EN 62047-20:2014
(Main)Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
IEC 62047-20:2014 specifies terms and definitions, ratings and characteristics, and measuring methods of gyroscopes. Gyroscopes are primarily used for consumer, general industries and aerospace applications. MEMS and semiconductor lasers are widely used for device technology of gyroscopes.
Halbleiterbauelemente - Bauelemente der Mikrosystemtechnik - Teil 20: Gyroskope
Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 20: Gyroscopes
L'IEC 62047-20:2014 spécifie les termes et définitions, les valeurs assignées et les caractéristiques, ainsi que les méthodes de mesure des gyroscopes. Les gyroscopes sont principalement utilisés dans des applications grand public, des applications industrielles générales et des applications aérospatiales. Les dispositifs microélectromécaniques (MEMS, Micro-Electrical-Mechanical Systems) et les lasers à semiconducteur sont largement utilisés dans la technologie des dispositifs de gyroscopes.
Polprevodniški elementi - Mikroelektromehanski elementi - 20. del: Žiroskopi (IEC 62047-20:2014)
Standard EN IEC 62047-20 določa izraze in definicije, mejne vrednosti in karakteristike ter merilne metode žiroskopov. Žiroskopi se uporabljajo predvsem za potrošniško in splošno industrijsko uporabo ter uporabo v aeronavtiki. MEMS in polprevodniški laserji se pogosto uporabljajo za tehnologijo elementov žiroskopov. V nadaljevanju se žiroskopu lahko reče tudi žiro.
General Information
Standards Content (Sample)
SLOVENSKI STANDARD
SIST EN 62047-20:2014
01-november-2014
Polprevodniški elementi - Mikroelektromehanski elementi - 20. del: Žiroskopi (IEC
62047-20:2014)
Semiconductor devices - Micro-electromechanical devices - Part 20: Gyroscopes
/
/
Ta slovenski standard je istoveten z: EN 62047-20:2014
ICS:
31.080.01 Polprevodniški elementi Semiconductor devices in
(naprave) na splošno general
SIST EN 62047-20:2014 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
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SIST EN 62047-20:2014
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SIST EN 62047-20:2014
EUROPEAN STANDARD EN 62047-20
NORME EUROPÉENNE
EUROPÄISCHE NORM
September 2014
ICS 31.080.99
English Version
Semiconductor devices - Micro-electromechanical devices -
Part 20: Gyroscopes
(IEC 62047-20:2014)
Dispositifs à semiconducteurs - Dispositifs Halbleiterbauelemente - Bauelemente der
microélectromécaniques - Mikrosystemtechnik -
Partie 20: Gyroscopes Teil 20: Gyroskope
(CEI 62047-20:2014) (IEC 62047-20:2014)
This European Standard was approved by CENELEC on 2014-07-31. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2014 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62047-20:2014 E
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SIST EN 62047-20:2014
EN 62047-20:2014 - 2 -
Foreword
The text of document 47F/188/FDIS, future edition 1 of IEC 62047-20, prepared by SC 47F
“Microelectromechanical systems” of IEC/TC 47 “Semiconductor devices" was submitted to the
IEC-CENELEC parallel vote and approved by CENELEC as EN 62047-20:2014.
The following dates are fixed:
(dop) 2015-04-30
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2017-07-31
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62047-20:2014 was approved by CENELEC as a European
Standard without any modification.
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SIST EN 62047-20:2014
IEC 62047-20
®
Edition 1.0 2014-06
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Semiconductor devices – Micro-electromechanical devices –
Part 20: Gyroscopes
Dispositifs à semiconducteurs – Dispositifs microélectromécaniques –
Partie 20: Gyroscopes
INTERNATIONAL
ELECTROTECHNICAL
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ICS 31.080.99 ISBN 978-2-8322-1667-5
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SIST EN 62047-20:2014
– 2 – IEC 62047-20:2014 IEC 2014
CONTENTS
FOREWORD . 4
1 Scope
...
Questions, Comments and Discussion
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