oSIST prEN IEC 60060-2:2023
(Main)High-voltage test techniques - Part 2: Measuring systems
High-voltage test techniques - Part 2: Measuring systems
Hochspannungs-Prüftechnik - Teil 2: Messsysteme
Techniques des essais à haute tension - Partie 2: Systèmes de mesure
Tehnike visokonapetostnega preskušanja - 2. del: Merilni sistemi
General Information
Relations
Standards Content (Sample)
SLOVENSKI STANDARD
oSIST prEN IEC 60060-2:2023
01-junij-2023
Tehnike visokonapetostnega preskušanja - 2. del: Merilni sistemi
High-voltage test techniques - Part 2: Measuring systems
Hochspannungs-Prüftechnik - Teil 2: Messsysteme
Techniques des essais à haute tension - Partie 2: Systèmes de mesure
Ta slovenski standard je istoveten z: prEN IEC 60060-2:2023
ICS:
17.220.20 Merjenje električnih in Measurement of electrical
magnetnih veličin and magnetic quantities
19.080 Električno in elektronsko Electrical and electronic
preskušanje testing
oSIST prEN IEC 60060-2:2023 en
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.
---------------------- Page: 1 ----------------------
oSIST prEN IEC 60060-2:2023
---------------------- Page: 2 ----------------------
oSIST prEN IEC 60060-2:2023
42/416/CDV
COMMITTEE DRAFT FOR VOTE (CDV)
PROJECT NUMBER:
IEC 60060-2 ED4
DATE OF CIRCULATION: CLOSING DATE FOR VOTING:
2023-04-21 2023-07-14
SUPERSEDES DOCUMENTS:
42/401/CD, 42/415/CC
IEC TC 42 : HIGH-VOLTAGE AND HIGH-CURRENT TEST TECHNIQUES
SECRETARIAT: SECRETARY:
Canada Mr Howard G. Sedding
OF INTEREST TO THE FOLLOWING COMMITTEES: PROPOSED HORIZONTAL STANDARD:
TC 14,TC 17,TC 36,TC 37,TC 38,TC 122
Other TC/SCs are requested to indicate their interest, if
any, in this CDV to the secretary.
FUNCTIONS CONCERNED:
EMC ENVIRONMENT QUALITY ASSURANCE SAFETY
SUBMITTED FOR CENELEC PARALLEL VOTING NOT SUBMITTED FOR CENELEC PARALLEL VOTING
Attention IEC-CENELEC parallel voting
The attention of IEC National Committees, members of
CENELEC, is drawn to the fact that this Committee Draft
for Vote (CDV) is submitted for parallel voting.
The CENELEC members are invited to vote through the
CENELEC online voting system.
This document is still under study and subject to change. It should not be used for reference purposes.
Recipients of this document are invited to submit, with their comments, notification of
• any relevant patent rights of which they are aware and to provide supporting documentation,
• any relevant “in some countries” clauses to be included should this proposal proceed. Recipients are
reminded that the enquiry stage is the final stage for submitting "in some countries" clauses. See
AC/22/2007.
TITLE:
High-voltage test techniques - Part 2: Measuring systems
PROPOSED STABILITY DATE: 2026
NOTE FROM TC/SC OFFICERS:
Copyright © 2023 International Electrotechnical Commission, IEC. All rights reserved. It is permitted to
download this electronic file, to make a copy and to print out the content for the sole purpose of preparing National
Committee positions. You may not copy or "mirror" the file or printed version of the document, or any part of it, for
any other purpose without permission in writing from IEC.
