IEC TS 62607-6-36:2026

<p>Nanomanufacturing - Key control characteristics - Part 6-36: Graphene-related products - Reduction status of graphene oxide and reduced graphene oxide: UV-Vis absorption spectroscopy</p>

IEC TS 62607-6-36:2026, which is a Technical Specification, establishes a standardized method to determine the key control characteristic
• reduction status
for graphene oxide (GO) and reduced graphene oxide (rGO) by
• ultraviolet-visible spectroscopy (UV-Vis).
The reduction status is not a quantitative value, but rather a compilation (table) of six parameters extracted from UV-Vis absorption spectra. These six parameters can be obtained from GO and rGO as follows:
(1) the peak location of GO, (2) the shoulder peak of GO, (3) the full width at half maximum (FWHM) of the main absorption peak of GO, (4) the peak location of rGO, (5) FWHM of the main absorption peak of rGO and (6) the spectral peak shifts between GO and rGO.
• The method is applicable to the characterization of GO and rGO materials (where rGO is obtained from the corresponding GO) produced by different reduction techniques, as well as to commercial products in solution or film form.
• Individual GO or rGO materials can also be characterized, but only partial parameters can be obtained. Specifically, peak location, FWHM, and shoulder peak can be measured from each GO or rGO material, while peak shift requires both GO and its corresponding rGO for comparison.
• The method is suitable for quality assurance and for monitoring the reduction process during the production of rGO.
• The method does not provide full chemical analysis. Complementary techniques can be required beyond the UV-Vis spectral features.

General Information

• Status: Published
• Publication Date: 09-Jun-2026
• ICS: 07.120 - Nanotechnologies
• Technical Committee: TC 113 - Nanotechnology for electrotechnical products and systems
• Drafting Committee: WG 8 - TC 113/WG 8
• Current Stage: PPUB - Publication issued
• Start Date: 10-Jun-2026
• Completion Date: 19-Jun-2026

Standards Content (Sample)

IEC TS 62607-6-36 ®
Edition 1.0 2026-06
TECHNICAL
SPECIFICATION
Nanomanufacturing - Key control characteristics -
Part 6-36: Graphene-related products - Reduction status of graphene oxide and
reduced graphene oxide: UV-Vis absorption spectroscopy
ICS 07.120  ISBN 978-2-8327-1262-7

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CONTENTS
FOREWORD . 3
INTRODUCTION . 5
1 Scope . 6
2 Normative references . 6
3 Terms and definitions . 6
3.1 General terms . 7
3.2 Terms related to general material description . 7
3.3 Key control characteristics measured in accordance with this document . 8
3.4 Terms related to the measurement method described in this document . 9
4 General . 9
4.1 Measurement principle . 9
4.2 Sample storage . 11
4.3 Sample preparation. 11
4.4 Sample mounting . 11
5 Measurement procedure . 12
5.1 Calibration of measurement equipment . 12
5.2 Detailed protocol of the measurement procedure . 12
5.2.1 General. 12
5.2.2 Solution sample measurement. 12
5.2.3 Thin film sample measurement . 13
5.3 Measurement accuracy . 13
6 Data analysis and interpretation of results . 13
6.1 Data processing . 13
6.2 Peak identification and analysis . 14
6.3 Shoulder peak identification . 14
6.4 Interpretation criteria for reduction status . 14
7 Results to be reported . 14
7.1 General . 14
7.2 Test conditions . 15
7.3 Measurement specific information . 15
7.4 Test results . 15
Annex A (informative) Format of the test report. 16
Annex B (informative) XPS analysis and table . 18
B.1 General . 18
B.2 Sample preparation methods . 18
B.3 Measurement procedure . 18
B.4 Measurement accuracy . 19
B.5 Data analysis and interpretation of results . 19
B.6 Tables and forms . 19
Annex C (informative) Worked examples with GO and rGO samples . 21
C.1 UV-Vis and XPS example 1 . 21
C.2 Samples and solution sample preparations . 21
C.3 Results . 22
Annex D (informative) Case studies to interpret the reduction status - worked
examples . 27
D.1 Samples of GO and rGO product and thermal treatment reduction . 27
D.2 UV-Vis results for commercial products . 28
D.3 UV-Vis results for thermally treated GO and rGO commercial products . 28
Bibliography . 30

