SIST EN IEC 63185:2025
(Main)Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method (IEC 63185:2025)
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method (IEC 63185:2025)
IEC 63185:2025 relates to a measurement method for complex permittivity of dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis.
This second edition cancels and replaces the first edition published in 2020. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a) the upper limit of the applicable frequency range has been extended from 110 GHz to 170 GHz;
b) circular disk resonators used for the measurements now include one with waveguide interfaces;
c) in calculating the complex permittivity from the measured resonant properties, the fringing fields are now accurately taken into account based on the mode-matching analysis.
Messung der komplexen Dielektrizitätskonstante für verlustarme dielektrische Substrate nach dem symmetrischen Kreisscheibenresonatorverfahren (IEC 63185:2025)
Méthode au résonateur à disque circulaire de type symétrique pour mesurer la permittivité complexe des substrats diélectriques à faible perte (IEC 63185:2025)
L'IEC 63185:2025 traite d’une méthode de mesure de la permittivité complexe des substrats diélectriques aux fréquences micro-ondes et millimétriques. Cette méthode a été élaborée pour évaluer les propriétés diélectriques des matériaux à faible perte utilisés dans les circuits et dispositifs aux fréquences micro-ondes et millimétriques. Cette méthode utilise les modes d’ordre supérieur d’un résonateur symétrique à disque circulaire, et permet d’effectuer le mesurage large bande de substrats diélectriques à l’aide d'un résonateur qui, sous l’effet des ports d’excitation, produit un champ de franges qui sont prises en compte précisément par un ajustement d’analyse modale.
Cette deuxième édition annule et remplace la première édition parue en 2020. Cette édition constitue une révision technique.
Cette édition inclut les modifications techniques majeures suivantes par rapport à l'édition précédente:
a) la limite supérieure de la plage de fréquences applicable a été étendue de 110 GHz à 170 GHz;
b) les résonateurs à disque circulaire utilisés pour le mesurage comprennent désormais un résonateur avec des interfaces de guide d’ondes;
c) lors du calcul de la permittivité complexe à partir des propriétés de résonance mesurées, les champs de franges sont désormais pris en compte précisément par un ajustement d’analyse modale.
Merjenje kompleksne permitivnosti za dielektrične podlage z nizkimi izgubami, uravnotežene z metodo krožnega diskastega resonatorja (IEC 63185:2025)
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
01-julij-2025
Nadomešča:
SIST EN IEC 63185:2021
Merjenje kompleksne permitivnosti za dielektrične podlage z nizkimi izgubami,
uravnotežene z metodo krožnega diskastega resonatorja (IEC 63185:2025)
Measurement of the complex permittivity for low-loss dielectric substrates balanced-type
circular disk resonator method (IEC 63185:2025)
Messung der komplexen Dielektrizitätskonstante für verlustarme dielektrische Substrate
nach dem symmetrischen Kreisscheibenresonatorverfahren (IEC 63185:2025)
Méthode au résonateur à disque circulaire de type symétrique pour mesurer la
permittivité complexe des substrats diélectriques à faible perte (IEC 63185:2025)
Ta slovenski standard je istoveten z: EN IEC 63185:2025
ICS:
33.120.30 Radiofrekvenčni konektorji RF connectors
(RF)
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
EUROPEAN STANDARD EN IEC 63185
NORME EUROPÉENNE
EUROPÄISCHE NORM May 2025
ICS 33.120.30 Supersedes EN IEC 63185:2021
English Version
Measurement of the complex permittivity for low-loss dielectric
substrates balanced-type circular disk resonator method
(IEC 63185:2025)
Méthode du résonateur symétrique à disque circulaire pour Messung der komplexen Dielektrizitätskonstante für
mesurer la permittivité complexe des substrats diélectriques verlustarme dielektrische Substrate nach dem
à faible perte symmetrischen Kreisscheibenresonatorverfahren
(IEC 63185:2025) (IEC 63185:2025)
This European Standard was approved by CENELEC on 2025-04-23. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
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same status as the official versions.
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Comité Européen de Normalisation Electrotechnique
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© 2025 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN IEC 63185:2025 E
European foreword
The text of document 46F/699/FDIS, future edition 2 of IEC 63185, prepared by SC 46F "RF and
microwave passive components" of IEC/TC 46 "Cables, wires, waveguides, RF connectors, RF and
microwave passive components and accessories" was submitted to the IEC-CENELEC parallel vote
and approved by CENELEC as EN IEC 63185:2025.
