IEC 61193-2:2007
(Main)Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages
Quality assessment systems - Part 2: Selection and use of sampling plans for inspection of electronic components and packages
Applies to the inspection of electronic components, packages, and also modules (referred to as "products in this standard) for use in electronic and electric equipment. It specifies sampling plans for inspection by attributes on the assumption that the acceptance number is zero (Ac = 0), including criteria for sample selection and procedures.
General Information
Standards Content (Sample)
IEC 61193-2
Edition 1.0 2007-08
INTERNATIONAL
STANDARD
Quality assessment systems –
Part 2: Selection and use of sampling plans for inspection of electronic
components and packages
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IEC 61193-2
Edition 1.0 2007-08
INTERNATIONAL
STANDARD
Quality assessment systems –
Part 2: Selection and use of sampling plans for inspection of electronic
components and packages
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
PRICE CODE
R
ICS 31.190 ISBN 2-8318-9297-X
– 2 – 61193-2 © IEC:2007(E)
CONTENTS
FOREWORD.3
INTRODUCTION.5
1 Scope.6
2 Normative references .6
3 Terms and definitions .6
4 Sampling system .7
4.1 Formation and identification of lots .7
4.2 Drawing of samples .7
4.2.1 Selection of sample items.7
4.2.2 Process of sampling .7
4.3 Sampling plans.7
4.3.1 Inspection level .7
4.3.2 Sampling plan for normal inspection .8
4.3.3 Acceptance number.8
4.3.4 Tightened or reduced inspection.8
5 Acceptance and rejection .9
5.1 Acceptability criteria .9
5.2 Disposition of rejected lots .9
6 Statistical verified quality limit (SVQL) .9
6.1 General .9
6.2 Calculation of the SVQL .10
Annex A (informative) Estimation of the statistical verified quality limit (SVQL) in
-6
nonconforming items per million (×10 ) at a confidence limit 60 %.11
Annex B (informative) Relationship between this standard and ISO 2859-1.15
Annex C (informative) Example of application of this standard (lot-by-lot inspection of
assessment level EZ in IEC/TC 40).17
Bibliography.18
Table 1 – Sample size .8
Table 2 – Sample size code letters .9
Table 3 – Coefficients for confidence level 60 % (see also A.5) .10
-6
Table A.1 – Statistical verified quality limits in nonconforming items per million (×10 ) .12
Table A.2 – np with confidence limit of 60 % for accumulated number of non-
conforming items and coefficient C .14
L
Table B.1 – Sampling plans corresponding to Table 2-A of ISO 2859-1.15
Table B.2 – Tabulated values for operating characteristic curves (p: per cent
nonconforming).16
Table C.1 – Lot-by-lot inspection of assessment level EZ – IEC/TC 40 .17
61193-2 © IEC:2007(E) – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
QUALITY ASSESSMENT SYSTEMS –
Part 2: Selection and use of sampling plans
for inspection of electronic components and packages
FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
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with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
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interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61193-2 has been prepared by IEC technical committee 91:
Electronics assembly technology.
The text of this standard is based on the following documents:
FDIS Report on voting
91/690/FDIS 91/723/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
– 4 – 61193-2 © IEC:2007(E)
A list of all the parts in the IEC 61193 series, under the general title Quality assessment
systems, can be found on the IEC website.
The committee has decided that the contents of this publication will remain unchanged until
the maintenance result date indicated on the IEC web site under "http://webstore.iec.ch" in
the data related to the specific publication. At this date, the publication will be
• reconfirmed,
• withdrawn,
• replaced by a revised edition, or
• amended.
A bilingual version of this publication may be issued at a later date.
61193-2 © IEC:2007(E) – 5 –
INTRODUCTION
To obtain a high quality level of products, process controls like 100 % testing of significant
characteristics and statistical methods are needed to stabilize, monitor, and improve
processes.
Sampling inspection is one of the methods to verify
• whether the process control is effective, and
• the quality level of a supplier’s product by a customer or third party.
Today the quality level of products for use in electric and electronic equipment is expected to
be equal or close to zero defects. But, the assessment of a quality level close to zero defects
by sampling only would lead to an unreasonable increase of cost for inspection. A
combination of process control and zero acceptance number sampling plans is indispensable.
This standard provides a sampling system and plans for the inspection of electronic
components, packages and modules, manufactured under suitable process control, which
prevents the outflow of nonconforming products.
NOTE The sampling system provided by this standard is extracted from ISO 2859-1, and is intended to be used
for the inspection of final products, either by the manufacturer, a customer, or a third party.
– 6 – 61193-2 © IEC:2007(E)
QUALITY ASSESSMENT SYSTEMS –
Part 2: Selection and use of sampling plans
for inspection of electronic components and packages
1 Scope
This part of IEC 61193 applies to the inspection of electronic components, packages, and also
modules (referred to as “products” in this standard) for use in electronic and electric
equipment. It specifies sampling plans for inspection by attributes on the assumption that the
acceptance number is zero (Ac = 0), including criteria for sample selection and procedures.
The zero acceptance number sampling plans provided by this standard apply to the inspection
of products, that are manufactured under suitable process control with the target of a “zero-
defect” quality level before sampling inspection.
In addition, this standard provides a method for the calculation of the expected value of the
statistical verified quality limit (SVQL) at a confidence level of 60 %. Amongst other things,
this method can be used to verify the effectiveness of the supplier’s process control.
NOTE In this standard the term “module” is used for products which are modules according to the definition in
IEC 60194.
2 Normative references
The following referenced documents are indispensable for the application of this document.
For dated references, only the edition cited applies. For undated references, the latest edition
of the referenced document (including any amendments) applies.
IEC 60194: Printed board design, manufacture and assembly – Terms and definitions
ISO 2859-1:1999, Sampling procedures for inspection by attributes – Part 1: Sampling
schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
ISO 3534-2:2006, Statistics – Vocabulary and symbols – Part 2: Applied statistics
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60194, ISO 2859-1
and ISO 3534-2, as well as the
...
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