iTeh StandardsiTeh Standards
EURUSD
Your shopping cart is empty.
CLC

EN 190116:1993

(Main)

Family Specification: AC MOS Digital integrated circuits

Family Specification: AC MOS Digital integrated circuits

This document relates to AC MOS Digital Integrated Circuits.

Familienspezifikation: AC MOS digitale integrierte Schaltungen

Spécification de famille : circuits intégrés logiques AC MOS

Family specification: AC MOS Digital integrated circuits

General Information

Status
Withdrawn
Publication Date
14-Aug-1993
Withdrawal Date
10-Jan-2004
ICS
31.200 - Integrated circuits. Microelectronics
Technical Committee
CLC/SR 47A - Integrated circuits
Drafting Committee
IEC/SC 47A - IEC_SC_47A
Parallel Committee
IEC/SC 47A - IEC_SC_47A
Current Stage
Ref Project
SIST EN 190116:2002 - Family Specification: AC MOS Digital integrated circuits

Buy Standard

EN 190116:2002EN 190116:2002
PreviousNext
Standard
EN 190116:2002
English language
30 pages
sale 10% off
Preview
sale 10% off
Preview
e-Library read for
1 day

Standards Content (Sample)

SLOVENSKI STANDARD
SIST EN 190116:2002
01-september-2002
Family specification: AC MOS Digital integrated circuits
Family Specification: AC MOS Digital integrated circuits
Familienspezifikation: AC MOS digitale integrierte Schaltungen
Spécification de famille: Circuits intégrés logiques AC MOS
Ta slovenski standard je istoveten z: EN 190116:1993
ICS:
31.200 Integrirana vezja, Integrated circuits.
mikroelektronika Microelectronics
SIST EN 190116:2002 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST EN 190116:2002

---------------------- Page: 2 ----------------------

SIST EN 190116:2002

---------------------- Page: 3 ----------------------

SIST EN 190116:2002

---------------------- Page: 4 ----------------------

SIST EN 190116:2002

---------------------- Page: 5 ----------------------

SIST EN 190116:2002

---------------------- Page: 6 ----------------------

SIST EN 190116:2002

---------------------- Page: 7 ----------------------

SIST EN 190116:2002

---------------------- Page: 8 ----------------------

SIST EN 190116:2002

---------------------- Page: 9 ----------------------

SIST EN 190116:2002

---------------------- Page: 10 ----------------------

SIST EN 190116:2002

---------------------- Page: 11 ----------------------

SIST EN 190116:2002

---------------------- Page: 12 ----------------------

SIST EN 190116:2002

---------------------- Page: 13
...

Questions, Comments and Discussion

Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.

This May Also Interest You

CLC
EN IEC 62228-3:2019/AC:2023-07(Corrigendum)
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
SIST EN IEC 62228-3:2019/AC:2023
  • Corrigendum
    5 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 61967-8:2023(Main)
Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
SIST EN IEC 61967-8:2023

IEC 61967-8:2023 is available as IEC 61967-8:2023 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61967-8:2023 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement. This edition includes the following significant technical changes with respect to the previous edition: a) frequency range of 150 kHz to 3 GHz was deleted from the scope; b) extension of upper usable frequency to 6 GHz or higher as long as the defined requirements are fulfilled.

  • Standard
    20 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 62228-6:2022(Main)
Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
SIST EN IEC 62228-6:2023

This document specifies test and measurement methods for EMC evaluation of Peripheral Sensor Interface 5 (PSI5) transceiver integrated circuits (ICs) under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for PSI5 satellite ICs (e.g. sensors) and ICs with embedded PSI5 transceivers (e.g. PSI5 Electronic control unit IC). The document covers - the emission of RF disturbances, - the immunity against RF disturbances, - the immunity against impulses and - the immunity against electrostatic discharges (ESD).

  • Standard
    52 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 62228-7:2022(Main)
Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
SIST EN IEC 62228-7:2022

This part of IEC 62228 specifies test and measurement methods for the EMC evaluation of CXPI transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. This specification is applicable for standard CXPI transceiver ICs and ICs with embedded CXPI transceiver and covers - the emission of RF disturbances, - the immunity against RF disturbances, - the immunity against impulses and - the immunity against electrostatic discharges (ESD).

  • Standard
    52 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 62228-5:2021(Main)
Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
SIST EN IEC 62228-5:2021

IEC 62228-5:2021(E) specifies test and measurement methods for EMC evaluation of Ethernet transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for transceiver of the Ethernet systems  
100BASE-T1 according to ISO/IEC/IEEE 8802-3/AMD1;
100BASE-TX according to ISO/IEC/IEEE 8802-3;
1000BASE-T1 according to ISO/IEC/IEEE 8802-3/AMD4  and covers  
the emission of RF disturbances;
the immunity against RF disturbances;
the immunity against impulses;
the immunity against electrostatic discharges (ESD).

  • Standard
    112 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 61967-4:2021(Main)
Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
SIST EN IEC 61967-4:2021

IEC 61967-4:2021 is available as IEC 61967-4:2021 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 61967-4:2021 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results. This edition includes the following significant technical changes with respect to the previous edition: - frequency range of 150 kHz to 1 GHz has been deleted from the title; - recommended frequency range for 1 Ω method has been reduced to 30 MHz; - Annex G with recommendations and guidelines for frequency range extension beyond 1 GHz has been added.

  • Standard
    46 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 62433-6:2020(Main)
EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)
SIST EN IEC 62433-6:2021

IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4. The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI. This document provides: - the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC. - a universal data exchange format based on XML.

  • Standard
    58 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 62433-1:2019/AC:2020-07(Corrigendum)
EMC IC modelling - Part 1: General modelling framework
SIST EN IEC 62433-1:2019/AC:2020

TAN - // IEC Corrigendum

  • Corrigendum
    3 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 62228-3:2019(Main)
Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers
SIST EN IEC 62228-3:2019

This part of IEC 62228 specifies test and measurement methods for EMC evaluation of CAN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for CAN standard transceivers, CAN transceivers with partial networking functionality and CAN transceivers with flexible data rate capability and covers - the emission of RF disturbances, - the immunity against RF disturbances, - the immunity against impulses, and - the immunity against electrostatic discharges (ESD).

  • Standard
    77 pages
    English language
    sale 10% off
    e-Library read for
    1 day
CLC
EN IEC 62433-1:2019(Main)
EMC IC modelling - Part 1: General modelling framework
SIST EN IEC 62433-1:2019

IEC 62433-1:2019(E) specifies the framework and methodology for EMC IC macro-modelling. Terms that are commonly used in IEC 62433 (all parts), different modelling approaches, requirements and data-exchange format for each model category that is standardized in this series are defined in this document. IEC 62433-1 cancels and replaces IEC TS 62433-1 published in 2011. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to IEC TS 62433 1:2011: Incorporation of a data exchange format for an integrated circuit’s model representation.

  • Standard
    62 pages
    English language
    sale 10% off
    e-Library read for
    1 day