The following dates are fixed:
• latest date by which the document has to be implemented at national (dop) 2026-05-31
level by publication of an identical national standard or by endorsement
• latest date by which the national standards conflicting with the (dow) 2028-05-31
document have to be withdrawn
This document supersedes EN IEC 63185:2021 and all of its amendments and corrigenda (if any).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC shall not be held responsible for identifying any or all such patent rights.
Any feedback and questions on this document should be directed to the users’ national committee. A
complete listing of these bodies can be found on the CENELEC website.
Endorsement notice
The text of the International Standard IEC 63185:2025 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standard indicated:
IEC 61338-1-3:1999 NOTE Approved as EN 61338-1-3:2000 (not modified)
IEC 62810:2015 NOTE Approved as EN 62810:2015 (not modified)
IEC 63185 ®
Edition 2.0 2025-03
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Measurement of the complex permittivity for low-loss dielectric substrates
balanced-type circular disk resonator method
Méthode du résonateur symétrique à disque circulaire pour mesurer la
permittivité complexe des substrats diélectriques à faible perte
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
INTERNATIONALE
ICS 33.120.30 ISBN 978-2-8327-0311-3
– 2 – IEC 63185:2025 © IEC 2025
CONTENTS
FOREWORD . 3
1 Scope . 5
2 Normative references . 5
3 Terms and definitions . 5
4 Measurement parameters . 5
5 Theory and calculation equations . 6
6 Measurement system . 9
7 Measurement procedure . 10
7.1 General . 10
7.2 Preparation of measurement apparatus. 10
7.3 Adjustment of measurement conditions . 10
7.4 Calibration of a vector network analyzer . 10
7.5 Measurement of complex permittivity of test sample . 10
7.6 Periodic checkup of metal in resonator. 11
Annex A (informative) Example of measurement results and associated uncertainties
for complex permittivity . 12
Bibliography . 14
Figure 1 – Structure of a circular disk resonator . 7
Figure 2 – Relation between resonant frequency and relative permittivity. 8
Figure 3 – Schematic diagram of a vector network analyzer measurement system . 9
Figure 4 – Frequency response of S of balanced-type circular disk resonator . 10
Table A.1 – Parameters of the resonator and the sheet sample . 12
Table A.2 – The resonant frequencies and unloaded Q-factors . 12
Table A.3 – Measurement results of complex permittivity . 13
IEC 63185:2025 © IEC 2025 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
MEASUREMENT OF THE COMPLEX PERMITTIVITY
FOR LOW-LOSS DIELECTRIC SUBSTRATES
BALANCED-TYPE CIRCULAR DISK RESONATOR METHOD
FOREWORD
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IEC 63185 has been prepared by subcommittee 46F: RF and microwave passive components,
of IEC technical committee 46: Cables, wires, waveguides, RF connectors, RF and microwave
passive components and accessories. It is an International Standard.
This second edition cancels and replaces the first edition published in 2020. This edition
constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous
edition:
a) the upper limit of the applicable frequency range has been extended from 110 GHz to
170 GHz;
b) circular disk resonators used for the measurements now include one with waveguide
interfaces;
– 4 – IEC 63185:2025 © IEC 2025
c) in calculating the complex permittivity from the measured resonant properties, the fringing
fields are now accurately taken into account based on the mode-matching analysis.
The text of this International Standard is based on the following documents:
Draft Report on voting
46F/699/FDIS 46F/702/RVD
Full information on the voting for its approval can be found in the report on voting indicated in
the above table.
The language used for the development of this International Standard is English.
This document was drafted in accordance with ISO/IEC Directives, Part 2, and developed in
accordance with ISO/IEC Directives, Part 1 and ISO/IEC Directives, IEC Supplement, available
at www.iec.ch/members_experts/refdocs. The main document types developed by IEC are
described in greater detail at www.iec.ch/publications.
The committee has decided that the contents of this document will remain unchanged until the
stability date indicated on the IEC website under webstore.iec.ch in the data related to the
specific document. At this date, the document will be
• reconfirmed,
• withdrawn, or
• revised.
IEC 63185:2025 © IEC 2025 – 5 –
MEASUREMENT OF THE COMPLEX PERMITTIVITY
FOR LOW-LOSS DIELECTRIC SUBSTRATES
BALANCED-TYPE CIRCULAR DISK RESONATOR METHOD
...
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