Figure 1 – UV-Vis spectral information of GO and rGO (example) for reduction status . 10
Figure C.1 – XPS sample preparation . 22
Figure C.2 – UV-Vis absorption spectrum of GO and rGO samples . 22
Figure C.3 – GO and rGO film sample preparation for UV-Vis . 24
Figure C.4 – XPS survey of GO and rGO samples . 25
Figure D.1 – GO and rGO samples and thermal treatment equipment . 27
Figure D.2 – UV-Vis absorption spectrum results of GO and rGO from Supplier G . 28
Figure D.3 – UV-Vis absorption spectrum results of TT-GOs . 29

Table A.1 – Product identification (in accordance with the relevant blank detail
specification) . 16
Table A.2 – General material description (in accordance with the relevant blank detail
specification) . 16
Table A.3 – Information related to UV-Vis test . 17
Table B.1 – Information related to XPS test . 19
Table B.2 –XPS results with C 1s relative fraction . 20
Table C.1 – GO and rGO samples . 21
Table C.2 – Solution samples after the sonification . 22
Table C.3 – Reduction status of GO and rGO samples [Sample 1] . 23
Table C.4 – Reduction status of GO and rGO samples [Sample 2] . 23
Table C.5 – Reduction status of GO and rGO samples [Sample 3] . 23
Table C.6 – Reduction status of GO and rGO samples [Sample 5] . 23
Table C.7 – Reduction status of GO and rGO samples [Sample 6] . 24
Table C.8 – Reduction status of GO and rGO samples [Sample 7] . 24
Table C.9 – C/O ratio of GO and rGO samples . 25
Table C.10 – XPS analysis results. 26
Table D.1 – Reduction status of GO and rGO from Supplier G. 28
Table D.2 – Reduction status of TT-GOs . 29

INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
Nanomanufacturing - Key control characteristics -
Part 6-36: Graphene-related products - Reduction status of graphene
oxide and reduced graphene oxide: UV-Vis absorption spectroscopy