---------------------- Page: 3 ----------------------
oSIST prEN IEC 60060-2:2023
IEC CDV 60060-2/Ed4 IEC:2023 – 2 – 42/416/CDV
1 CONTENTS
2 Introduction relevant for CD only . 7
3 FOREWORD . 8
4 1 Scope . 10
5 2 Normative references . 10
6 3 Terms and definitions . 10
7 3.1 Measuring systems . 11
8 3.2 Components of a measuring system . 11
9 3.3 Scale factors . 12
10 3.4 Rated values . 13
11 3.5 Definitions related to dynamic behaviour . 13
12 3.6 Definitions related to uncertainty . 15
13 3.7 Definitions related to tests on measuring systems . 17
14 4 Procedures for qualification and use of measuring systems . 17
15 4.1 General principles . 17
16 4.2 Schedule of performance tests . 18
17 4.3 Schedule of performance checks . 18
18 4.4 Requirements for the record of performance . 18
19 4.4.1 Contents of the record of performance . 18
20 4.4.2 Exceptions . 19
21 4.5 Operating conditions . 19
22 4.6 Uncertainty . 19
23 5 Tests and test requirements for an approved measuring system and its
24 components . 20
25 5.1 General requirements . 20
26 5.2 Calibration – Determination of the scale factor . 21
27 5.2.1 Calibration of measuring systems by comparison with a reference
28 measuring system (preferred method) . 21
29 5.2.2 Determination of the scale factor of a measuring system from the scale
30 factors of its components (alternative method) . 24
31 5.3 Linearity test in addition to comparison over the limited voltage range . 25
32 5.3.1 Application. 25
33 5.3.2 Alternative methods in order of suitability . 26
34 5.4 Dynamic behaviour . 27
35 5.4.1 General . 27
36 5.4.2 Determination of the amplitude/frequency response of AC measuring
37 systems . 27
38 5.4.3 Reference method for impulse voltage measuring systems . 28
39 5.5 Short-term stability . 28
40 5.6 Long-term stability . 28
41 5.7 Ambient temperature effect . 29
42 5.8 Proximity effect . 29
43 5.9 Software effect . 30
44 5.10 Uncertainty calculation of the scale factor . 30
45 5.10.1 General . 30
46 5.10.2 Uncertainty of the calibration . 30
47 5.10.3 Uncertainty of measurement using an approved measuring system . 31
---------------------- Page: 4 ----------------------
oSIST prEN IEC 60060-2:2023
IEC CDV 60060-2/Ed4 IEC:2023 – 3 – 42/416/CDV
48 5.11 Uncertainty calculation of time parameter measurement (impulse voltages
49 only) . 32
50 5.11.1 General . 32
51 5.11.2 Uncertainty of the time parameter calibration . 32
52 5.11.3 Uncertainty of time parameter measurement using an approved
53 measuring system. 34
54 5.12 Interference test (transmission system and instrument for impulse voltage
55 measurements) . 34
56 5.13 Withstand tests of converting device . 35
57 6 Measurement of direct voltage . 35
58 6.1 Requirements for an approved measuring system . 35
59 6.1.1 General . 35
60 6.1.2 Uncertainty contributions . 36
61 6.1.3 Requirement on converting device . 36
62 6.1.4 Dynamic behaviour for measuring voltage changes . 36
63 6.2 Tests on an approved measuring system . 36
64 6.3 Performance check . 37
65 6.3.1 General . 37
66 6.3.2 Comparison with an approved measuring system . 37
67 6.3.3 Check of the scale factors of the components . 37
68 6.4 Measurement of ripple amplitude . 38
69 6.4.1 Requirements . 38
70 6.4.2 Uncertainty contributions . 38
71 6.4.3 Calibrations and tests on an approved ripple voltage measuring system . 38
72 6.4.4 Measurement of the scale factor at the ripple frequency . 38
73 6.4.5 Dynamic behaviour by amplitude/frequency response . 38
74 6.4.6 Performance check for ripple measuring system . 38
75 7 Measurement of alternating voltage . 39
76 7.1 Requirements for an approved measuring system . 39
77 7.1.1 General . 39
78 7.1.2 Uncertainty contributions . 39
79 7.1.3 Dynamic behaviour . 39
80 7.2 Tests on an approved measuring system . 41
81 7.3 Dynamic behaviour test . 41
82 7.4 Performance check . 42
83 7.4.1 General . 42
84 7.4.2 Comparison with an approved measuring system . 42
85 7.4.3 Check of the scale factors of the components . 42
86 8 Measurement of lightning impulse voltage . 43
87 8.1 Requirements for an approved measuring system . 43
88 8.1.1 General . 43
89 8.1.2 Uncertainty contributions . 43
90 8.1.3 Requirement on measuring instrument . 43
91 8.1.4 Dynamic behaviour . 43
92 8.1.5 Connection to the test object . 44
93 8.2 Tests on an approved measuring system . 44
94 8.3 Performance test on measuring systems . 45
95 8.3.1 Reference method (preferred) . 45
---------------------- Page: 5 ----------------------
oSIST prEN IEC 60060-2:2023
IEC CDV 60060-2/Ed4 IEC:2023 – 4 – 42/416/CDV
96 8.3.2 Alternative method supplemented by a measurement of the step
97 response according to Annex C . 45
98 8.4 Dynamic behaviour test . 46
99 8.4.1 Comparison with a reference measuring system (preferred) . 46
100 8.4.2 Alternative method based on step response parameters (Annex C) . 46
101 8.5 Performance check . 46
