SIST EN 60749-6:2004

Semiconductor devices - Mechanical and climatic test methods -- Part 6: Storage at high temperature

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

Halbleiterbauelemente - Mechanische und klimatische Prüfverfahren -- Teil 6: Lagerung bei hoher Temperatur

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques -- Partie 6: Stockage à haute température

Vise à tester et à déterminer sur tous les dispositifs électroniques à semiconducteurs l'effet du stockage à température élevée et sans contrainte électrique appliquée. Cet essai est considéré comme non destructif.

Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2002)

General Information

• Status: Withdrawn
• Publication Date: 30-Jun-2004
• Withdrawal Date: 16-Jun-2020
• ICS: 31.080.01 - Semiconductor devices in general
• Technical Committee: I11 - Imaginarni 11
• Current Stage: 9900 - Withdrawal (Adopted Project)
• Start Date: 17-Jun-2020
• Due Date: 10-Jul-2020
• Completion Date: 17-Jun-2020
• Ref Project: EN 60749-6:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature

Relations

• Replaced By: SIST EN 60749-6:2017 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature (IEC 60749-6:2017)
• Effective Date: 20-Jun-2017
• Revised: SIST EN 60749:2002 + A1:2002 - Semiconductor devices - Mechanical and climatic test methods
• Effective Date: 13-May-2010
• Replaces: SIST EN 60749:2002 + A1:2002 - Semiconductor devices - Mechanical and climatic test methods
• Effective Date: 29-Jan-2023
• Replaces: SIST EN 60749:2002 + A1:2002 - Semiconductor devices - Mechanical and climatic test methods
• Effective Date: 07-Jun-2022

Standards Content (Sample)

SLOVENSKI SIST EN 60749-6:2004

STANDARD
julij 2004
Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at
high temperature (IEC 60749-6:2002)
ICS 31.080.01 Referenčna številka
SIST EN 60749-6:2004(en)
©  Standard je založil in izdal Slovenski inštitut za standardizacijo. Razmnoževanje ali kopiranje celote ali delov tega dokumenta ni dovoljeno

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EUROPEAN STANDARD EN 60749-6
NORME EUROPÉENNE
EUROPÄISCHE NORM August 2002
ICS 31.080.01 Partly supersedes EN 60749:1999 + A1:2000 + A2:2001
English version
Semiconductor devices -
Mechanical and climatic test methods
Part 6: Storage at high temperature
(IEC 60749-6:2002)
Dispositifs à semiconducteurs - Halbleiterbauelemente -
Méthodes d'essais mécaniques Mechanische und klimatische
et climatiques Prüfverfahren
Partie 6: Stockage à haute température Teil 6: Lagerung bei hoher Temperatur
(CEI 60749-6:2002) (IEC 60749-6:2002)
This European Standard was approved by CENELEC on 2002-07-02. CENELEC members are bound to
comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European
Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on
application to the Central Secretariat or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other
language made by translation under the responsibility of a CENELEC member into its own language and
notified to the Central Secretariat has the same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Czech Republic,
Denmark, Finland, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Luxembourg, Malta,
Netherlands, Norway, Portugal, Slovakia, Spain, Sweden, Switzerland and United Kingdom.
CENELEC
European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
Central Secretariat: rue de Stassart 35, B - 1050 Brussels
© 2002 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members.
Ref. No. EN 60749-6:2002 E

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EN 60749-6:2002 - 2 -
Foreword
The text of document 47/1603/FDIS, future edition 1 of IEC 60749-6, prepared by IEC TC 47,
Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by
CENELEC as EN 60749-6 on 2002-07-02.
This mechanical and climatic test method, as it relates to storage at high temperature, is a complete
rewrite of the test contained in clause 2, chapter 3 of EN 60749:1999.
The following dates were fixed:
– latest date by which the EN has to be implemented
at national level by publication of an identical
national standard or by endorsement (dop) 2003-04-01
– latest date by which the national standards conflicting
with the EN have to be withdrawn (dow) 2005-07-01
Annexes designated "normative" are part of the body of the standard.
In this standard, annex ZA is normative.
Annex ZA has been added by CENELEC.
__________
Endorsement notice
The text of the International Standard IEC 60749-6:2002 was approved by CENELEC as a European
Standard without any modification.
__________

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- 3 - EN 60749-6:2002
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications
This European Standard incorporates by dated or undated reference, provisions from other
publications. These normative references are cited at the appropriate places in the text and the
publications are listed hereafter. For dated references, subsequent amendments to or revisions of any
of these publications apply to this European Standard only when incorporated in it by amendment or
revision. For undated references the latest edition of the publication referred to applies (including
amendments).
NOTE When an international publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
Publication Year Title EN/HD Year
IEC 60068-2-48 1982 Environmental testing EN 60068-2-48 1999
Part 2: Tests - Guidance on the
application of the tests of IEC 60068 to
simulate the effects of storage

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NORME CEI
INTERNATIONALE IEC
60749-6
INTERNATIONAL
Première édition
STANDARD
First edition
2002-04
Dispositifs à semiconducteurs –
Méthodes d'essais mécaniques et climatiques –
Partie 6:
Stockage à haute température
Semiconductor devices –
Mechanical and climatic test methods –
Part 6:
Storage at high temperature
 IEC 2002 Droits de reproduction réservés  Copyright - all rights reserved
Aucune partie de cette publication ne peut être reproduite ni No part of this publication may be reproduced or utilized in any
utilisée sous quelque forme que ce soit et par aucun procédé, form or by any means, electronic or mechanical, including
électronique ou mécanique, y compris la photocopie et les photocopying and microfilm, without permission in writing from
microfilms, sans l'accord écrit de l'éditeur. the publisher.
International Electrotechnical Commission, 3, rue de Varembé, PO Box 131, CH-1211 Geneva 20, Switzerland
Telephone: [phone] Telefax: [phone] E-mail: [e-mail]  Web: www.iec.ch
CODE PRIX
D
PRICE CODE
Commission Electrotechnique Internationale
International Electrotechnical Commission
Международная Электротехническая Комиссия
Pour prix, voir catalogue en vigueur
For price, see current catalogue

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60749-6  IEC:2002 – 3 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
SEMICONDUCTOR DEVICES –
MECHANICAL AND CLIMATIC TEST METHODS –
Part 6: Storage at high temperature
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the ele
...