FOREWORD
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8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
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9) IEC draws attention to the possibility that the implementation of this document may involve the use of (a)
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the latest information, which may be obtained from the patent database available at https://patents.iec.ch. IEC
shall not be held responsible for identifying any or all such patent rights.
IEC TS 62607-6-36 has been prepared by IEC technical committee 113: Nanotechnology for
electrotechnical products and systems. It is a Technical Specification.
The text of this Technical Specification is based on the following documents:
Draft Report on voting
113/961/DTS 113/971/RVDTS
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this Technical Specification is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
A list of all parts in the IEC 62607 series, published under the general title Nanomanufacturing -
Key control characteristics, can be found on the IEC website.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
– reconfirmed,
– withdrawn, or
– revised.
INTRODUCTION
Metallic van der Waals materials composed of a monolayer have recently drawn interest as a
potential and adaptable application platform in a variety of industrial applications (electronics,
optoelectronics, and energy storage devices). Because of its lower energy level, strong
electrical and thermal conductivity, and high transparency due to its atomic thickness, graphene
is among the most attractive possibilities for metallic van der Waals materials.[1]
Chemical vapour deposition is a typical bottom-up approach, which is widely accepted as an
effective synthetic method for producing monolayer graphene. The approach is very well suited
for nano-structuring and obtaining superior monolayer graphene. However, to advance toward
genuinely practical methods for commercialization, several issues are still to be addressed,
such as the long synthesis time, high-temperature heat treatment, and the requirement for
additional post-transfer-process, which limit the scalability and production of graphene. For the
mass manufacturing of graphene, a solution-based direct reduction technique (top-down) has
been taken into consideration.
Graphene oxide (GO) can be converted into graphene using a variety of reducing substances
and solutions. To perfectly replicate the remarkable properties of graphene, it is important that
the level of oxygen functionalization in GO be lowered or eliminated. A subsequent
transformation of GO into reduced graphene oxide (rGO) can be performed to induce the π-π
conjugated structure. Determining the completeness of the reduction is important because it
indicates that the rGO possesses properties closer to those of graphene, specifically a lower
oxygen concentration. This restoration of graphene-like properties makes the material more
suitable for industrial applications that rely on its excellent electrical and thermal conductivity.
The reduction status, which can be evaluated using spectral information from UV-Vis, is a
critical factor for characterizing GO, rGO, and related products.
This document provides a method for evaluating the reduction status of GO and rGO by spectral
information from UV-Vis. The reduction status is not a quantitative standard but can be
determined through six parameters obtained from UV-Vis absorption spectroscopy. These
parameters from GO and rGO references indirectly indicate the reduction status through
spectral changes that reflect the restoration of sp conjugation and removal of oxygen functional
groups.
Furthermore, this standardized UV-Vis method enables quality control throughout the rGO
production lifecycle and in final products. Since reduction status can degrade during storage or
processing due to environmental factors, UV-Vis provides a non-destructive way to track the
reduction status footprint over time. The technique is particularly valuable for industrial
applications where maintaining consistent material properties is critical, allowing manufacturers
to verify reduction completeness and monitor any re-oxidation that can occur in practical use.
[2], [3]
___________
Numbers in square brackets refer to the Bibliography.
1 Scope
This part of IEC 62607 establishes a standardized method to determine the key control
characteristic
– reduction status
for graphene oxide (GO) and reduced graphene oxide (rGO) by
– ultraviolet-visible spectroscopy (UV-Vis).
The reduction status is not a quantitative value, but rather a compilation (table) of six
parameters extracted from UV-Vis absorption spectra. These six parameters can be obtained
from GO and rGO as follows:
(1) the peak location of GO, (2) the shoulder peak of GO, (3) the full width at half maximum
(FWHM) of the main absorption peak of GO, (4) the peak location of rGO, (5) FWHM of the
main absorption peak of rGO and (6) the spectral peak shifts between GO and rGO.
– The method is applicable to the characterization of GO and rGO materials (where rGO is
obtained from the corresponding GO) produced by different reduction techniques, as well
as to commercial products in solution or film form.
– Individual GO or rGO materials can also be characterized, but only partial parameters can
be obtained. Specifically, peak location, FWHM, and shoulder peak can be measured from
