]RHOHNWULþQHLQ Piezoelectric and dielectric
GLHOHNWULþQHQDSUDYH devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD
EN 60444-6
NORME EUROPÉENNE
October 2013
EUROPÄISCHE NORM
ICS 31.140 Supersedes EN 60444-6:1997
English version
Measurement of quartz crystal unit parameters -
Part 6: Measurement of drive level dependence (DLD)
(IEC 60444-6:2013)
Mesure des paramètres des résonateurs Messung von Schwingquarz-Parametern -
à quartz - Teil 6: Messung der
Partie 6: Mesure de la dépendance du Belastungsabhängigkeit (DLD)
niveau d'excitation (DNE) (IEC 60444-6:2013)
(CEI 60444-6:2013)
This European Standard was approved by CENELEC on 2013-07-24. CENELEC members are bound to comply
with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard
the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the CEN-CENELEC Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and notified
to the CEN-CENELEC Management Centre has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus,
the Czech Republic, Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany,
Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland,
Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and the United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B - 1000 Brussels
© 2013 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60444-6:2013 E
Foreword
The text of document 49/1004/CDV, future edition 2 of IEC 60444-6, prepared by IEC/TC 49,
"Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control,
selection and detection" was submitted to the IEC-CENELEC parallel vote and approved by
CENELEC as EN 60444-6:2013.
The following dates are fixed:
(dop) 2014-04-24
• latest date by which the document has
to be implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2016-07-24
standards conflicting with the
document have to be withdrawn
This document supersedes EN 60444-6:1997.
EN 60444-6:1997:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD abnormal
modes at present time. Therefore, this method made the transition to the Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in order to
upgrade the inspection capabilities for DLD abnormal modes, the multi-level reference
measurement method was introduced into this specification.
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 60444-6:2013 was approved by CENELEC as a European
Standard without any modification.
- 3 - EN 60444-6:2013
Annex ZA
(normative)
Normative references to i nternational publications
with their corresponding European publications
The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant EN/HD
applies.
Publication Year Title EN/HD Year
IEC 60444-1 - Measurement of quartz crystal unit EN 60444-1 -
parameters by zero phase technique
in a pi-network -
Part 1: Basic method for the measurement
of resonance frequency and resonance
resistance of quartz crystal units by zero
phase technique in a pi-network
IEC 60444-5 - Measurement of quartz crystal unit EN 60444-5 -
parameters -
Part 5: Methods for the determination of
equivalent electrical parameters using
automatic network analyzer techniques and
error correction
IEC 60444-8 - Measurement of quartz crystal unit EN 60444-8 -
parameters -
Part 8: Test fixture for surface mounted
quartz crystal units
IEC 60444-6 ®
Edition 2.0 2013-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Measurement of quartz crystal unit parameters –
Part 6: Measurement of drive level dependence (DLD)
Mesure des paramètres des résonateurs à quartz –
Partie 6: Mesure de la dépendance du niveau d'excitation (DNE)
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX R
ICS 31.140 ISBN 978-2-83220-876-2
– 2 – 60444-6 IEC:2013
CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 DLD effects . 6
3.1 Reversible changes in frequency and resistance . 6
3.2 Irreversible changes in frequency and resistance . 6
3.3 Causes of DLD effects . 7
4 Drive levels for DLD measurement . 7
5 Test methods. 8
5.1 Method A (Fast standard measurement method) . 8
5.1.1 Testing at two drive levels . 8
5.1.2 Testing according to specification . 8
5.2 Method B (Multi-level reference measurement method) . 9
Annex A (normative) Relationship between electrical drive level and mechanical
displacement of quartz crystal units . 11
Annex B (normative) Method C: DLD measurement with oscillation circuit . 14
Bibliography . 19
Figure 1 – Maximum tolerable resistance ratio γ for the drive level dependence as a
function of the resistances R or R . 9
r2 r3
Figure B.1 – Insertion of a quartz crystal unit in an oscillator . 14
Figure B.2 – Crystal unit loss resistance as a function of dissipated power . 15
Figure B.3 – Behaviour of the R of a quartz crystal units . 16
r
Figure B.4 – Block diagram of circuit system . 16
Figure B.5 – Installed −R in scanned drive level range . 17
osc
Figure B.6 – Drive level behavior of a quartz crystal unit if −R = 70 Ω is used as
osc
test limit in the “Annex B” test . 17
Figure B.7 – Principal schematic diagram of the go/no-go test circuit . 18
60444-6 IEC:2013 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS –
Part 6: Measurement of drive level dependence (DLD)
FOREWORD
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indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 60444-6 has been prepared by lEC technical committee 49:
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency
control, selection and detection.
This second edition cancels and replaces the first edition published in 1995. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) DLD measurement with oscillation circuit had the traditional method to detect the DLD
abnormal modes at present time. Therefore, this method made the transition to the
Annex B.
b) High reliability crystal unit is needed to use for various applications at the present day, in
order to upgrade the inspection capabilities for DLD abnormal modes, the multi-level
reference measurement method was introduced into this specification.
– 4 – 60444-6 IEC:2013
The text of this standard is
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