IEC 61788-15:2011

Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies

IEC 61788-15:2011 describes measurements of the intrinsic surface impedance (Zs) of HTS films at microwave frequencies by a modified two-resonance mode dielectric resonator method. The object of measurement is to obtain the temperature dependence of the intrinsic Zs at the resonant frequency f0.

Supraconductivité - Partie 15: Mesures de caractéristiques électroniques - Impédance de surface intrinsèque de films supraconducteurs aux fréquences micro-ondes

La CEI 61788-15:2011 décrit les mesures de l'impédance de surface intrinsèque (Zs) des films HTS aux fréquences micro-ondes par une méthode modifiée du résonateur diélectriques en mode deux résonances. L'objet de la mesure est d'obtenir la dépendance de l'impédance intrinsèque Zs vis-à-vis de la température à la fréquence de résonance f0.

General Information

• Status: Published
• Publication Date: 23-Oct-2011
• ICS: 01 - GENERALITIES. TERMINOLOGY. STANDARDIZATION. DOCUMENTATION
• ICS: 17.220.20 - Measurement of electrical and magnetic quantities
• ICS: 29.050 - Superconductivity and conducting materials
• Technical Committee: TC 90 - Superconductivity
• Drafting Committee: WG 8 - TC 90/WG 8
• Current Stage: PPUB - Publication issued
• Start Date: 31-Oct-2011
• Completion Date: 24-Oct-2011

Standards Content (Sample)

IEC 61788-15 ®
Edition 1.0 2011-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 15: Electronic characteristic measurements – Intrinsic surface impedance
of superconductor films at microwave frequencies

Supraconductivité –
Partie 15: Mesures de caractéristiques électroniques – Impédance de surface
intrinsèque de films supraconducteurs aux fréquences micro-ondes

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IEC 61788-15 ®
Edition 1.0 2011-10
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
colour
inside
Superconductivity –
Part 15: Electronic characteristic measurements – Intrinsic surface impedance
of superconductor films at microwave frequencies

Supraconductivité –
Partie 15: Mesures de caractéristiques électroniques – Impédance de surface
intrinsèque de films supraconducteurs aux fréquences micro-ondes

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
CODE PRIX X
ICS 29.050 ISBN 978-2-88912-710-8

– 2 – 61788-15  IEC:2011
CONTENTS
FOREWORD . 4
INTRODUCTION . 6
1 Scope . 7
2 Normative references . 7
3 Terms and definitions . 7
4 Requirements . 8
5 Apparatus . 9
5.1 Measurement equipment . 9
5.2 Measurement apparatus . 9
5.3 Dielectric rods . 13
5.4 Superconductor films and copper cavity . 14
6 Measurement procedure . 14
6.1 Set-up . 14
6.2 Measurement of the reference level. 14
6.3 Measurement of the R of oxygen-free high purity copper . 14
S
6.4 Determination of the effective R of superconductor films and tanδ of
S
standard dielectric rods . 17
6.5 Determination of the penetration depth . 18
6.6 Determination of the intrinsic surface impedance . 20
7 Uncertainty of the test method . 21
7.1 Measurement of unloaded quality factor . 21
7.2 Measurement of loss tangent. 21
7.3 Temperature . 22
7.4 Specimen and holder support structure . 22
8 Test Report . 22
8.1 Identification of test specimen . 22
8.2 Report of the intrinsic Z values . 22
S
8.3 Report of the test conditions . 22
Annex A (informative)  Additional information relating to clauses 1 to 8 . 24
Annex B (informative) Uncertainty considerations . 41
Bibliography . 45

Figure 1 – Schematic diagram for the measurement equipment for the intrinsic Z of
S
HTS films at cryogenic temperatures . 10
Figure 2 – Schematic diagram of a dielectric resonator with a switch for thermal
connection . 10
Figure 3 – Typical dielectric resonator with a movable top plate . 11
Figure 4 – Switch block for thermal connection . 12
Figure 5 – Dielectric resonator assembled with a switch block for thermal connection . 13
Figure 6 – A typical resonance peak. Insertion attenuation IA, resonant frequency f
and half power bandwidth ∆f are defined . 16
3dB
Figure 7 – Reflection scattering parameters S and S . 18
11 22
Figure 8 – Definitions for terms in Table 5 . 22
Figure A.1 – Schematic diagram for the measurement system . 24
Figure A.2 – A motion stage using step motors . 25

61788-15  IEC:2011 – 3 –
Figure A.3 – Cross-sectional view of a dielectric resonator . 26
Figure A.4 – A diagram for simplied cross-sectional view of a dielectric resonator . 30
Figure A.5 – Mode chart for a sapphire resonator . 33
Figure A.6 – Frequency response of the sapphire resonator . 34
Figure A.7 – Q versus temperature for the TE and the TE modes of the sapphire
U 021 012
resonator with 360 nm-thick YBCO films . 35
Figure A.8 – The resonant frequency f versus temperature for the TE and TE
0 021 012
modes of the sapphire resonator with 360 nm-thick YBCO films . 35

Figure A.9 – The temperature dependence of the R of YBCO films with the
Se
thicknesses of 70 nm to 360 nm measured at ~40 GHz . 36
Figure A.10 – The temperature dependence of ∆λ for the YBCO films with the
e
thicknesses of 70 nm and 360 nm measured at ~40 GHz . 36
Figure A.11 – The penetration depths λ of the 360 nm-thick YBCO film measured at
10 kHz by using the mutual inductance method and at ~40 GHz by using sapphire
resonator . 37
Figure A.12 – The temperature dependence of the intrinsic surface resistance R of
S
YBCO films with the thicknesses of 70 nm to 360 nm measured at ~40 GHz . 37
Figure A.13 – Comparison of the temperature-dependent value of each term in
Equation (A.35) for the TE mode of the standard sapphire resonator . 38
Figure A.14 – Comparison of the temperature-dependent value of each term in
Equation (A.35) for the TE mode of the standard sapphire resonator . 38
Figure A.15 – Temperature dependence of uncertainty in the measured intrinsic R of
S
YBCO films . 39

Table 1 – Typical dimensions of a sapphire rod . 14
Table 2 – Typical dimensions of OFHC cavities and HTS films . 14
Table 3 – Geometrical factors and filling factors calculated for the standard sapphire
resonator . 17
Table 4 – Specifications of vector network analyzer . 21
Table 5 – Type B uncertainty for the specifications on the sapphire rod . 21
Table A.1 – Geometrical factors and filling factors calculated for the standard sapphire
resonator . 31
Table B.1 – Output signals from two nominally identical extensometers . 42
Table B.2 – Mean values of two output signals . 42
Table B.3 – Experimental standard deviations of two output signals. 42
Table B.4 – Standard uncertainties of two output signals . 42
Table B.5 – Coefficient of variations of two output signals. 43
...