each GO or rGO material, while peak shift requires both GO and its corresponding rGO for
comparison.
– The method is suitable for quality assurance and for monitoring the reduction process during
the production of rGO.
– The method does not provide full chemical analysis. Complementary techniques can be
required beyond the UV-Vis spectral features.
2 Normative references
The following documents are referred to in the text in such a way that some or all of their content
constitutes requirements of this document. For dated references, only the edition cited applies.
For undated references, the latest edition of the referenced document (including any
amendments) applies.
ISO 18115-1, Surface chemical analysis - Vocabulary - Part 1: General terms and terms used
in spectroscopy
3 Terms and definitions
For the purposes of this document, the terms and definitions given in ISO 18115-1 and the
following apply.
ISO and IEC maintain terminology databases for use in standardization at the following
addresses:
– IEC Electropedia: available at https://www.electropedia.org/
– ISO Online browsing platform: available at https://www.iso.org/obp
3.1 General terms
3.1.1
key control characteristic
KCC
key performance indicator
material property or intermediate product characteristic which can affect safety or compliance
with regulations, fit, function, performance, quality, reliability or subsequent processing of the
final product
Note 1 to entry: The measurement of a key control characteristic is described in a standardized measurement
procedure with known accuracy and precision.
Note 2 to entry: It is possible to define more than one measurement method for a key control characteristic if the
correlation of the results is well-defined and known.
[SOURCE: IEC TS 62565-1:2023, 3.1, modified – "key performance indicator" has been
changed from a preferred term to an admitted term. "material property or intermediate" has
been added at the start of the definition.]
3.2 Terms related to general material description
3.2.1
graphene
graphene layer
single-layer graphene
monolayer graphene
single layer of carbon atoms with each atom bound to three neighbours in a honeycomb
structure
Note 1 to entry: It is an important building block of many carbon nano-objects.
Note 2 to entry: As graphene is a single layer, it is also sometimes called monolayer graphene or single-layer
graphene and abbreviated as 1LG to distinguish it from bilayer graphene (2LG) and few-layered graphene (FLG).
Note 3 to entry: Graphene has edges and can have defects and grain boundaries where the bonding is disrupted.
[SOURCE: ISO/TS 80004-13:2024, 3.1.2.1, modified – Note 4 to entry has been deleted.]
3.2.2
graphene-related material
carbon-based two-dimensional materials consisting of one to 10 layers, including graphene,
graphene oxide, reduced graphene oxide, and functionalized variations thereof
Note 1 to entry: This includes bilayer graphene, trilayer graphene and few-layered graphene.
3.2.3
graphene oxide
chemically modified graphene prepared by oxidation and exfoliation of graphite, causing
extensive oxidative modification of the basal plane
Note 1 to entry: Graphene oxide is a single-layer material with a high oxygen content, typically characterized by
C/O atomic ratios of approximately 2,0 depending on the method of synthesis.
3.2.4
reduced graphene oxide
rGO
reduced oxygen content form of graphene oxide
Note 1 to entry: This can be produced by chemical, thermal, microwave, photo-chemical, photo-thermal or microbial
or bacterial methods or by exfoliating reduced graphite oxide.
Note 2 to entry: If graphene oxide was fully reduced, then graphene would be the product. However, in practice,
3 2
some oxygen containing functional groups will remain and not all sp bonds will return back to sp configuration.
Different reducing agents will lead to different carbon to oxygen ratios and different chemical compositions in reduced
graphene oxide
Note 3 to entry: It can take the form of several morphological variations such as platelets and worm-like structures.
Note 4 to entry: The O/C atomic ratio is approximately 0,1 to 0,5 (C/O ratio 2 to 10).
[SOURCE: ISO/TS 80004-13:2024, 3.1.2.16]
3.3 Key control characteristics measured in accordance with this document
3.3.1
reduction status
qualitative reduction assessment of GO/rGO transformation based on UV-Vis
Note 1 to entry: The six important parameters from UV-Vis are as follows: (1) the peak location of GO, (2) the
shoulder peak of GO, (3) the full width at half maximum (FWHM) of GO, (4) the peak location of rGO, (5) FWHM of
the main absorption peak of rGO and (6) the spectral peak shifts between GO and rGO.
Note 2 to entry: Reduction status is not a directly measured value. These six parameters collectively provide indirect
evidence of the reduction process through observable spectral changes: shoulder peak disappearance (oxygen
removal), peak red-shift (sp restoration), and FWHM changes (electronic structure modification).
3.3.2
peak position
wavelength corresponding to the maximum of the absorption peak in the UV-Vis spectrum
Note 1 to entry: For graphene oxide (GO), the main absorption peak is typically observed at approximately 230 nm,
while for reduced graphene oxide (rGO) it shifts to approximately 270 nm.
3.3.3
peak width
spectral width of the absorption peak measured at half of its maximum intensity (FWHM)
Note 1 to entry: A narrowing of the FWHM is typically observed when GO is reduced to rGO.
3.3.4
peak shift