102 8.5.1 Comparison with an approved measuring system . 46
103 8.5.2 Check of the scale factors of the components . 46
104 8.5.3 Dynamic behaviour check by reference record . 46
105 9 Measurement of switching impulse voltage . 47
106 9.1 Requirements for an approved measuring system . 47
107 9.1.1 General . 47
108 9.1.2 Uncertainty contribution . 47
109 9.1.3 Requirements for the measuring instrument . 47
110 9.1.4 Dynamic behaviour . 47
111 9.1.5 Connection to the test object . 47
112 9.2 Tests on an approved measuring system . 47
113 9.3 Performance test on measuring systems . 47
114 9.3.1 Reference method (preferred) . 47
115 9.3.2 Alternative methods supplemented by a step response measurement . 48
116 9.4 Dynamic behaviour test by comparison . 48
117 9.5 Performance check . 48
118 9.5.1 Scale factor check by comparison with an approved measuring system . 48
119 9.5.2 Check of the scale factors of the components . 48
120 9.5.3 Dynamic behaviour check by reference record . 48
121 10 Measurement of combined voltages . 49
122 10.1 Requirements for an approved measuring system . 49
123 10.1.1 General . 49
124 10.1.2 Uncertainty contributions . 50
125 10.1.3 Requirement for measuring systems . 50
126 10.1.4 Connection to the test object . 51
127 10.1.5 Requirements on an approved measuring system . 52
128 10.2 Performance checks and tests on measuring systems . 52
129 11 Measurement of composite voltages . 52
130 11.1 Requirements for an approved measuring system . 52
131 11.1.1 General . 52
132 11.1.2 Uncertainty contributions . 53
133 11.1.3 Requirements for measuring systems . 53
134 11.1.4 Connection to the test object . 54
135 11.1.5 Combining requirements on an approved measuring system . 54
136 11.2 Performance checks and tests on measuring systems . 54
137 12 Reference measuring systems . 54
138 12.1 Requirements for reference measuring systems . 54
139 12.1.1 Direct voltage . 54
140 12.1.2 Alternating voltage . 55
141 12.1.3 Full and chopped lightning and switching impulse voltages . 55
142 12.2 Calibration of a reference measuring system . 55
143 12.2.1 General . 55
144 12.2.2 Reference method: Comparative measurement. 55
---------------------- Page: 6 ----------------------
oSIST prEN IEC 60060-2:2023
IEC CDV 60060-2/Ed4 IEC:2023 – 5 – 42/416/CDV
145 12.2.3 Alternative method for impulse voltages: Measurement of scale factor
146 and evaluation of step response parameters . 55
147 12.3 Interval between successive calibrations of reference measuring systems . 55
148 12.4 Use of reference measuring systems . 55
149 Annex A (informative) Uncertainty of measurement . 57
150 Annex B (informative) Examples for the calculation of measuring uncertainties in high-
151 voltage measurements. 65
152 Annex C (informative) Step response measurements . 75
153 Annex D (informative) Convolution method for the determination of dynamic behaviour
154 from step response measurements . 81
155 Bibliography . 84
156 Figure 1 – Amplitude-frequency response with examples for limit frequencies (f ; f ) . 14
1 2
157 Figure 2 – Calibration by comparison over the full voltage range . 22
158 Figure 3 – Uncertainty contributions for calibration over 5 voltage levels . 23
159 Figure 4 – Combining calibration and linearity test . 24
160 Figure 5 – Linearity test in the extended voltage range . 26
161 Figure 6 – Short-circuiting arrangement for the interference test. . 35
162 Figure 7 – Normalised amplitude-frequency response of measuring systems intended
163 for a single fundamental frequency . 40
164 Figure 8 – Normalised amplitude-frequency responses of measuring systems intended
165 for a range of fundamental frequencies . 41
166 Figure 9 - Circuit for a combined voltage test . 50
167 Figure 10 - Circuit for a composite voltage test . 53
168 Figure A.1 – Normal probability distribution p(x) . 64
169 Figure A.2 – Rectangular probability distribution p(x) . 64
170 Figure B.1 – Comparison of measuring systems . 73
171 Figure B.2 – Front time deviation of system X, related to the reference system N, . 74
172 Figure C.1 – Definitions of parameters for the unit-step response g(t) . 78
173 Figure C.2 – Definitions parameters for the step-response integral T(t) . 78
174 Figure C.3 –A unit-step response g(t) showing an initial distortion . 79
175 Figure C.4 – Suitable circuits for step response measurement . 80
176 Table 1 – Tests required for an approved direct voltage measuring system . 36
177 Table 2 – Required tests for uncertainty contributions in ripple measurement . 39
178 Table 3 – Tests required for an approved alternating voltage measuring system . 42
179 Table 4 – Tests required for an approved lightning impulse voltage measuring system . 44
180 Table 5 – Tests required for a switching impulse voltage measuring system . 49
181 Table 6 – Requirements for measuring systems for combined voltage tests . 52
182 Table 7 – Requirements for measuring systems for composite tests . 54
