IEC PAS 62277:2001
(Main)Test-fixture of surface mounting quartz crystal units
Test-fixture of surface mounting quartz crystal units
Describes the test-fixture that allows the accurate measurement of resonance frequency, resonance resistance, and electrical-equivalent-circuit constants of a leadless surface mounting quartz crystal using the zero phase technique as specified in IEC 60444.
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Standards Content (Sample)
IEC/PAS 62277
Edition 1.0
2001-08
Test-fixture of surface mounting
quartz crystal units
PUBLI C LY AVAI LABLE SPECI F I CATI O N
IN TER N A TION AL Reference number
E L E C T R OT E CHNI CA L
IEC/PAS 62277
C O MMI S S I O N
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
TEST-FIXTURE OF SURFACE MOUNTING
QUARTZ CRYSTAL UNITS
FOREWORD
A PAS is a technical specification not fulfilling the requirements for a standard, but made available to the
public and established in an organization operating under given procedures.
IEC-PAS 62277 was submitted by the Japanese Institute of Electronics, Information and Communication Engineers
and has been processed by IEC technical committee 49: Piezoelectric and dielectric devices for frequency control
and selection.
The text of this PAS is based on the This PAS was approved for
following document: publication by the P-members of the
committee concerned as indicated in
the following document:
Draft PAS Report on voting
49/505/PAS 49/514/RVD
Following publication of this PAS, the technical committee or subcommittee concerned will investigate the
possibility of transforming the PAS into an International Standard.
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising all
national electrotechnical committees (IEC National Committees). The object of the IEC is to promote international co-
operation on all questions concerning standardization in the electrical and electronic fields. To this end and in addition
to other activities, the IEC publishes International Standards. Their preparation is entrusted to technical committees;
any IEC National Committee interested in the subject dealt with may participate in this preparatory work. International,
governmental and non-governmental organizations liaising with the IEC also participate in this preparation. The IEC
collaborates closely with the International Organization for Standardization (ISO) in accordance with conditions
determined by agreement between the two organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all interested
National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form of
standards, technical specifications, technical reports or guides and they are accepted by the National Committees in
that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International Standards
transparently to the maximum extent possible in their national and regional standards. Any divergence between the
IEC Standard and the corresponding national or regional standard shall be clearly indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this PAS may be the subject of patent rights. The
IEC shall not be held responsible for identifying any or all such patent rights.
Page i
FOREWORD
The role of the communication systems is becoming greater and greater in the recent
information age. Mobile communication systems are bursting globally and small quartz
crystal resonators with high frequency stability are playing very important roles as key
components in such communication systems. This comes from the fact that the crystal
resonators can reduce the size of oscillators and filters drastically. Recently, the leadless
crystal resonators are widely used for further miniaturization.
International Electrotechnical Commission located in Geneva is actively working for the
international standardization in the electrotechnical field. Among many Technical
Committees (TCs) in IEC, TC 49 is working on the Piezoelectric and Dielectric Devices for
Frequency Control and Selection. TC 49 has ten Working Groups (WGs), and the Working
Group 6 (WG 6) is working for the preparation and deliberation of the IEC standard on the
measurement method for crystal resonators.
This document is a standard for the test-fixture of surface mounting quartz crystal units and
should be issued as IEC 60444-4 amendment 1: Standard for the Test-fixture with Load-
capacitance of Surface Mounting Quartz Crystal Units, and IEC 60444-4: Standard for the
Test-fixture of Surface Mounting Quartz Crystal Units, as amendments of IEC Publication
60444-4: Part 4: Method for the measurement of the load resonance frequency f load
L
resonance resistance, R and the calculation of other derived values of quartz crystal units,
L
up to 30 MHz. The Japanese National Committee for IEC/TC 49 proposed new work item
proposals for these documents. These proposals, however, were not approved, because only
two countries; Germany and Japan, nominated experts to participate in these projects.
According to the IEC rule for the New Work Items Proposal, it is required that four P-
member countries should nominate the name of experts and these proposals failed. But, the
Japanese National Committee for IEC/TC 49 decided to continue the work to draft these
standards,
...
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