difference in peak position between GO and rGO absorption peaks in the UV-Vis spectrum
Note 1 to entry: GO shows an absorption peak at approximately 230 nm (π–π* transitions of C=C) and a shoulder
around approximately 300 nm (n–π* transitions of C=O), while rGO typically exhibits a red-shifted peak at
approximately 270 nm.
3.4 Terms related to the measurement method described in this document
3.4.1
ultraviolet-visible
electromagnetic radiation in the visible or ultraviolet wavelengths
3.4.2
UV-Vis spectroscopy
UV-Vis
optical spectroscopy where the radiation consists of electromagnetic radiation in the visible or
ultraviolet wavelengths
Note 1 to entry: The spectra of transmission, absorption, reflection, or emission in UV-Vis wavelength regions are
measured.
3.4.3
UV-Vis peak
peak with certain shape in the UV-Vis spectrum
3.4.4
peak intensity
peak height
difference in intensity counts between the highest point of the UV-Vis/XPS peak and the
spectrum baseline
3.4.5
full width at half maximum
FWHM
measure of the width of an analysis peak in which the background is first removed to reveal the
complete peak profile
Note 1 to entry: FWHM is determined by measuring the width at half the maximum height.
Note 2 to entry: It is important to consider the proper background removal process and peak deconvolution.[4]
4 General
4.1 Measurement principle
Ultraviolet light absorption primarily occurs within the 100 nm to 400 nm wavelength range,
whereas the visible spectrum covers from 400 nm to 800 nm. When a photon having enough
energy reaches matter, the matter receives and absorbs the photon energy, which allows
electrons in a ground state (highest occupied molecular orbitals) to transit to a higher energy
state (lowest unoccupied molecular orbitals). The spectrum is created as a result of the amount
of light or photons absorbed (consumed), not the transition of electrons.
In the UV-Vis absorption spectra of GO, a sharp absorption peak appears at around 230 nm,
which corresponds to π–π* transitions of the C=C bonds. This peak indicates that the sp
conjugated domains are highly disrupted by oxygen-containing functional groups. Additionally,
a shoulder peak near 300 nm arises from n–π* transitions of C=O bonds, which confirms the
presence of abundant carbonyl groups in GO. After reduction to rGO, the main absorption peak
shifts from around 230 nm to around 270 nm, a red-shift that directly reflects the restoration of
larger sp conjugated domains and thus a higher degree of graphitization. At the same time,
the shoulder at around 300 nm decreases in intensity or disappears, which is interpreted as the
removal of oxygen-containing functionalities (C=O, epoxy, hydroxyl groups). Quantitatively, the
FWHM of the main absorption peak becomes narrower in rGO compared to GO. This narrowing
suggests that the electronic transitions occur more uniformly, consistent with the re-
establishment of extended π-conjugation. In contrast, a broader peak in GO indicates a
disordered electronic structure. Thus, the reduction status can be indirectly interpreted as
follows.
– Shoulder peak: The removal of the shoulder peak at around 300 nm indicates the elimination
of oxygen-containing functional groups during reduction.
– Peak position shift (x-axis, wavelength): the larger the red-shift from 230 nm to around
270 nm, the greater the recovery of the conjugated sp network.
– Peak broadness and intensity (y-axis, FWHM and disappearance of the 300 nm shoulder):
The more pronounced narrowing can indicate more effective removal of oxygen-containing
functional groups and better restoration of the aromatic sp carbon network.
In summary, GO shows peaks at 230 nm and around 300 nm due to disrupted sp domains and
oxygen groups, whereas rGO shows a red-shifted peak at around 270 nm with a diminished
shoulder, reflecting restoration of conjugation and loss of oxygen functionalities. These spectral
changes together provide a reliable measure of the reduction status of GO to rGO (Figure 1).

a) GO b) rGO
Figure 1 – UV-Vis spectral information of GO and rGO (example) for reduction status
This method can be applied in three scenarios:
a) complete characterization – both GO and corresponding rGO measured (all six parameters);
b) GO characterization only – parameters (1) to (3) obtained;
c) rGO characterization only – parameters (4) and (5) obtained.
NOTE The six parameters consist of three derived from GO and three from rGO, both originating from the same
source material. The GO measurement serves as reference data for comparison rather than a calibration step.
4.2 Sample storage
For accurate spectra with minimal surface contamination or adventitious oxygen, mount the
specimens in a sealed chamber and acquire data either under dry air (defined RH) or under
vacuum or inert gas (N or Ar). Report the atmosphere, pressure (or RH), temperature, and
exposure time prior to acquisition, because GO and rGO optical features are humidity- and
oxygen-sensitive.
4.3 Sample preparation
GO and rGO samples can be prepared in two configurations for UV-Vis analysis such as solution
or film format. For solution samples, GO and rGO powders are dispersed in a selected solvent
at consistent concentrations, typically less than 1,0 mg/mL in deionized water, though
concentration and solvent can be adjusted based on specific requirements. Pure solvent serves
as the blank reference. Complete dispersion should be ensured through appropriate mixing or
...