183 Table 8 – Recommended response parameters for impulse voltage reference
184 measuring systems . 56
185 Table A.1 – Coverage factor k for effective degrees of freedom ν (p = 95 %) . 62
eff
186 Table A.2 – Schematic of an uncertainty budget . 63
187 Table B.1 – Result of the comparison measurement at a single voltage level g . 66
188 Table B.2 – Summary of results for h = 5 voltage levels (V = 500 kV) . 67
Xmax
189 Table B.3 – Uncertainty budget of the assigned scale factor F . 68
X
---------------------- Page: 7 ----------------------
oSIST prEN IEC 60060-2:2023
IEC CDV 60060-2/Ed4 IEC:2023 – 6 – 42/416/CDV
190 Table B.4 – Uncertainty budget of the assigned scale factor F . 70
191 Table B.5 – Calibration result for front time T and deviations . 72
1
192 Table B.6 – Uncertainty budget of the front time deviation ΔT . 72
1cal
193
194
---------------------- Page: 8 ----------------------
oSIST prEN IEC 60060-2:2023
IEC CDV 60060-2/Ed4 IEC:2023 – 7 – 42/416/CDV
195 Introduction relevant for CD only
196 A sweeping review has been made on usage of “may” incorrectly being used as indication of
197 possibility: The review is based on ISO/IEC Directives Part 2: 2018, which in Table 5 states
198 "May" signifies permission expressed by the document, whereas "can" refers to the ability of a
199 user of the document or to a possibility open to him/her.
200 All internal clause references etc. in the document have been changed from pure text into active
201 Hyperlinks. This makes it possible to look up references by simply clicking the reference. This
202 feature can be carried over into pdf versions.
203 A review of definitions has been made in order to align, where applicable, to IEC 60050 as
204 published in electropedia.org
205 The requirement that “Note to entry” (in definitions) shall always be numbered even if only one,
206 has been implemented
207
---------------------- Page: 9 ----------------------
oSIST prEN IEC 60060-2:2023
IEC CDV 60060-2/Ed4 IEC:2023 – 8 – 42/416/CDV
208 INTERNATIONAL ELECTROTECHNICAL COMMISSION
209 ____________
210
211 HIGH-VOLTAGE TEST TECHNIQUES
212
213 Part 2: Measuring systems
214
215
216 FOREWORD
217 1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
218 all national electrotechnical committees (IEC National Committees). The object of IEC is to promote international
219 co-operation on all questions concerning standardization in the electrical and electronic fields. To this end and
220 in addition to other activities, IEC publishes International Standards, Technical Specifications, Technical Reports,
221 Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC Publication(s)”). Their
222 preparation is entrusted to technical committees; any IEC National Committee interested in the subject dealt with
223 may participate in this preparatory work. International, governmental and non-governmental organizations liaising
224 with the IEC also participate in this preparation. IEC collaborates closely with the International Organization for
225 Standardization (ISO) in accordance with conditions determined by agreement between the two organizations.
226 2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
227 consensus of opinion on the relevant subjects since each technical committee has representation from all
228 interested IEC National Committees.
229 3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
230 Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
231 Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
232 misinterpretation by any end user.
233 4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
234 transparently to the maximum extent possible in their national and regional publications. Any divergence between
235 any IEC Publication and the corresponding national or regional publication shall be clearly indicated in the latter.
236 5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
237 assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
238 services carried out by independent certification bodies.
239 6) All users should ensure that they have the latest edition of this publication.
240 7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
241 members of its technical committees and IEC National Committees for any personal injury, property damage or
242 other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
243 expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
244 Publications.
245 8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
246 indispensable for the correct application of this publication.
247 9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of patent
248 rights. IEC shall not be held responsible for identifying any or all such patent right
...
Questions, Comments and Discussion
Ask us and Technical Secretary will try to provide an answer. You can facilitate discussion about the standard in here.